Patents by Inventor Kenji Tamaki

Kenji Tamaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11662672
    Abstract: A powder conveying device includes: a conveying nozzle, provided with a powder receiving opening; an open/close member to open/close the powder receiving opening; a flange provided to the open/close member; a biasing member to bias the open/close member; and a container setting section to which a part of a powder container is to be fit. The powder container includes: a conveyor to convey the powder from a second end of the powder container to a first end; a container opening protruding from the first end; a nozzle receiving opening into which the conveying nozzle is to be inserted; and a butting portion provided in the container opening, to butt against the flange. When the powder container is attached to the powder conveying device, the container opening is fitted to the container setting section, and the flange and the biasing member are housed in an inner space of the container opening.
    Type: Grant
    Filed: September 14, 2021
    Date of Patent: May 30, 2023
    Assignee: RICOH COMPANY, LTD.
    Inventors: Hiroshi Hosokawa, Shunji Kato, Shinji Tamaki, Hiroshi Ikeguchi, Seiji Terazawa, Junji Yamabe, Kaori Mitsuishi, Toshihide Tomotaka, Tsunehiro Watanabe, Kenji Kikuchi
  • Patent number: 11592807
    Abstract: A manufacturing defect factor searching method includes: classifying manufacturing monitoring data into a set of non-defective products having an inspection result indicating a non-defective product and a set of defective products having the inspection result indicating a defective product, in accordance with a correspondence relationship between the manufacturing monitoring data and product inspection data indicating the inspection result of the product manufactured in the manufacturing line, the manufacturing monitoring data being collected from a manufacturing line of a product and being multivariate; estimating, for each item of the manufacturing monitoring data, a mixture distribution function approximating to a statistical distribution of each of the set of non-defective products and the set of defective products; resolving the mixture distribution function into components; and generating a list of items including a resolved component having a correlation with a manufacturing quality defect from among i
    Type: Grant
    Filed: April 1, 2021
    Date of Patent: February 28, 2023
    Assignee: Hitachi, Ltd.
    Inventor: Kenji Tamaki
  • Patent number: 11538671
    Abstract: In time-series data indicating light emission of plasma when plasma processing is carried out on a sample by generating the plasma, an analysis apparatus creates combinations of a plurality of light emission wavelengths of elements and a plurality of time intervals within a plasma processing interval and calculates, for each of the combinations of the wavelengths and the time intervals, a correlation between an average value of light emission intensity and the number of times the plasma processing is carried out on the samples for each of the combinations of the wavelengths and the time intervals that have been created. Thereafter, the data analysis apparatus selects, as a combination of the wavelength and the time interval used to observe or control the plasma processing, a combination of a wavelength of light emitting from a specific element and a specific time interval having a maximum correlation.
    Type: Grant
    Filed: October 29, 2019
    Date of Patent: December 27, 2022
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Ryoji Asakura, Kenji Tamaki, Akira Kagoshima, Daisuke Shiraishi, Masahiro Sumiya
  • Publication number: 20220399182
    Abstract: In a plasma processing apparatus, occurrence of unplanned maintenance is predicted in advance so that a time when the work should be incorporated into planned maintenance can be determined. An apparatus diagnostic apparatus including a degradation score estimation unit that receives an output of a sensor mounted on a plasma processing apparatus and estimates a degradation score of the plasma processing device; a maintenance work occurrence probability estimation unit that calculates a probability of occurrence of an unplanned maintenance work that is not included in an original maintenance plan based on the degradation score; an actual maintenance cost calculation unit that calculates an actual maintenance cost; and a plan incorporated maintenance cost calculation unit that outputs a correction plan of maintenance plan in which the original maintenance plan is corrected by incorporating the unplanned maintenance work based on the probability of occurrence of the unplanned maintenance work.
    Type: Application
    Filed: June 15, 2020
    Publication date: December 15, 2022
    Inventors: Shota Umeda, Masahiro Sumiya, Yoshito Kamaji, Kenji Tamaki
  • Publication number: 20220368807
    Abstract: A sheet conveyance apparatus includes: a speed detection roller that detects a conveyance speed of a sheet by coming into contact with the sheet being conveyed and being driven to rotate; and a hardware processor that performs temperature control to make an ambient temperature of the speed detection roller a predetermined temperature.
    Type: Application
    Filed: April 29, 2022
    Publication date: November 17, 2022
    Inventors: HARUMITSU FUJIMORI, SHOTA IGO, NAOTO SUGAYA, KENJI TAMAKI
  • Patent number: 11473842
    Abstract: A melting work device and a melting work method by which work can be easily performed on a melting furnace without a worker approaching the melting furnace. A melting work device performs work on a melt obtained by melting a material in a melting furnace. The melting work device has a drive mechanism; and a plurality of work tools that are operated by the drive mechanism; wherein the drive mechanism is able to move the work tools in an arbitrary direction at an arbitrary location above the melting furnace.
    Type: Grant
    Filed: October 23, 2018
    Date of Patent: October 18, 2022
    Assignee: SINTOKOGIO, LTD.
    Inventors: Kenji Tamaki, Takahiro Yano, Masayuki Ishikawa
  • Publication number: 20220328286
    Abstract: There is provided a method of analyzing data obtained from an etching apparatus for micromachining a wafer using plasma. This method includes the following steps: acquiring the plasma light-emission data indicating light-emission intensities at a plurality of different wavelengths and times, the plasma light-emission data being measured under a plurality of different etching processing conditions, and being obtained at the time of the etching processing, evaluating the relationship between changes in the etching processing conditions and changes in the light-emission intensities at the plurality of different wavelengths and times with respect to the wavelengths and times of the plasma light-emission data, and identifying the wavelength and the time of the plasma light-emission data based on the evaluation result, the wavelength and the time being to be used for the adjustment of the etching processing condition.
    Type: Application
    Filed: June 28, 2022
    Publication date: October 13, 2022
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Ryoji Asakura, Kenji Tamaki, Akira Kagoshima, Daisuke Shiraishi
  • Publication number: 20220317947
    Abstract: A non-transitory computer-readable medium stores computer-readable instructions executable by a processor of an information processing device communicably connected with at least one server and a plurality of devices. The instructions are configured to, when executed by the processor, cause the information processing device to obtain authentication information generated by the at least one server configured to provide a service, accept designation of the plurality of devices to be registered with the at least one server based on the authentication information and to be used for the service, and send the same authentication information as obtained to the plurality of devices designated.
    Type: Application
    Filed: March 28, 2022
    Publication date: October 6, 2022
    Inventors: Naoto SHIRAGA, Kenji TAMAKI
  • Patent number: 11410836
    Abstract: There is provided a method of analyzing data obtained from an etching apparatus for micromachining a wafer using plasma. This method includes the following steps: acquiring the plasma light-emission data indicating light-emission intensities at a plurality of different wavelengths and times, the plasma light-emission data being measured under a plurality of different etching processing conditions, and being obtained at the time of the etching processing, evaluating the relationship between changes in the etching processing conditions and changes in the light-emission intensities at the plurality of different wavelengths and times with respect to the wavelengths and times of the plasma light-emission data, and identifying the wavelength and the time of the plasma light-emission data based on the evaluation result, the wavelength and the time being to be used for the adjustment of the etching processing condition.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: August 9, 2022
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Ryoji Asakura, Kenji Tamaki, Akira Kagoshima, Daisuke Shiraishi
  • Publication number: 20220157580
    Abstract: In a diagnosis apparatus for diagnosing a state of a plasma processing apparatus, prior distribution information including a probability distribution function is previously obtained for each of first sensors by using first sensor values obtained by the first sensors in a first plasma processing apparatus, a probability distribution in each of second sensors corresponding to each of the first sensors is estimated based on the previously obtained prior distribution information and second sensor values obtained by the second sensors in a second plasma processing apparatus different from the first plasma processing apparatus, and a state of the second plasma processing apparatus is diagnosed by using the estimated probability distribution.
    Type: Application
    Filed: July 30, 2019
    Publication date: May 19, 2022
    Inventors: Shota Umeda, Kenji Tamaki, Masahiro Sumiya, Masaki Ishiguro
  • Publication number: 20210397119
    Abstract: The present invention provides a recording medium detecting device, an image forming device, an image forming system, a recording medium detecting method, and a non-transitory recording medium storing a computer readable program capable of detecting a grain direction of a recording medium. A recording medium detecting device has: a sensor capable of detecting a recording medium from a first detection direction and a second detection direction different from the first detection direction; and a control unit. The control unit determines a grain direction of a recording medium from first surface property data obtained when the recording medium is detected from the first detection direction and second surface property data obtained when the recording medium is detected from the second detection direction.
    Type: Application
    Filed: May 21, 2021
    Publication date: December 23, 2021
    Applicant: Konica Minolta, Inc.
    Inventors: Naoto SUGAYA, Kenji TAMAKI, Kenji YAMAMOTO, Tatsuo ISHIZUKA
  • Publication number: 20210318672
    Abstract: A manufacturing defect factor searching method includes: classifying manufacturing monitoring data into a set of non-defective products having an inspection result indicating a non-defective product and a set of defective products having the inspection result indicating a defective product, in accordance with a correspondence relationship between the manufacturing monitoring data and product inspection data indicating the inspection result of the product manufactured in the manufacturing line, the manufacturing monitoring data being collected from a manufacturing line of a product and being multivariate; estimating, for each item of the manufacturing monitoring data, a mixture distribution function approximating to a statistical distribution of each of the set of non-defective products and the set of defective products; resolving the mixture distribution function into components; and generating a list of items including a resolved component having a correlation with a manufacturing quality defect from among i
    Type: Application
    Filed: April 1, 2021
    Publication date: October 14, 2021
    Inventor: Kenji TAMAKI
  • Publication number: 20210070370
    Abstract: An impact absorption device includes: a pair of an upper wall portion and a lower wall portion extending in the vehicle front-rear direction and placed to face each other; and a plurality of ribs extending in the vehicle front-rear direction between the upper wall portion and the lower wall portion, the ribs being arranged at predetermined intervals in the vehicle width direction so as to divide a space between the upper wall portion and the lower wall portion into a plurality of sections extending in the vehicle front-rear direction. Among the sections, three consecutive sections in an arrangement direction of the sections are configured such that an interval between ribs constituting a central section in the arrangement direction is smaller than an interval between ribs constituting each of sections adjacently placed on both sides of the central section.
    Type: Application
    Filed: August 17, 2020
    Publication date: March 11, 2021
    Applicants: AISIN SEIKI KABUSHIKI KAISHA, AISIN KEIKINZOKU KABUSHIKI KAISHA
    Inventors: Syunji MORI, Shunji SHIBATA, Masaaki YOSHIMURA, Kenji TAMAKI, Kiyoichi KITA, Jun SYOBO
  • Publication number: 20200400376
    Abstract: A melting work device and a melting work method by which work can be easily performed on a melting furnace without a worker approaching the melting furnace. A melting work device performs work on a melt obtained by melting a material in a melting furnace. The melting work device has a drive mechanism; and a plurality of work tools that are operated by the drive mechanism; wherein the drive mechanism is able to move the work tools in an arbitrary direction at an arbitrary location above the melting furnace.
    Type: Application
    Filed: October 23, 2018
    Publication date: December 24, 2020
    Applicant: SINTOKOGIO, LTD.
    Inventors: Kenji TAMAKI, Takahiro YANO, Masayuki ISHIKAWA
  • Patent number: 10805481
    Abstract: In an image processing apparatus, in a case where setting values indicate to create scan data by using digital halftoning and requires execution of a prescribed process using a result of character recognition, a controller outputs an instruction to create multiple-value scan data having a pixel value represented by two or more bits. The controller executes the character recognition on the multiple-value scan data. The controller converts the multiple-value scan data into converted scan data by using digital halftoning, and executes the prescribed process on the converted scan data. In a case where the setting values indicate to create scan data by using a method different from the digital halftoning, and requires execution of the prescribed process, the controller outputs an instruction to create setting-based scan data. The controller executes the character recognition on the setting-based scan data. The controller executes the prescribed process on the setting-based scan data.
    Type: Grant
    Filed: January 30, 2019
    Date of Patent: October 13, 2020
    Assignee: BROTHER KOGYO KABUSHIKI KAISHA
    Inventors: Kenju Narita, Kenji Tamaki, Nobuyuki Kamiya, Hiroya Nojiri, Lei Li
  • Publication number: 20200192269
    Abstract: An image forming apparatus includes a high-voltage power supply board utilized for electrophotographic image formation, wherein a converter that generates high voltage is arranged on the high-voltage power supply board, and a drive coil and a high-voltage generation coil in the converter are insulated from each other, a first hardware processor that generates a control signal to control the drive coil is provided, the first hardware processor generates the control signal suitably adjusted in accordance with each of various alternating waveforms, and high voltage having various alternating waveforms is output from one output terminal of the converter of the high-voltage power supply board.
    Type: Application
    Filed: December 17, 2019
    Publication date: June 18, 2020
    Inventors: Kenji TAMAKI, Masashi SUGANO, Yoshihito SASAMOTO, Kenji YAMAMOTO
  • Publication number: 20200066500
    Abstract: In time-series data indicating light emission of plasma when plasma processing is carried out on a sample by generating the plasma, an analysis apparatus creates combinations of a plurality of light emission wavelengths of elements and a plurality of time intervals within a plasma processing interval and calculates, for each of the combinations of the wavelengths and the time intervals, a correlation between an average value of light emission intensity and the number of times the plasma processing is carried out on the samples for each of the combinations of the wavelengths and the time intervals that have been created. Thereafter, the data analysis apparatus selects, as a combination of the wavelength and the time interval used to observe or control the plasma processing, a combination of a wavelength of light emitting from a specific element and a specific time interval having a maximum correlation.
    Type: Application
    Filed: October 29, 2019
    Publication date: February 27, 2020
    Inventors: Ryoji ASAKURA, Kenji TAMAKI, Akira KAGOSHIMA, Daisuke SHIRAISHI, Masahiro SUMIYA
  • Patent number: 10523835
    Abstract: An image-reading apparatus includes an image-reader and a controller. The controller is configured to perform: controlling the image-reader to execute: (a1) reading a first set of original documents; and (a2) generating read data sets indicating images on the original documents in the first set; transmitting the read data sets generated by the (a2) generating to an information-processing apparatus; counting a remaining period until a specific time, the specific time being a time when a first period elapses from a predetermined time after completing the (a2) reading; transmitting the counted remaining period to the information-processing apparatus; controlling, in response to receiving a specific signal before the specific time, the image-reader to execute: (e1) reading a second set of original documents; and (e2) generating read data sets indicating images on the original documents in the second set; and transmitting the read data sets generated by the (e2) generating to the information-processing apparatus.
    Type: Grant
    Filed: January 9, 2019
    Date of Patent: December 31, 2019
    Assignee: Brother Kogyo Kabushiki Kaisha
    Inventors: Hiroya Nojiri, Kenju Narita, Kenji Tamaki, Lei Li
  • Patent number: 10510519
    Abstract: In time-series data indicating light emission of plasma when plasma processing is carried out on a sample by generating the plasma, an analysis apparatus creates combinations of a plurality of light emission wavelengths of elements and a plurality of time intervals within a plasma processing interval and calculates, for each of the combinations of the wavelengths and the time intervals, a correlation between an average value of light emission intensity and the number of times the plasma processing is carried out on the samples for each of the combinations of the wavelengths and the time intervals that have been created. Thereafter, the data analysis apparatus selects, as a combination of the wavelength and the time interval used to observe or control the plasma processing, a combination of a wavelength of light emitting from a specific element and a specific time interval having a maximum correlation.
    Type: Grant
    Filed: February 23, 2016
    Date of Patent: December 17, 2019
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Ryoji Asakura, Kenji Tamaki, Akira Kagoshima, Daisuke Shiraishi, Masahiro Sumiya
  • Patent number: 10440224
    Abstract: In a case where values received indicate a first color scale representing first number of colors and indicate the specific image process, a processor of an information processing apparatus receives first scan data in the first color scale from the scanner, and performs a specific image process on the first scan data. In a case where the values indicate a second color scale representing second number of colors and does not indicate the specific image process, the processor receives and outputs the second scan data. In a case where the values indicate the second color scale and the specific image process, the processor receives third scan data in the third color scale representing third number of colors larger than the second number. The processor performs the specific image process on the third scan data, and converts the processed third scan data to forth scan data in the second color scale.
    Type: Grant
    Filed: August 22, 2018
    Date of Patent: October 8, 2019
    Assignee: Brother Kogyo Kabushiki Kaisha
    Inventors: Kenju Narita, Hiroya Nojiri, Kenji Tamaki, Akidi Yoshida