Patents by Inventor Kreg W. Hines

Kreg W. Hines has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7222414
    Abstract: A system for transferring electrical components. The system may comprise a plurality of electrical components. Each of the components may include leads and a physically asymmetric fiducial marker that structurally alters a physical appearance of the components. The system may also comprise a nest having a nest surface that defines a recess shaped to receive any one of the plurality of components only when the component is oriented such that the component's fiducial marker is received by a corresponding asymmetric portion of the nest surface. In addition, the system may comprise a component feed assembly for feeding the plurality of components to the nest, a component alignment detector, and a pick and place machine having a movable pick head. The movable pick head may have access to the component feed assembly and the recess of the nest.
    Type: Grant
    Filed: March 3, 2005
    Date of Patent: May 29, 2007
    Assignee: Micron Technology, Inc.
    Inventors: Darryl L. Gamel, Kreg W. Hines
  • Patent number: 7017262
    Abstract: A method of placing a component having leads and an alignment indicating fiducial marker is provided. The method includes detecting the alignment of the fiducial marker on the component, comparing the detected fiducial alignment with a predetermined fiducial alignment and placing the component to a substrate when the detected fiducial alignment corresponds to the predetermined fiducial/alignment.
    Type: Grant
    Filed: December 17, 1999
    Date of Patent: March 28, 2006
    Assignee: Micron Technology, Inc.
    Inventors: Darryl L. Gamel, Kreg W. Hines
  • Patent number: 6895661
    Abstract: A component transfer apparatus is provided. The component transfer apparatus comprises a pick and place machine having a component feed source and a movable pick head having access to the component feed source. A component alignment detector is directed toward the component feed source and a controller is coupled to the component alignment detector. The controller contains instructions which, when executed by the controller, cause the controller to compare the detected component alignment with a known component alignment.
    Type: Grant
    Filed: December 17, 1999
    Date of Patent: May 24, 2005
    Assignee: Micron Technology, Inc.
    Inventors: Darryl Gamel, Kreg W. Hines
  • Patent number: 6845555
    Abstract: A method of picking a component having an alignment indicating fiducial marker according to a predetermined alignment is provided. The method includes detecting the alignment of the fiducial marker of the component, comparing the detected fiducial alignment with a predetermined fiducial alignment, determining an alignment offset and picking the component in accordance with the alignment offset.
    Type: Grant
    Filed: December 17, 1999
    Date of Patent: January 25, 2005
    Assignee: Micron Technology, Inc.
    Inventors: Darryl L. Gamel, Kreg W. Hines
  • Patent number: 6606791
    Abstract: A method of attaching a component having a fiducial marker to a substrate is provided. The method includes detecting alignment of the fiducial marker, aligning the component such that the fiducial marker matches a predetermined fiducial alignment, and attaching the component to a substrate.
    Type: Grant
    Filed: December 17, 1999
    Date of Patent: August 19, 2003
    Assignee: Micron Technology, Inc.
    Inventors: Darryl L. Gamel, Kreg W. Hines
  • Patent number: 6581281
    Abstract: A method of picking a component having an alignment indicating fiducial marker according to a predetermined alignment is provided. The method includes detecting the alignment of the fiducial marker of the component, comparing the detected fiducial alignment with a predetermined fiducial alignment, determining an alignment offset and picking the component in a manner that corrects the alignment offset when the offset has a predetermined value.
    Type: Grant
    Filed: April 4, 2001
    Date of Patent: June 24, 2003
    Assignee: Micron Technology, Inc.
    Inventors: Darryl L. Gamel, Kreg W. Hines
  • Patent number: 6463653
    Abstract: An electronic component pick and place machine is provided. The pick and place machine comprises a pick station, first and second pick heads, a component alignment detector and a controller. The pick station is connected to a component feed source. The first pick head has access to the pick station and a component transfer area and the second pick head has access to the component transfer area and a component mounting position. The component alignment detector is furthermore directed toward the component transfer area. The controller is coupled to the feed source, the first pick head, the second pick head and the detector, the controller containing instructions which, when executed, cause the controller to compare the detected component alignment with a known component alignment and control the feed source, the first pick head, and the second pick head in response to the comparison.
    Type: Grant
    Filed: December 17, 1999
    Date of Patent: October 15, 2002
    Assignee: Micron Technology, Inc.
    Inventors: Darryl L. Gamel, Kreg W. Hines
  • Patent number: 6332269
    Abstract: A method of verifying a predetermined lead alignment of a component having a physical asymmetry corresponding to an alignment of the leads is provided. The method includes placing the component in a recess in a surface of a nest, wherein the recess corresponds to and mates with the physical asymmetry on the component and detecting whether the physical asymmetry has mated with the recess.
    Type: Grant
    Filed: December 17, 1999
    Date of Patent: December 25, 2001
    Assignee: Micron Technology, Inc.
    Inventors: Darryl L. Gamel, Kreg W. Hines
  • Publication number: 20010013170
    Abstract: Apparatuses and methods are disclosed for determining the alignment of leads on components. Physical and/or superficial fiducial markers on components are used to distinguishes the alignment of leads on the component. The alignment of fiducial markers on the component are detected. A predetermined fiducial alignment is provided that corresponds to a predetermined lead alignment. The detected fiducial alignment is compared to a predetermined fiducial alignment to determine the lead alignment. When used in conjunction with a pick and place machine, the methods and apparatuses provide a means for verifying and correcting the lead alignment of components prior to placement and attachment to a substrate.
    Type: Application
    Filed: April 4, 2001
    Publication date: August 16, 2001
    Inventors: Darryl L. Gamel, Kreg W. Hines
  • Patent number: 6085407
    Abstract: Apparatuses and methods are disclosed for determining the alignment of leads on components. Physical and/or superficial fiducial markers on components are used to distinguishes the alignment of leads on the component. The alignment of fiducial markers on the component are detected. A predetermined fiducial alignment is provided that corresponds to a predetermined lead alignment. The detected fiducial alignment is compared to a predetermined fiducial alignment to determine the lead alignment. When used in conjunction with a pick and place machine, the methods and apparatuses provide a means for verifying and correcting the lead alignment of components prior to placement and attachment to a substrate.
    Type: Grant
    Filed: August 21, 1997
    Date of Patent: July 11, 2000
    Assignee: Micron Technology, Inc.
    Inventors: Darryl L. Gamel, Kreg W. Hines