Patents by Inventor Koichi Komatsu
Koichi Komatsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240092890Abstract: A bispecific antibody including a first domain which specifically binds to a mutant calreticulin protein and a second domain which specifically binds to a CD3 antigen. A pharmaceutical composition including the bispecific antibody or a functional fragment thereof. A diagnostic method for a myeloproliferative neoplasm, including detecting a polypeptide in a biological sample with the bispecific antibody.Type: ApplicationFiled: August 26, 2021Publication date: March 21, 2024Applicants: JUNTENDO EDUCATIONAL FOUNDATION, MEIJI SEIKA PHARMA CO., LTD.Inventors: Norio KOMATSU, Marito ARAKI, Yoshihiko KIHARA, Yoji ISHIDA, Koichi KITAMURA, Takayoshi FUKUSHIMA, Kaori YASUI
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Publication number: 20230251753Abstract: A method for specifying a position through touch input in a screen displayed on a touch panel display. The position is specified by acquiring an initial contact position with the touch panel display, displaying a position displaying cursor in a position according to the initial contact position, displaying the position displaying cursor in the position according to the initial contact position during the period for which the contact position sensing continues until the distance from the initial contact position to the contact position reaches a predetermined distance and terminating the display of the position displaying cursor where the contact position sensing is terminated before the distance reaches the predetermined distance, and displaying the position displaying cursor in such a way that the position displaying cursor follows movement of the contact position after the distance reaches the predetermined distance.Type: ApplicationFiled: April 13, 2023Publication date: August 10, 2023Inventors: Gyokubu Cho, Koichi Komatsu, Hiraku Ishiyama
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Patent number: 11656733Abstract: The present invention relates to a position specifying method for specifying a position through touch input in a screen displayed on a touch panel display.Type: GrantFiled: March 28, 2022Date of Patent: May 23, 2023Assignee: Mitutoyo CorporationInventors: Gyokubu Cho, Koichi Komatsu, Hiraku Ishiyama
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Publication number: 20220221974Abstract: The present invention relates to a position specifying method for specifying a position through touch input in a screen displayed on a touch panel display.Type: ApplicationFiled: March 28, 2022Publication date: July 14, 2022Inventors: Gyokubu Cho, Koichi Komatsu, Hiraku Ishiyama
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Patent number: 11314374Abstract: An image measuring apparatus includes an imager that acquires an image of a measurement target object, a touch panel display that displays the image acquired by the imager and accepts touch input operation of specifying a position in the displayed image, and an edge detector that searches for and detects an edge present in a predetermined range around the in-image specified position specified by a user's touch input operation in the image displayed on the touch panel display. When edges are found in a vicinity of the specified position, the edge detector causes a control object for selecting each of the edges to be displayed on the touch panel display not only in an aspect that prevents a wrong edge from being selected through the touch operation but in an aspect that allows visual recognition of a correspondence between each of the edges and a corresponding control object.Type: GrantFiled: May 4, 2021Date of Patent: April 26, 2022Assignee: MITUTOYO CORPORATIONInventors: Gyokubu Cho, Koichi Komatsu, Hiraku Ishiyama
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Patent number: 11257205Abstract: An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device; a standard reference dimension input inputting a dimension of the standard reference object specified by a device other than the image measuring device; a preset value calculation calculating a preset value from the dimension of the measured standard reference object and from a dimension of the standard reference object measured by a predetermined measurement tool; a measurement measuring a dimension of a measured object other than the standard reference object using the image measuring device; and a correction correcting the dimension of the measured object other than the standard reference object measured by the image measuring device.Type: GrantFiled: December 20, 2016Date of Patent: February 22, 2022Assignee: MITUTOYO CORPORATIONInventors: Gyokubu Cho, Koichi Komatsu, Akira Takada, Hiroyuki Yoshida, Takashi Hanamura, Takuho Maeda, Makoto Kaieda, Isao Tokuhara
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Publication number: 20210255755Abstract: The present invention relates to a position specifying method for specifying a position through touch input in a screen displayed on a touch panel display.Type: ApplicationFiled: May 4, 2021Publication date: August 19, 2021Inventors: Gyokubu Cho, Koichi Komatsu, Hiraku Ishiyama
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Publication number: 20200210049Abstract: The present invention relates to a position specifying method for specifying a position through touch input in a screen displayed on a touch panel display.Type: ApplicationFiled: March 13, 2020Publication date: July 2, 2020Inventors: Gyokubu Cho, Koichi Komatsu, Hiraku Ishiyama
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Patent number: 10656780Abstract: A method for specifying a position through touch input in a screen displayed on a touch panel display. The position is specified by acquiring an initial contact position with the touch panel display, displaying a position displaying cursor in a position according to the initial contact position, displaying the position displaying cursor in the position according to the initial contact position during the period for which the contact position sensing continues until the distance from the initial contact position to the contact position reaches a predetermined distance and terminating the display of the position displaying cursor where the contact position sensing is terminated before the distance reaches the predetermined distance, and displaying the position displaying cursor in such a way that the position displaying cursor follows movement of the contact position after the distance reaches the predetermined distance.Type: GrantFiled: January 3, 2019Date of Patent: May 19, 2020Assignee: MITUTOYO CORPORATIONInventors: Gyokubu Cho, Koichi Komatsu, Hiraku Ishiyama
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Publication number: 20190220167Abstract: The present invention relates to a position specifying method for specifying a position through touch input in a screen displayed on a touch panel display.Type: ApplicationFiled: January 3, 2019Publication date: July 18, 2019Inventors: Gyokubu Cho, Koichi Komatsu, Hiraku Ishiyama
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Publication number: 20190220185Abstract: The present invention relates to an image measurement apparatus images an object to be measured, and measures dimensions and shape of the object to be measured based on an image of the object to be measured displayed on the touch-sensitive panel display. The apparatus comprising: an controller that identifies a command corresponding to a gesture contact-input with respect to the touch-sensitive panel display from a signal output from the touch-sensitive panel display in response to the gesture, and executes the command with respect to a part in the image measurement apparatus, the part being the target of the execution of such command. The gesture is a gesture performed in the state in which the simultaneous touch is made at two or more points.Type: ApplicationFiled: January 9, 2019Publication date: July 18, 2019Inventors: Gyokubu Cho, Koichi Komatsu, Yasuhiro Takahama, Hiraku Ishiyama, Barry Saylor, Dahai Yu, Ryan Northrup
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Patent number: 10102631Abstract: A distance in a scanning direction between a first set of edges which face each other and exhibit an opposite change between light and dark is measured by an image measuring machine, and a bias correction value is calculated based on a difference between a measured value and a true value. Using the bias correction value, detection point correction values, which are correction values in various directions of edge detection points detected by a scan of a measured object using the image measuring machine, are calculated; a correction amount used in correction of the edge detection points is specified based on the detection point correction value in each direction; and the edge detection points are corrected using the correction amount.Type: GrantFiled: March 30, 2016Date of Patent: October 16, 2018Assignee: MITUTOYO CORPORATIONInventors: Hiroyuki Yoshida, Akira Takada, Makoto Kaieda, Gyokubu Cho, Koichi Komatsu, Hidemitsu Asano, Takashi Hanamura, Takuho Maeda, Isao Tokuhara
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Publication number: 20170178315Abstract: An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device; a standard reference dimension input inputting a dimension of the standard reference object specified by a device other than the image measuring device; a preset value calculation calculating a preset value from the dimension of the measured standard reference object and from a dimension of the standard reference object measured by a predetermined measurement tool; a measurement measuring a dimension of a measured object other than the standard reference object using the image measuring device; and a correction correcting the dimension of the measured object other than the standard reference object measured by the image measuring device.Type: ApplicationFiled: December 20, 2016Publication date: June 22, 2017Applicant: MITUTOYO CORPORATIONInventors: Gyokubu CHO, Koichi KOMATSU, Akira TAKADA, Hiroyuki YOSHIDA, Takashi HANAMURA, Takuho MAEDA, Makoto KAIEDA, Isao TOKUHARA
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Publication number: 20160295207Abstract: A distance in a scanning direction between a first set of edges which face each other and exhibit an opposite change between light and dark is measured by an image measuring machine, and a bias correction value is calculated based on a difference between a measured value and a true value. Using the bias correction value, detection point correction values, which are correction values in various directions of edge detection points detected by a scan of a measured object using the image measuring machine, are calculated; a correction amount used in correction of the edge detection points is specified based on the detection point correction value in each direction; and the edge detection points are corrected using the correction amount.Type: ApplicationFiled: March 30, 2016Publication date: October 6, 2016Applicant: MITUTOYO CORPORATIONInventors: Hiroyuki YOSHIDA, Akira TAKADA, Makoto KAIEDA, Gyokubu CHO, Koichi KOMATSU, Hidemitsu ASANO, Takashi HANAMURA, Takuho MAEDA, Isao TOKUHARA
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Patent number: 8654351Abstract: An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe for a surface profile measuring machine is provided. The method includes: setting on a stage a calibration jig that has a surface being provided with a lattice pattern with a level difference; measuring the lattice pattern of the calibration jig by the contact-type detector to obtain a first reference position of the lattice pattern; capturing the image of the lattice pattern of the calibration jig by the image probe to obtain a second reference position of the lattice pattern; and obtaining the offset amount from a difference between the first and second reference positions.Type: GrantFiled: October 8, 2010Date of Patent: February 18, 2014Assignee: Mitutoyo CorporationInventors: Yasushi Fukumoto, Koichi Komatsu, Fumihiro Takemura, Sadaharu Arita, Kotaro Hirano
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Patent number: 8650939Abstract: A surface texture measuring machine includes: a stage, a contact-type detector having a stylus, an image probe, a relative movement mechanism and a controller. The controller includes: a center position calculating unit that, when the image probe enters position data of at least three points on a circular contour of a circular concave portion or a circular convex portion of an object, approximates the entered position data to a circle to obtain a center position of the circle; and a stylus setting unit that, after calculating the center position, operates the relative movement mechanism to position the stylus of the contact-type detector at the center position.Type: GrantFiled: October 8, 2010Date of Patent: February 18, 2014Assignee: Mitutoyo CorporationInventors: Sadayuki Matsumiya, Yoshiyuki Omori, Sadaharu Arita, Kotaro Hirano, Yasushi Fukumoto, Koichi Komatsu, Fumihiro Takemura
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Publication number: 20110085177Abstract: An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe for a surface profile measuring machine is provided. The method includes: setting on a stage a calibration jig that has a surface being provided with a lattice pattern with a level difference; measuring the lattice pattern of the calibration jig by the contact-type detector to obtain a first reference position of the lattice pattern; capturing the image of the lattice pattern of the calibration jig by the image probe to obtain a second reference position of the lattice pattern; and obtaining the offset amount from a difference between the first and second reference positions.Type: ApplicationFiled: October 8, 2010Publication date: April 14, 2011Applicant: MITUTOYO CORPORATIONInventors: Yasushi FUKUMOTO, Koichi KOMATSU, Fumihiro TAKEMURA, Sadaharu ARITA, Kotaro HIRANO
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Publication number: 20110083497Abstract: A surface texture measuring machine includes: a stage, a contact-type detector having a stylus, an image probe, a relative movement mechanism and a controller. The controller includes: a center position calculating unit that, when the image probe enters position data of at least three points on a circular contour of a circular concave portion or a circular convex portion of an object, approximates the entered position data to a circle to obtain a center position of the circle; and a stylus setting unit that, after calculating the center position, operates the relative movement mechanism to position the stylus of the contact-type detector at the center position.Type: ApplicationFiled: October 8, 2010Publication date: April 14, 2011Applicant: MITUTOYO CORPORATIONInventors: Sadayuki MATSUMIYA, Yoshiyuki OMORI, Sadaharu ARITA, Kotaro HIRANO, Yasushi FUKUMOTO, Koichi KOMATSU, Fumihiro TAKEMURA
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Patent number: 7869622Abstract: Within a prioritized mode selection dialog, either a measurement accuracy prioritized mode or a measurement speed prioritized mode is selected. If the measurement accuracy prioritized mode is selected, then processing for entering a tolerable amount of movement is executed. Then, a relative movement speed of a CCD camera to a measurement stage is calculated from the entered amount of movement. Finally, image information is captured at a lower speed than the calculated relative movement speed to execute image measurement. If the measurement speed prioritized mode is selected, then processing for entering a relative movement speed is executed, and image information is captured at the entered relative movement speed to execute image measurement.Type: GrantFiled: May 31, 2006Date of Patent: January 11, 2011Assignee: Mitutoyo CorporationInventors: Sadayuki Matsumiya, Koichi Komatsu
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Patent number: 7822230Abstract: An image measuring system comprises a measurement point acquire, a measurement direction calculator, a synthesized direction calculator operative to calculate a synthesized direction resulted from synthesis of movement directions before and after the measurement point, a fore/aft-running point calculator operative to calculate a forerunning point at a position spaced a certain distance backward in the synthesized direction from the measurement point and to calculate an aft-running point at a position spaced a certain distance forward in the synthesized direction from the measurement point, a way point calculator operative to calculate a plurality of way points arranged on a path smoothly connecting the aft-running point to the forerunning point, and a measurement path setter operative to set a measurement path following the synthesized directions and passing through the calculated way points and the measurement points.Type: GrantFiled: February 26, 2007Date of Patent: October 26, 2010Assignee: Mitutoyo CorporationInventors: Shigeru Fujimaki, Koichi Komatsu