Patents by Inventor Kentaro Jinno

Kentaro Jinno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230112790
    Abstract: A signal processing method for ultrasonic inspection includes: a step of generating ultrasonic waves by driving an ultrasonic probe by using a plurality of burst wave signals with different frequencies, respectively, and causing the ultrasonic waves to inject an inspection target; a receiving step of receiving a plurality of multiple reflected waves corresponding to the plurality of burst wave signals having injected the inspection target, respectively; a step of obtaining a plurality of detection signals by executing detection processing of receiving signals of the plurality of multiple reflected waves corresponding to the plurality of burst wave signals, respectively; and a generating step of generating an inspection signal for obtaining an inspection result related to the inspection target by using the plurality of detection signals.
    Type: Application
    Filed: February 10, 2021
    Publication date: April 13, 2023
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Keiichi Morishita, Kenji Iizuka, Kentaro Jinno
  • Patent number: 11366080
    Abstract: An eddy current flaw detection probe includes first coils, second coils, and a switching circuit configured to cause the first or the second coils in each unit U, the unit U being composed of adjacent four coils, to serve as excitation coils that generate eddy currents in an inspection target and cause the other coils in the unit U to serve as detection coils that detect a change in the eddy currents. The first coils each have one end thereof connected to a first common wiring, and the second coils each have one end thereof connected to a second common wiring. The switching circuit includes a first switching circuit connected to the other ends of the first coils and the second coils arranged in a first row, and a second switching circuit connected to the other ends of the first coils and the second coils arranged in a second row.
    Type: Grant
    Filed: February 22, 2019
    Date of Patent: June 21, 2022
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kentaro Jinno, Masaaki Kurokawa
  • Publication number: 20210305493
    Abstract: A method of manufacturing a dielectric film includes the steps of: adjusting a particle size distribution of particles of a dielectric substance to fall within a specified range; kneading the particles having the adjusted particle size distribution and a dispersion medium to obtain a slurry; and forming the slurry into a film shape to obtain a film-like compact.
    Type: Application
    Filed: January 12, 2021
    Publication date: September 30, 2021
    Inventors: Yasuhiko TSURU, Yuko YAMAMOTO, Takashi NAKANO, Kentaro JINNO, Misaki FUKUYAMA, Yuki ASAI
  • Patent number: 11105773
    Abstract: An eddy current flaw detecting probe includes a plurality of excitation coils (3) which is configured to generate an eddy current in an inspection target and a plurality of detection coils (4) which are differentially connected to each other. The plurality of detection coils (4) includes a first detection coil (41) which is disposed on a second center line (4a) intersecting a first center line (3a) which connects a center of a first excitation coil (31) and a center of a second excitation coil (32) to each other and a second detection coil (42) which is disposed on a side opposite to the first detection coil (41) on the second center line (4a). The excitation coil (3) and the detection coil (4) are disposed to be inclined toward an inspection target surface as approaching each other.
    Type: Grant
    Filed: March 1, 2018
    Date of Patent: August 31, 2021
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kentaro Jinno, Masaaki Kurokawa
  • Publication number: 20210010974
    Abstract: An eddy current flaw detection probe includes first coils, second coils, and a switching circuit configured to cause the first or the second coils in each unit U, the unit U being composed of adjacent four coils, to serve as excitation coils that generate eddy currents in an inspection target and cause the other coils in the unit U to serve as detection coils that detect a change in the eddy currents. The first coils each have one end thereof connected to a first common wiring, and the second coils each have one end thereof connected to a second common wiring. The switching circuit includes a first switching circuit connected to the other ends of the first coils and the second coils arranged in a first row, and a second switching circuit connected to the other ends of the first coils and the second coils arranged in a second row.
    Type: Application
    Filed: February 22, 2019
    Publication date: January 14, 2021
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kentaro Jinno, Masaaki Kurokawa
  • Publication number: 20190353618
    Abstract: An eddy current flaw detecting probe includes a plurality of excitation coils (3) which is configured to generate an eddy current in an inspection target and a plurality of detection coils (4) which are differentially connected to each other. The plurality of detection coils (4) includes a first detection coil (41) which is disposed on a second center line (4a) intersecting a first center line (3a) which connects a center of a first excitation coil (31) and a center of a second excitation coil (32) to each other and a second detection coil (42) which is disposed on a side opposite to the first detection coil (41) on the second center line (4a). The excitation coil (3) and the detection coil (4) are disposed to be inclined toward an inspection target surface as approaching each other.
    Type: Application
    Filed: March 1, 2018
    Publication date: November 21, 2019
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kentaro Jinno, Masaaki Kurokawa