Patents by Inventor Keu Chan Lee

Keu Chan Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Particle beam mass spectrometer and particle measurement method by means of same
    Patent number: 10283339
    Abstract: The present invention relates to a particle beam mass spectrometer and particle measurement method by means of same. More particularly, the present invention relates to a particle beam mass spectrometer including: a particle focusing unit focusing a particle beam induced by gas flow; an electron gun forming a charged particle beam by accelerating thermal electrons to ionize the particle beam focused by the particle focusing unit; a deflector deflecting the charged particle beam according to kinetic energy to charge ratio; and a sensing unit measuring a current induced by the deflected charged particle beam, wherein the deflector includes at least one particle beam separation electrode provided at each of opposite sides with respect to a progress axis of the charged particle beam before being deflected.
    Type: Grant
    Filed: October 7, 2015
    Date of Patent: May 7, 2019
    Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Chang Joon Park, Sang Jung Ahn, Cheolsu Han, Keu Chan Lee, Seok Rae Yoon
  • PARTICLE BEAM MASS SPECTROMETER AND PARTICLE MEASUREMENT METHOD BY MEANS OF SAME
    Publication number: 20180286655
    Abstract: The present invention relates to a particle beam mass spectrometer and particle measurement method by means of same. More particularly, the present invention relates to a particle beam mass spectrometer including: a particle focusing unit focusing a particle beam induced by gas flow; an electron gun forming a charged particle beam by accelerating thermal electrons to ionize the particle beam focused by the particle focusing unit; a deflector deflecting the charged particle beam according to kinetic energy to charge ratio; and a sensing unit measuring a current induced by the deflected charged particle beam, wherein the deflector includes at least one particle beam separation electrode provided at each of opposite sides with respect to a progress axis of the charged particle beam before being deflected.
    Type: Application
    Filed: October 7, 2015
    Publication date: October 4, 2018
    Inventors: Chang Joon Park, Sang Jung AHN, Cheolsu HAN, Keu Chan LEE, Seok Rae YOON
  • SYSTEM FOR MEASURING ABSOLUTE QUANTITY OF EACH COMPONENT OF GAS USING QMS
    Publication number: 20120216598
    Abstract: The present invention relates to a system for measuring an absolute quantity of each component of a gas using a QMS, more particularly to a system for measuring an absolute quantity of each component of a gas using a QMS, which is capable of performing not only a qualitative analysis but also a quantitative analysis in an accurate manner, using just a trace amount of gas introduced through a pinhole. According to the present invention, the productivity of products can be improved, and production management can be performed in an efficient manner, thereby improving industrial competitiveness.
    Type: Application
    Filed: November 25, 2010
    Publication date: August 30, 2012
    Applicants: Korea Research Institute of Standards and Science, EL Inc.
    Inventors: Seok Rae Yoon, Seong Kweon Joh, Won Young Park, Keu Chan Lee, Jin Seong Kim, Jin Bok Lee, Dong Min Moon, Kwang Seob Kim