Patents by Inventor Keng-Chia Yang

Keng-Chia Yang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7587293
    Abstract: A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the wafer, and subsequent execution of CP testing. At least one control command corresponding to the control request message is issued to direct the prober for alignment of the probe unit or the wafer, attachment of the probe pin of the probe unit on the specific area of the wafer, and subsequent execution of CP testing.
    Type: Grant
    Filed: May 9, 2007
    Date of Patent: September 8, 2009
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Chih-Chien Chang, Keng-Chia Yang, Yi-Sheng Huang, Ben Shin
  • Publication number: 20080281536
    Abstract: A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the wafer, and subsequent execution of CP testing. At least one control command corresponding to the control request message is issued to direct the prober for alignment of the probe unit or the wafer, attachment of the probe pin of the probe unit on the specific area of the wafer, and subsequent execution of CP testing.
    Type: Application
    Filed: May 9, 2007
    Publication date: November 13, 2008
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Chih-Chien Chang, Keng-Chia Yang, Yi-Sheng Huang, Ben Shin
  • Patent number: 7383259
    Abstract: A system for merging product characterization information with a characterized product employs a merging rule database and a product characterization database. A merging processor receives the product characterization information and the merging criteria to create a characterization information result. The characterization information result is created by extracting a trigger merging rule form the merging rule database and determining whether the trigger merging rule has been met to initiate merging the product characterization information with the product. If the products have no characterizations that meet the merging criteria, a union map and an intersection map for the characterized product are created. The merged product characterization information is connected to the product by marking the product to identify it as having met the merging criteria.
    Type: Grant
    Filed: June 4, 2004
    Date of Patent: June 3, 2008
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Keng-Chia Yang, Chiu Wen Jen, Chung-Yu Chang, Kuo-Rung Hsiao
  • Patent number: 7123040
    Abstract: A testing system for check-in control in wafer testing. The testing system comprises a testing tool, an optical character recognition (OCR) device, and a controller. The testing tool performs a testing process of an article. The OCR device reads optical characters disposed on the article. The controller, connected to the testing tool and the OCR device, automatically initiates a check-in process for the article according to the read optical characters.
    Type: Grant
    Filed: March 4, 2004
    Date of Patent: October 17, 2006
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Keng-Chia Yang, Chih-Chien Chen, Let-Long Chen
  • Publication number: 20060100844
    Abstract: A system and method thereof for test time forecasting. The system comprises a storage device and a first program module. The storage device stores Circuit Probing (CP) test records individually storing information regarding a test time and a yield of a test unit corresponding to a test program. The first program module receives the CP test records and generates a new test time forecast model according to the CP test records. The new test time forecast model determines a dependent variable corresponding to the test time by utilizing an independent variable corresponding to the yield.
    Type: Application
    Filed: November 8, 2004
    Publication date: May 11, 2006
    Inventors: Keng-Chia Yang, Yi-Sheng Huang, Ben-Hui Yu, Chung-Lin Hsieh, Chien-Wei Wang, Tsung-Hsin Yang, Tzu-Cheng Huang
  • Publication number: 20050278329
    Abstract: A system for merging product characterization information with a characterized product employs a merging rule database and a product characterization database. A merging processor receives the product characterization information and the merging criteria to create a characterization information result. The characterization information result is created by extracting a trigger merging rule form the merging rule database and determining whether the trigger merging rule has been met to initiate merging the product characterization information with the product. If the products have no characterizations that meet the merging criteria, a union map and an intersection map for the characterized product are created. The merged product characterization information is connected to the product by marking the product to identify it as having met the merging criteria.
    Type: Application
    Filed: June 4, 2004
    Publication date: December 15, 2005
    Inventors: Keng-Chia Yang, Chiu Wen Jen, Chung-Yu Chang, Kuo-Rung Hsiao
  • Publication number: 20050194987
    Abstract: A testing system for check-in control in wafer testing. The testing system comprises a testing tool, an optical character recognition (OCR) device, and a controller. The testing tool performs a testing process of an article. The OCR device reads optical characters disposed on the article. The controller, connected to the testing tool and the OCR device, automatically initiates a check-in process for the article according to the read optical characters.
    Type: Application
    Filed: March 4, 2004
    Publication date: September 8, 2005
    Inventors: Keng-Chia Yang, Chih-Chien Chang, Lieh-Jung Chen
  • Publication number: 20050192690
    Abstract: A new solution in 300 mm Chip Probing (CP) Manufacturing Execution System (MES) design based on a SiView infrastructure. It models actual behavior making it possible to specify exact test program and equipment configuration. The test program, product file, and probe card are modeled into the MES infrastructure so that extra systems and tables requiring costly maintenance can be eliminated. With the required tester configuration built into the product class and tester capability status built into the test equipment's properties, real-time lot-equipment dispatching can occur according to the configuration. A modified version can be supported by I-EDA and PCMS.
    Type: Application
    Filed: February 26, 2004
    Publication date: September 1, 2005
    Inventors: Keng-Chia Yang, Shu-Min Chen, Larry Jann, Lieh-Jung Chen
  • Patent number: 6470231
    Abstract: The invention is proposed to efficiently dispatch wafers into tools, and particularly to provide a real-time and automatic way to dispatch wafers. In addition, a method for dispatching wafers, a system for dispatching wafers into tools and a system for processing numerous lots by number of tools with automatic dispatch are present as examples. One main characteristic of the invention is that each pending wafer is given an individual priority before it is processed by any tool and the priority is automatically calculated in accordance with to a ranking algorithm. Another main characteristic of the invention is that whenever a tool is available to process at least one pending wafer, part of pending wafers is automatically assigned to the available tool in accordance with an assignment algorithm and a required limitation database that is provided by the dispatcher.
    Type: Grant
    Filed: April 21, 2000
    Date of Patent: October 22, 2002
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Keng-Chia Yang, Yo Chang, Chen-Lung Chu, Yi-Hung Lee