Patents by Inventor Kazuyuki Yagi
Kazuyuki Yagi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240117192Abstract: A method for manufacturing a surface-treated gas-phase-process silica particle, the method including steps of: adding 1,3-divinyl-1,1,3,3-tetramethyldisilazane to a raw material gas-phase-process silica particle and introducing a vinyldimethylsilyl group on a surface of the raw material gas-phase-process silica particle to obtain a preliminarily treated silica particle; and adding hexamethyldisilazane to the preliminarily treated silica particle and introducing a trimethylsilyl group on a surface of the preliminarily treated silica particle to obtain a surface-treated gas-phase-process silica particle.Type: ApplicationFiled: December 22, 2021Publication date: April 11, 2024Applicant: SHIN-ETSU CHEMICAL CO., LTD.Inventors: Kazuyuki MATSUMURA, Masanobu NISHIMINE, Yusuke ITOH, Hisashi YAGI, Tsutomu NAKAMURA, Yoshiteru SAKATSUME
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Patent number: 9354262Abstract: A method and apparatus are described for generally passive intermodulation measurement to specify a location and strength of an intermodulation source of a passive component in a transmission line. Beneficially, the apparatus and method are comparatively simple and inexpensive.Type: GrantFiled: June 29, 2012Date of Patent: May 31, 2016Assignee: Kaysight Technologies, Inc.Inventor: Kazuyuki Yagi
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Publication number: 20140002097Abstract: A method and apparatus are described for generally passive intermodulation measurement to specify a location and strength of an intermodulation source of a passive component in a transmission line. Beneficially, the apparatus and method are comparatively simple and inexpensive.Type: ApplicationFiled: June 29, 2012Publication date: January 2, 2014Applicant: AGILENT TECHNOLOGIES, INC.Inventor: Kazuyuki YAGI
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Patent number: 6720900Abstract: A sampling apparatus including two or more samplers, where a signal is sampled simultaneously by each sampler and the values sampled by one of the samplers is then used. In this way, sampling operations for the purpose of ranging are eliminated, and the time required for ranging can be shortened. Moreover, the possibility that the instantaneous values of the signal input to the sampler will exceed the input range of the sampler can be inferred in each sampler by establishing a suitable threshold value for its sample values.Type: GrantFiled: November 19, 2002Date of Patent: April 13, 2004Assignee: Agilent Technologies, Inc.Inventors: Takuya Matsumoto, Kazuyuki Yagi
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Publication number: 20030095058Abstract: A sampling apparatus including two or more samplers, where a signal is sampled simultaneously by each sampler and the values sampled by one of the samplers is then used. In this way, sampling operations for the purpose of ranging are eliminated, and the time required for ranging can be shortened. Moreover, the possibility that the instantaneous values of the signal input to the sampler will exceed the input range of the sampler can be inferred in each sampler by establishing a suitable threshold value for its sample values.Type: ApplicationFiled: November 19, 2002Publication date: May 22, 2003Applicant: Agilent Technologies, Inc.Inventors: Takuya Matsumoto, Kazuyuki Yagi
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Patent number: 6549021Abstract: A ratio meter and apparatus for measuring electrical components with high stability and no effect on the circuit under test. Two input signals are switched by a switching means and the inputs to two measuring means are measured while keeping the switches in a first state and a second state to find the ratio of the measurements. The ratio to be measured, which is related to the above-mentioned input signals, and which forms a bilinear equation with the two ratios, one each obtained under the first and second state, are obtained from said ratios. Accurate calibration is performed and measurement of electrical and electronic components with high stability is accomplished by connecting a front-end circuit with the ratio meter.Type: GrantFiled: January 17, 2001Date of Patent: April 15, 2003Assignee: Agilent Technologies, Inc.Inventor: Kazuyuki Yagi
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Patent number: 6414476Abstract: To perform broadband current detection. The current detector of the present invention comprises first terminal, which receives power source current; second terminal, which feeds output current to an outside current; third terminal, which outputs pilot current having a predefined relationship with this output current; and fourth terminal, which has reference potential; as well as first component connected between the first and second terminals; vertical connection of first and second baluns and coupled with the first component; grounded capacitive component at the connecting part of the first and second baluns; and grounded capacitive component at the output part of the second balun. The properties of the instrument for measuring impedance and the apparatus for measuring power are improved by using the current detector of the present invention.Type: GrantFiled: January 17, 2001Date of Patent: July 2, 2002Assignee: Agilent Technologies, Inc.Inventor: Kazuyuki Yagi
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Patent number: 6316943Abstract: Apparatus is described for generating a frequency-sweepable measurement signal and a local signal with a frequency separated from the measurement signal frequency by an intermediate frequency. The measurement signal and a local signal are generated by a simple structure, including a high-frequency variable-frequency signal source, a low-frequency fixed-frequency signal source, a first frequency divider and a second frequency divider. The variable-frequency signal source is a sweepable signal source. The first frequency divider divides an output frequency fa from the variable-frequency signal source by n and outputs a measurement signal with a frequency of fa/n. The signal of the variable-frequency signal source is also applied to the first input of the second frequency divider, and the signal of fixed-frequency signal source, with a frequency of fb, is applied to the second input.Type: GrantFiled: December 22, 1999Date of Patent: November 13, 2001Assignee: Agilent Technologies, Inc.Inventors: Hideki Yamashita, Kazuyuki Yagi
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Publication number: 20010009374Abstract: A ratio meter and apparatus for measuring electrical components with high stability and no effect on the circuit under test. Two input signals are switched by a switching means and the inputs to two measuring means are measured while keeping the switches in a first state and a second state to find the ratio of the measurements. The ratio to be measured, which is related to the above-mentioned input signals, and which forms a bilinear equation with the two ratios, one each obtained under the first and second state, are obtained from said ratios. Accurate calibration is performed and measurement of electrical and electronic components with high stability is accomplished by connecting a front-end circuit with the ratio meter.Type: ApplicationFiled: January 17, 2001Publication date: July 26, 2001Inventor: Kazuyuki Yagi
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Publication number: 20010008375Abstract: To perform broadband current detection. The current detector of the present invention comprises first terminal, which receives power source current; second terminal, which feeds output current to an outside current; third terminal, which outputs pilot current having a predefined relationship with this output current; and fourth terminal, which has reference potential; as well as first component connected between the first and second terminals; vertical connection of first and second baluns and coupled with the first component; grounded capacitive component at the connecting part of the first and second baluns; and grounded capacitive component at the output part of the second balun. The properties of the instrument for measuring impedance and the apparatus for measuring power are improved by using the current detector of the present invention.Type: ApplicationFiled: January 17, 2001Publication date: July 19, 2001Inventor: Kazuyuki Yagi
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Patent number: 6028425Abstract: Apparatus is described for generating a frequency-sweepable measurement signal and a local signal with a frequency separated from the measurement signal frequency by an intermediate frequency. The measurement signal and a local signal are generated by a simple structure, including a high-frequency variable-frequency signal source, a low-frequency fixed-frequency signal source, a first frequency divider and a second frequency divider. The variable-frequency signal source is a sweepable signal source. The first frequency divider divides an output frequency fa from the variable-frequency signal source by n and outputs a measurement signal with a frequency of fa/n. The signal of the variable-frequency signal source is also applied to the first input of the second frequency divider, and the signal of fixed-frequency signal source, with a frequency of fb, is applied to the second input.Type: GrantFiled: January 13, 1997Date of Patent: February 22, 2000Assignee: Hewlett-Packard CompanyInventors: Hideki Yamashita, Kazuyuki Yagi
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Patent number: 5600249Abstract: An impedance meter enables a real value of a component's impedance value to be forced to be negative when contact between measurement terminals and the component is poor. The value of the real part of the measured value is compared with a standard value for judging whether the contact is good or bad. The contact is judged poor when the real part of the measured value is more negative than the standard value. The standard value for judging whether the contact is good or bad is made more negative than the magnitude of the dispersion of the real part of the measured values, and thus erroneous judgments due to dispersion of measured values are eliminated. The circuit that forces the real part of the measured value to become negative is formed as follows: the input of an inverse gain amplifier is connected to the output terminal of a signal generator, the output of the inverse gain amplifier is connected to a high-voltage voltage terminal through a resistance.Type: GrantFiled: June 14, 1995Date of Patent: February 4, 1997Assignee: Hewlett-Packard CompanyInventors: Kazuyuki Yagi, Yasuaki Komatsu, Masahiro Ikeda
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Patent number: 4885528Abstract: The present invention relates to apparatus for measuring the AC electrical parameters of a circuit element (Device-Under-Test, DUT), such as a resistor, a capacitor or an inductor, at the desired frequency of a signal while applying a DC bias to the DUT. The present invention provides an apparatus capable of measurement with less error even in the lower-frequency range.Type: GrantFiled: March 3, 1989Date of Patent: December 5, 1989Assignee: Hewlett-Packard CompanyInventors: Hideshi Tanaka, Kazuyuki Yagi, Shigeru Tanimoto, Yasuaki Komatsu, Koichi Yanagawa, Yoichi Kuboyama
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Patent number: 4795962Abstract: A floating driver circuit. A power supply is connected through a signal source to an amplifier's input terminal. The power supply is also connected to a pair of power supply terminals of the amplifier, via at least one resistor for each power supply terminal, so that direct current flows from the power supply into the power supply terminals. Further, at least one capacitor is connected to each power supply terminal. A cable, preferably coaxial, has first and second conductors. The first conductor is connected to a signal output terminal of the amplifier. The second conductor is connected to the power supply terminals through the capacitors. A pair of these circuits is combined at opposite ends of an electrical component to enable measurement of the impedances thereof.Type: GrantFiled: September 4, 1987Date of Patent: January 3, 1989Assignee: Hewlett-Packard CompanyInventors: Kouichi Yanagawa, Kazuyuki Yagi
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Patent number: 4654585Abstract: A phase detection method for use, e.g., in impedance measurements, permits accurate phase detections to be performed at a high measurement speed. Two reference signals, phase shifted by 90.degree. from each other, and an input signal are applied to two phase detectors and phase detection is performed. The two reference signals are then both incrementally phase shifted by a predetermined amount and the measurements are again made. Phase incrementation and measurements are repeated until the original phase is reattained and the measurements are then averaged.Type: GrantFiled: July 26, 1984Date of Patent: March 31, 1987Assignee: Hewlett-Packard CompanyInventor: Kazuyuki Yagi