Abstract: According to one embodiment, a semiconductor device includes first and second electrodes, and first and second regions. The first region includes a first semiconductor region of a first conductivity type, a second semiconductor region of a second conductivity type, a plurality of third semiconductor regions of the first conductivity type, a gate electrode, a conductive part, a fourth semiconductor region of the second conductivity type, a fifth semiconductor region of the first conductivity type, and a sixth semiconductor region of the second conductivity type. The gate electrode faces one of the plurality of third semiconductor regions via a gate insulating layer. The conductive part faces another one of the plurality of third semiconductor regions via an insulating layer, and is electrically connected with the second electrode. The fourth and six semiconductor regions are located on the one and the other one of the plurality of third semiconductor regions, respectively.

Abstract: According to one embodiment, a semiconductor device includes a first electrode, a second electrode, a first region, and a second region. The second electrode is separated from the first electrode. The first region includes a first semiconductor region of a first conductivity type, a second semiconductor region of a second conductivity type, a third semiconductor region of the first conductivity type, a gate electrode, a fourth semiconductor region of the second conductivity type, a fifth semiconductor region of the first conductivity type, and a sixth semiconductor region of the first conductivity type. The fifth semiconductor region, located between the fourth semiconductor region and a portion of the third semiconductor region, has a higher first-conductivity-type impurity concentration than the third semiconductor region.

Abstract: According to one embodiment, a semiconductor device includes a first electrode, a first semiconductor region of a first conductivity type, a second semiconductor region of a second conductivity type, a third semiconductor region of the second conductivity type, and a second electrode. The third semiconductor region is located on the second semiconductor region, and has a higher second-conductivity-type impurity concentration than the second semiconductor region. The second electrode is located on the third semiconductor region. The second electrode includes a first part and a second part. The first part is located in the second semiconductor region. The second part is positioned on the first part, and contacts the third semiconductor region in a second direction perpendicular to a first direction from the first electrode toward the first semiconductor region. A length of the first part is greater than a length of the second part in the second direction.

Abstract: A moving object detection method and apparatus is proposed in which a plurality of heads are installed above a detection line traversing a road, their outputs undergo A/D conversion and binary conversion, and the outputs are then linked along the detection line. A vehicle detection preprocessor performs, on the obtained linked 0/1 existence data, vehicle detection preprocesses of filling-up, noise rejection, width maintaining, Y character profile prevention, delaying, maximum width checking, and so forth, in a predetermined sequence. A vehicle detection processor separates and detects entering vehicles, existing vehicles, corrected/deleted vehicles, and so forth, from the linked 0/1 existence data after vehicle detection preprocessing. False detection of moving objects is reduced.

Abstract: A system and a method for detecting vehicle types utilizing height information and a debiting system using such a system or a method. A plurality of distance sensors (heads) are provided laterally on a road, and 0/1 linked existence data and linked height data are generated by a link generator. The former data represent the existence of a vehicle on a detection line drawn along the road width direction on the basis of the distance data obtained by the heads and the latter data represent height profiles of a vehicle on the detection line. Height data such as maximum, minimum and average height in every height block are calculated by a scan-by-scan height evaluator 38 on the basis of the linked height data and vehicle position information, and a vehicle type detector 40 detects the type of the vehicle.