Patents by Inventor Kouichi MASUTANI

Kouichi MASUTANI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210011041
    Abstract: A sample measurement system and method of transporting of racks are provided that collectively supply the consumables to the sample measurement units. The sample measurement system includes: sample measurement units that perform measurement on samples by using consumables; a setting part in which a user sets consumable racks housing the consumables; a first transport path that supplies the consumable racks set in the setting part to one of the sample measurement units; a collector that is arranged adjacent to the setting part and that collects empty racks that are emptied after being transported to at least one of the sample measurement units; and a second transport path that transports the empty racks to the collector.
    Type: Application
    Filed: September 28, 2020
    Publication date: January 14, 2021
    Applicant: SYSMEX CORPORATION
    Inventors: Kouichi MASUTANI, Yuji WAKAMIYA
  • Publication number: 20210011039
    Abstract: A sample measurement system according to an embodiment may include: sample measurement units that receive supply of containers and perform measurement on samples; a rack setting unit in which a rack storing the containers to be supplied to at least one of the sample measurement units is set; a first transport path that transports the containers from the rack setting unit to at least one of the sample measurement units; a second transport path that is provided at a position different from the first transport path in a height direction and that transports the containers from at least one of the sample measurement units to the rack setting unit; and a transfer path that transfers the containers between the first transport path and the second transport path.
    Type: Application
    Filed: September 24, 2020
    Publication date: January 14, 2021
    Applicant: SYSMEX CORPORATION
    Inventors: Kouichi MASUTANI, Yuji WAKAMIYA
  • Publication number: 20210011040
    Abstract: A sample measurement system according to an embodiment may include: sample measurement units that perform measurement on samples by using consumables; a consumable setting unit in which a consumable rack storing the consumables to be supplied to the sample measurement units is set; a sample setting unit in which a sample rack storing the samples to be supplied to the sample measurement units is set; a first transport path that transports the consumable rack from the consumable setting unit to at least one of the sample measurement units; and a second transport path that transports the sample rack from the sample setting unit to at least one of the sample measurement units.
    Type: Application
    Filed: September 25, 2020
    Publication date: January 14, 2021
    Applicant: SYSMEX CORPORATION
    Inventors: Kouichi MASUTANI, Yuji WAKAMIYA
  • Publication number: 20190265263
    Abstract: A pipette tip supply mechanism includes: a pipette tip storage unit for storing a plurality of tapered shaped pipette tips; a belt for transporting a pipette tip supplied from an opening of the pipette tip storage unit; and a belt drive unit that drives the belt in a transport direction. The belt is inclined upwards toward the transport direction so that the pipette tip is rotatable around a longitudinal axis of the pipette tip on a surface of the belt and the pipette tip is rolled to orient the longitudinal axis of the pipette tip along the transport direction in conjunction with the drive of the belt in the transport direction.
    Type: Application
    Filed: February 27, 2019
    Publication date: August 29, 2019
    Inventor: Kouichi MASUTANI
  • Patent number: 9285383
    Abstract: A specimen analyzer comprises a measurement mechanism section configured to measure a specimen by using a first consumable and a second consumable having a shape different from a shape of the first consumable, a first inlet for loading the first consumable, a supplying section configured to supply the first consumable loaded through the first inlet, to the measurement mechanism section, a sorter configured to sort the first consumable and the second consumable from each other, and a storage for housing the second consumable sorted by the sorter.
    Type: Grant
    Filed: September 11, 2013
    Date of Patent: March 15, 2016
    Assignee: SYSMEX CORPORATION
    Inventors: Hiroto Toyoshima, Kouichi Masutani
  • Publication number: 20140079591
    Abstract: A specimen analyzer comprises a measurement mechanism section configured to measure a specimen by using a first consumable and a second consumable having a shape different from a shape of the first consumable, a first inlet for loading the first consumable, a supplying section configured to supply the first consumable loaded through the first inlet, to the measurement mechanism section, a sorter configured to sort the first consumable and the second consumable from each other, and a storage for housing the second consumable sorted by the sorter.
    Type: Application
    Filed: September 11, 2013
    Publication date: March 20, 2014
    Applicant: SYSMEX CORPORATION
    Inventors: Hiroto TOYOSHIMA, Kouichi MASUTANI