Abstract: A memory device includes a memory cell array, a plurality of bit lines, and a plurality of page buffers including a plurality of cache latches, exchanging data with the memory cell array through the plurality of bit lines, wherein the plurality of cache latches are arranged in a column direction in parallel with the plurality of bit lines and a row direction perpendicular to the plurality of bit lines, and have a two-dimensional arrangement of M stages in the column direction, where M is a positive integer not corresponding to 2L and L is zero or a natural number.

Abstract: A memory device includes a memory cell array, a plurality of bit lines, and a plurality of page buffers including a plurality of cache latches, exchanging data with the memory cell array through the plurality of bit lines, wherein the plurality of cache latches are arranged in a column direction in parallel with the plurality of bit lines and a row direction perpendicular to the plurality of bit lines, and have a two-dimensional arrangement of M stages in the column direction, where M is a positive integer not corresponding to 2L and L is zero or a natural number.

Abstract: A semiconductor memory device may include: a data alignment signal generation unit suitable for generating an alignment signal corresponding to an input speed of data; a data alignment unit suitable for aligning the data in response to the alignment signal to output aligned data; and a state data storage unit suitable for storing the aligned data in response to a control signal which is activated at a given time.

Abstract: A semiconductor memory device may include: a data alignment signal generation unit suitable for generating an alignment signal corresponding to an input speed of data; a data alignment unit suitable for aligning the data in response to the alignment signal to output aligned data; and a state data storage unit suitable for storing the aligned data in response to a control signal which is activated at a given time.

Abstract: The voltage control generator for a semiconductor device is disclosed, in which the substrate bias voltage through the oscillation period of the step-up voltage generator circuit are quickly adjusted with respect to the level variation of a corresponding voltage. The circuit according to the present invention includes a control level generator generating at least one control signal for detecting a substrate bias voltage level from a substrate of a semiconductor device and adjusting the width of an oscillation period to a set level in accordance with the detected signal, a voltage control oscillator generating a signal in which the width of an oscillation period is varied to the set level in response to an output signal from the control level generator, and a charge pump supplying a stable bias voltage to the substrate of the semiconductor device by increasing or decreasing a pumping speed in response to an output signal from the voltage control oscillator.