Abstract: A sensing circuit having a reduced bias clamp and method of operating the sensing circuit are provided. The sensing circuit may include a reference path and a sensing path. The sensing path may include a first transistor, clamping capacitor and a pair of switches. The reference path may include a second transistor, clamping capacitor and another pair of switches. A common gain stage receiving a bias voltage charges the clamping capacitors for the respective paths in a charging mode. The clamping capacitors may be charged in a serial or partially parallel manner during the charging mode. Each path may be coupled to a comparator, which may sense current or voltage changes between the paths during a sense mode. The sensing circuit may be configured to provide for sensing current or voltage changes between multiple sensing and/or reference paths in a parallel or serial manner.

Abstract: The present disclosure provides a method of fabricating a resistive memory array. In one embodiment, a method of fabricating a resistive memory array includes forming a plurality of insulators and a conductive structure on a first substrate, performing a resistor-forming process to transform the insulators into a plurality of resistors, polishing the conductive structure to expose a plurality of contact points respectively electrically connected to the resistors, providing a second substrate having a plurality of transistors and a plurality of interconnect pads, bonding respectively the interconnect pads and the contact points, and removing the first substrate from the resistors and the conductive structure.

Abstract: A method of fabricating a resistive memory array includes forming a plurality of insulators and a conductive structure on a first substrate, performing a resistor-forming process to transform the insulators into a plurality of resistors, polishing the conductive structure to expose a plurality of contact points respectively electrically connected to the resistors, providing a second substrate having a plurality of transistors and a plurality of interconnect pads, bonding respectively the interconnect pads and the contact points, and removing the first substrate from the resistors and the conductive structure.

Abstract: A circuit that includes a current source module, a current sink module and a memory bank is disclosed. Each of the current source module, the current sink module and the memory bank is connected to the first bit/source line and the second bit/source line. The memory bank is bounded by the current source module and the current sink module. When the current source module and the current sink module receive a triggering pulse from the first bit/source line and a select signal with a first state, the current source module is activated to generate an operating current to the first bit/source line that transmits through a conducted memory cell of the memory bank and the current sink module is activated to drain the operating current from the second bit/source line.

Abstract: A sensing circuit having a reduced bias clamp and method of operating the sensing circuit are provided. The sensing circuit may include a reference path and a sensing path. The sensing path may include a first transistor, clamping capacitor and a pair of switches. The reference path may include a second transistor, clamping capacitor and another pair of switches. A common gain stage receiving a bias voltage charges the clamping capacitors for the respective paths in a charging mode. The clamping capacitors may be charged in a serial or partially parallel manner during the charging mode. Each path may be coupled to a comparator, which may sense current or voltage changes between the paths during a sense mode. The sensing circuit may be configured to provide for sensing current or voltage changes between multiple sensing and/or reference paths in a parallel or serial manner.

Abstract: A sensing circuit having a reduced bias clamp and method of operating the sensing circuit are provided. The sensing circuit may include a reference path and a sensing path. The sensing path may include a first transistor, clamping capacitor and a pair of switches. The reference path may include a second transistor, clamping capacitor and another pair of switches. A common gain stage receiving a bias voltage charges the clamping capacitors for the respective paths in a charging mode. The clamping capacitors may be charged in a serial or partially parallel manner during the charging mode. Each path may be coupled to a comparator, which may sense current or voltage changes between the paths during a sense mode. The sensing circuit may be configured to provide for sensing current or voltage changes between multiple sensing and/or reference paths in a parallel or serial manner.

Abstract: A device includes a first switch configured to control a connection between a first voltage node and a capacitor, and a second switch configured to control a connection between a common charge node and the capacitor. The device further includes a plurality of bit-lines, and a plurality of bit-line charge switches, each configured to control a connection between a respective one of the plurality of bit-lines and the common charge node.

Abstract: A device includes an amplifier and a first switched current sampler. The first switched current sampler includes a first transistor, a first capacitor, and first, second, and third switches. The first capacitor has a first terminal electrically connected to a gate electrode of the first transistor, and a second terminal electrically connected to a source electrode of the first transistor. The first switch has a first terminal electrically connected to a first current source, and a second terminal electrically connected to the gate electrode of the first transistor. The second switch has a first terminal electrically connected to the first current source, and a second terminal electrically connected to a drain electrode of the first transistor. The third switch has a first terminal electrically connected to the drain electrode of the first transistor, and a second terminal electrically connected to a first input terminal of the amplifier.

Abstract: A stabilizing circuit is provided that is connected to a biased voltage. The stabilizing circuit is configured to inhibit a change in voltage of the biased voltage caused by a first change in voltage of one or more nodes that are connected to the biased voltage through a first parasitic capacitance. In some embodiments, the stabilizing circuit induces a voltage on the biased voltage through a second parasitic capacitance that changes from a first voltage level to a second voltage level during the first change in voltage such that a total change in parasitic voltage that is induced at the biased voltage during the first change in voltage is close to 0 V.

Abstract: A circuit that includes a current source module, a current sink module and a memory bank is disclosed. Each of the current source module, the current sink module and the memory bank is connected to the first bit/source line and the second bit/source line. The memory bank is bounded by the current source module and the current sink module. When the current source module and the current sink module receive a triggering pulse from the first bit/source line and a select signal with a first state, the current source module is activated to generate an operating current to the first bit/source line that transmits through a conducted memory cell of the memory bank and the current sink module is activated to drain the operating current from the second bit/source line.

Abstract: A low-dropout (LDO) regulator is provided. The LDO regulator comprises a first circuit operating as a closed loop control system. The first circuit is configured to control a voltage at a first node such that the voltage at the first node is substantially equal to a specified regulator output voltage. The LDO regulator comprises a second circuit operating as an open loop control system. The second circuit is configured to increase the voltage at the first node when a current flowing through a load changes from a first current to a second current. The first current is substantially equal to 0 amperes.

Abstract: The present disclosure provides a method of fabricating a resistive memory array. In one embodiment, a method of fabricating a resistive memory array includes forming a plurality of insulators and a conductive structure on a first substrate, performing a resistor-forming process to transform the insulators into a plurality of resistors, polishing the conductive structure to expose a plurality of contact points respectively electrically connected to the resistors, providing a second substrate having a plurality of transistors and a plurality of interconnect pads, bonding respectively the interconnect pads and the contact points, and removing the first substrate from the resistors and the conductive structure.

Abstract: A device includes an amplifier and a first switched current sampler. The first switched current sampler includes a first transistor, a first capacitor, and first, second, and third switches. The first capacitor has a first terminal electrically connected to a gate electrode of the first transistor, and a second terminal electrically connected to a source electrode of the first transistor. The first switch has a first terminal electrically connected to a first current source, and a second terminal electrically connected to the gate electrode of the first transistor. The second switch has a first terminal electrically connected to the first current source, and a second terminal electrically connected to a drain electrode of the first transistor. The third switch has a first terminal electrically connected to the drain electrode of the first transistor, and a second terminal electrically connected to a first input terminal of the amplifier.

Abstract: A memory has magnetic tunnel junction elements with different resistances in different logic states, for bit positions in memory words accessed by a word line signal coupling each bit cell in the addressed word between a bit line and source line for that bit position. The bit lines and source lines are longer and shorter at different word line locations, causing a resistance body effect. A clamping transistor couples the bit line to a sensing circuit when reading, applying a current through the bit cell and producing a read voltage compared by the sensing circuit to a reference such as a comparable voltage from a reference bit cell circuit having a similar structure. A drive control varies an input to the switching transistor as a function of the word line location, e.g., by word line address, to offset the different bit and source line resistances.

Abstract: A word line driver circuit includes a first transistor having its gate coupled to a first node configured to receive a word line select signal. A second transistor has its gate coupled to the first node and a drain coupled to a drain of the first transistor at a second node that is coupled to a word line. A word line assist control circuit is coupled to the first node, to the word line, and to a gate of a third transistor. The word line assist control circuit is configured to turn on or turn off the third transistor to adjust a voltage of the word line.

Abstract: A word line driver of a semiconductor memory includes logic circuitry for coupling a word line to a first node set at a first voltage level when the word line driver is in a first state or to a second node set at a second voltage level when the word line driver is in a second state. A capacitor is configured to be charged to a third voltage level that is greater than the first and second voltage levels. First and second transistors are configured to selectively couple the word line to the capacitor and to a third node set at a fourth voltage level when the word line driver is in a third state. The fourth voltage level is greater than the first voltage level and less than the second voltage level.

Abstract: A sensing circuit having a reduced bias clamp and method of operating the sensing circuit are provided. The sensing circuit may include a reference path and a sensing path. The sensing path may include a first transistor, clamping capacitor and a pair of switches. The reference path may include a second transistor, clamping capacitor and another pair of switches. A common gain stage receiving a bias voltage charges the clamping capacitors for the respective paths in a charging mode. The clamping capacitors may be charged in a serial or partially parallel manner during the charging mode. Each path may be coupled to a comparator, which may sense current or voltage changes between the paths during a sense mode. The sensing circuit may be configured to provide for sensing current or voltage changes between multiple sensing and/or reference paths in a parallel or serial manner.

Abstract: A memory has magnetic tunnel junction elements with different resistances in different logic states, for bit positions in memory words accessed by a word line signal coupling each bit cell in the addressed word between a bit line and source line for that bit position. The bit lines and source lines are longer and shorter at different word line locations, causing a resistance body effect. A clamping transistor couples the bit line to a sensing circuit when reading, applying a current through the bit cell and producing a read voltage compared by the sensing circuit to a reference such as a comparable voltage from a reference bit cell circuit having a similar structure. A drive control varies an input to the switching transistor as a function of the word line location, e.g., by word line address, to offset the different bit and source line resistances.

Abstract: A word line driver circuit includes a first transistor having its gate coupled to a first node configured to receive a word line select signal. A second transistor has its gate coupled to the first node and a drain coupled to a drain of the first transistor at a second node that is coupled to a word line. A word line assist control circuit is coupled to the first node, to the word line, and to a gate of a third transistor. The word line assist control circuit is configured to turn on or turn off the third transistor to adjust a voltage of the word line.

Abstract: A device includes a first switch configured to control a connection between a first voltage node and a capacitor, and a second switch configured to control a connection between a common charge node and the capacitor. The device further includes a plurality of bit-lines, and a plurality of bit-line charge switches, each configured to control a connection between a respective one of the plurality of bit-lines and the common charge node.