Patents by Inventor Kotoku Sato

Kotoku Sato has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8619487
    Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.
    Type: Grant
    Filed: January 23, 2012
    Date of Patent: December 31, 2013
    Assignee: Fujitsu Semiconductor Limited
    Inventors: Shinya Fujioka, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Publication number: 20130332761
    Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.
    Type: Application
    Filed: August 6, 2013
    Publication date: December 12, 2013
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Shinya FUJIOKA, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Publication number: 20130326246
    Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.
    Type: Application
    Filed: August 6, 2013
    Publication date: December 5, 2013
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Shinya FUJIOKA, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Publication number: 20130322198
    Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.
    Type: Application
    Filed: August 6, 2013
    Publication date: December 5, 2013
    Applicant: Fujitsu Semiconductor Limited
    Inventors: Shinya FUJIOKA, Tomohiro KAWAKUBO, Koichi NISHIMURA, Kotoku SATO
  • Publication number: 20130326248
    Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.
    Type: Application
    Filed: August 6, 2013
    Publication date: December 5, 2013
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Shinya Fujioka, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Publication number: 20130326247
    Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.
    Type: Application
    Filed: August 6, 2013
    Publication date: December 5, 2013
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Shinya FUJIOKA, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Publication number: 20130315020
    Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.
    Type: Application
    Filed: August 6, 2013
    Publication date: November 28, 2013
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Shinya FUJIOKA, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Publication number: 20130315012
    Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.
    Type: Application
    Filed: August 6, 2013
    Publication date: November 28, 2013
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Shinya FUJIOKA, Tomohiro KAWAKUBO, Koichi NISHIMURA, Kotoku SATO
  • Publication number: 20130318293
    Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.
    Type: Application
    Filed: August 6, 2013
    Publication date: November 28, 2013
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Shinya FUJIOKA, Tomohiro KAWAKUBO, Koichi NISHIMURA, Kotoku SATO
  • Publication number: 20120120739
    Abstract: An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
    Type: Application
    Filed: January 23, 2012
    Publication date: May 17, 2012
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Shinya FUJIOKA, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Patent number: 8130586
    Abstract: An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
    Type: Grant
    Filed: July 30, 2010
    Date of Patent: March 6, 2012
    Assignee: Fujitsu Semiconductor Limited
    Inventors: Shinya Fujioka, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Patent number: 7903487
    Abstract: An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
    Type: Grant
    Filed: August 29, 2008
    Date of Patent: March 8, 2011
    Assignee: Fujitsu Semiconductor Limited
    Inventors: Shinya Fujioka, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Patent number: 7869296
    Abstract: An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
    Type: Grant
    Filed: September 6, 2006
    Date of Patent: January 11, 2011
    Assignee: Fujitsu Semiconductor Limited
    Inventors: Shinya Fujioka, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Publication number: 20100302879
    Abstract: An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
    Type: Application
    Filed: July 30, 2010
    Publication date: December 2, 2010
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Shinya FUJIOKA, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Patent number: 7730232
    Abstract: A data transfer method and system are provided that prevent the length of a time required for writing to a flash memory from appearing on the surface as a system operation when the flash memory is used in place of an SRAM. The method of transferring data includes the steps of writing data from a controller to a volatile memory, placing the volatile memory in a transfer state, transferring the data from the volatile memory in the transfer state to a nonvolatile memory, and releasing the volatile memory from the transfer state in response to confirming completion of the transfer of the data.
    Type: Grant
    Filed: April 25, 2005
    Date of Patent: June 1, 2010
    Assignee: Fujitsu Microelectronics Limited
    Inventors: Shinya Fujioka, Kotoku Sato, Hitoshi Ikeda, Yoshiaki Okuyama, Jun Ohno
  • Patent number: 7688661
    Abstract: An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
    Type: Grant
    Filed: September 22, 2008
    Date of Patent: March 30, 2010
    Assignee: Fujitsu Microelectronics Limited
    Inventors: Shinya Fujioka, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Patent number: 7684258
    Abstract: To perform mask control of data signals without increasing the number of external terminals even when the number of bits in a data mask signal is large, an address input circuit sequentially receives a first address signal, a second address signal, and a first data mask signal supplied to an address terminal in synchronization with transition edges of a clock signal. Namely, the first data mask signal is supplied to the address terminal at a different timing from timing at which the first and second address signals are received. The first address signal, second address signal, and first data mask signal are output, for example, from a controller accessing a semiconductor memory. A data input/output circuit inputs/outputs data via a data terminal and masks at least either of write data to memory cells and read data from the memory cells in accordance with logic of the first data mask signal.
    Type: Grant
    Filed: February 13, 2007
    Date of Patent: March 23, 2010
    Assignee: Fujitsu Microelectronics Limited
    Inventors: Tatsuya Kanda, Kotoku Sato
  • Patent number: 7495986
    Abstract: An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
    Type: Grant
    Filed: July 27, 2005
    Date of Patent: February 24, 2009
    Assignee: Fujitsu Microelectronic Limited
    Inventors: Shinya Fujioka, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Patent number: 7483323
    Abstract: An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
    Type: Grant
    Filed: September 6, 2006
    Date of Patent: January 27, 2009
    Assignee: Fujitsu Microelectronics Limited
    Inventors: Shinya Fujioka, Tomohiro Kawakubo, Koichi Nishimura, Kotoku Sato
  • Publication number: 20090016142
    Abstract: An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
    Type: Application
    Filed: September 22, 2008
    Publication date: January 15, 2009
    Inventors: Shinya FUJIOKA, Tomohiro KAWAKUBO, Koichi NISHIMURA, Kotoku SATO