Abstract: The present invention is a modified darlington phototransistor wherein a phototransistor is coupled to a Bipolar Junction Transistor (BJT). This design provides a high sensitivity and a fast response and effectively increases the gain of the photocurrent. This circuit is particularly will suited for the readily available CMOS and Bipolar Complementary Metal Oxide Semiconductor (BiCMOS) processes prevalent today.

Abstract: An automated test system and method for infrared focal plane detector arr which utilize X-Y positioning of a focused laser spot scanning individual detector array elements Detector element outputs are processed for the entire focal plane array resulting in crosstalk measurement.

Abstract: A test system for completely characterizing all known types of infrared and ar-infrared detector arrays for FLIR imagers, which utilizes a number of different radiation sources, array supports, radiation filters, and radiation stops all remotely controlled and positioned by a computer which performs the test, sorts the data collected the results and presents it in a variety of formats. Also an automatic test method for characterizing infrared detectors using remote controlled radiation sources and dewar mounting devices under computer control.