Abstract: An integrated circuit including semiconductor devices may be provided. The semiconductor device may be configured to compare phases of strobe signals which are generated according to internal delay times of the semiconductor devices and configured to control points of time that an internal command is inputted to the internal circuits of the semiconductor devices according to a comparison result of the phases of the strobe signals.

Abstract: A semiconductor may include a core block configured to store and output data, and may be configured to output internal information. The semiconductor may include a through via configured for signal transfer with another semiconductor chip. The semiconductor may include an internal information processing circuit configured to transmit internal information selected from the internal information to the through via, or may be configured to output internal information of the other semiconductor chip, which has been transmitted through the through via, to an exterior through a special purpose pin, in response to test signals.

Abstract: A test circuit of a semiconductor apparatus may include a period signal counting block configured to count a period signal by a predetermined number of times, and enable an overflow signal. The test circuit of the semiconductor apparatus may include a clock signal counting block configured to count an internal clock signal until the overflow signal is enabled, and may output clock counting codes. The test circuit of the semiconductor apparatus may include an update register configured to receive and store the clock counting codes based on the overflow signal.

Abstract: A semiconductor may include a core block configured to store and output data, and may be configured to output internal information. The semiconductor may include a through via configured for signal transfer with another semiconductor chip. The semiconductor may include an internal information processing circuit configured to transmit internal information selected from the internal information to the through via, or may be configured to output internal information of the other semiconductor chip, which has been transmitted through the through via, to an exterior through a special purpose pin, in response to test signals.

Abstract: A repair system for a semiconductor apparatus includes a tester configured to generate memory repair data including a die identification information and repair addresses, and a command to perform a repair process; and a semiconductor apparatus including a plurality of dies configured to receive the memory repair data, wherein one of the dies corresponding to the die identification information performs a repair operation according to the repair addresses and the command.

Abstract: A test circuit of a semiconductor apparatus may include a period signal counting block configured to count a period signal by a predetermined number of times, and enable an overflow signal. The test circuit of the semiconductor apparatus may include a clock signal counting block configured to count an internal clock signal until the overflow signal is enabled, and may output clock counting codes. The test circuit of the semiconductor apparatus may include an update register configured to receive and store the clock counting codes based on the overflow signal.

Abstract: An ultra wideband antenna is provided that filters a predetermined frequency signal. The ultra wideband antenna includes a power feeding part that receives a supply of an external electromagnetic energy; a radiator excited by the electromagnetic energy fed through the power feeding part and radiating an electromagnetic wave; and a stub, provided on the radiator in a direction parallel to a direction of an electric field formed by the electromagnetic wave, that intercepts transmission/reception of a predetermined frequency band signal. The length of the stub may be ¼ of a wavelength of the intermediate frequency of the predetermined frequency band to be removed to filter the corresponding frequency band signal. The ultra wideband antenna simplifies the construction of an ultra wideband receiving system with the power loss and noise characteristics of the system improved.

Abstract: An ultra wideband antenna is provided that filters a predetermined frequency signal. The ultra wideband antenna includes a power feeding part that receives a supply of an external electromagnetic energy; a radiator excited by the electromagnetic energy fed through the power feeding part and radiating an electromagnetic wave; and a stub, provided on the radiator in a direction parallel to a direction of an electric field formed by the electromagnetic wave, that intercepts transmission/reception of a predetermined frequency band signal. The length of the stub may be ¼ of a wavelength of the intermediate frequency of the predetermined frequency band to be removed to filter the corresponding frequency band signal. The ultra wideband antenna simplifies the construction of an ultra wideband receiving system with the power loss and noise characteristics of the system improved.

Abstract: Disclosed is a process of preparing a biodegradable polymer using an enzyme catalyst and a biodegradable polymer prepared through the process. The process includes polycondensing a polyhydric alcohol monomer having a secondary hydroxyl functional group and an acid monomer having a dicarboxylic group in the presence of the enzyme catalyst. Since the biodegradable polymer according to the present invention is polymerized using an enzyme in the course of the polycondensation, it is easily prepared and friendly to nature, and it is possible to control the molecular weight by varying the reaction time in the course of the polymerization. Thus, the biodegradable polymer is usefully applied to control the dose of a drug in a drug release system and is useful as a supporter for regenerating a desired biological tissue of a patient in tissue engineering.