Abstract: A method of physical design of an IC using an EDA tool includes identifying elements of the IC design that have excess positive timing slack. The excess timing slack elements are placed in a separate partition and then parameters of the characteristics of the excess timing slack elements are modified to reduce their excess timing slack, such as reducing the voltage supplied to the separate partition, thereby lowering power consumption of the IC design.

Abstract: A level shifter operates using first and second input signals. When the first and second input signals are in respective first and second states, a first switching element is activated and an output node is pulled toward a first voltage, first pull-down protection and first pull-down switching elements are deactivated, a first protection node is connected to a first bias voltage, second pull-down protection and second pull-down switching elements are activated, and a second protection node is pulled to a second voltage. When the first and second input signals are in respective second and first states, the first switching element is deactivated, the first pull-down protection and first pull-down switching elements are activated, the output node and the first protection node are pulled toward the second voltage, the second pull-down protection and second pull-down switching elements are deactivated, and the second protection node is connected to the first bias voltage.

Abstract: A clock signal generator provides a gated clock signal GCLK to trigger operation of dual-edge triggered circuits. A first detector generates, while a clock gating signal /EN is asserted, a first detector output signal that is asserted or de-asserted as a function of disjunction or conjunction respectively of the values that an input clock signal CLK and the gated clock signal GCLK had when the clock gating signal /EN transitioned. A second detector generates, while the clock gating signal /EN is de-asserted, as the value of the gated clock signal GCLK, the value CLK or its complement /CLK as a function of the first detector output signal. When the clock gating signal /EN is asserted, the second detector maintains the value that the gated clock signal GCLK had when the clock gating signal /EN transitioned from de-asserted to asserted.

Abstract: A clock signal generator provides a gated clock signal GCLK to trigger operation of dual-edge triggered circuits. A first detector generates, while a clock gating signal /EN is asserted, a first detector output signal that is asserted or de-asserted as a function of disjunction or conjunction respectively of the values that an input clock signal CLK and the gated clock signal GCLK had when the clock gating signal /EN transitioned. A second detector generates, while the clock gating signal /EN is de-asserted, as the value of the gated clock signal GCLK, the value CLK or its complement /CLK as a function of the first detector output signal. When the clock gating signal /EN is asserted, the second detector maintains the value that the gated clock signal GCLK had when the clock gating signal /EN transitioned from de-asserted to asserted.

Abstract: A method of physical design of an IC using an EDA tool includes identifying elements of the IC design that have excess positive timing slack. The excess timing slack elements are placed in a separate partition and then parameters of the characteristics of the excess timing slack elements are modified to reduce their excess timing slack, such as reducing the voltage supplied to the separate partition, thereby lowering power consumption of the IC design.

Abstract: Forward bulk biasing circuitry for PMOS and NMOS transistors is provided. The bulk biasing circuitry includes two N-type MOS transistors, two P-type MOS transistors, and two capacitors. The forward bias to a bulk terminal of a transistor increases a threshold voltage of a transistor, thereby reducing a transition time and improving the performance of the transistor. The forward bias is provided only when the transistor transitions from one state to another, thereby reducing leakage power dissipation during active and standby modes of an integrated circuit that includes the transistor.

Abstract: An apparatus for protecting a device against an over-voltage condition that is in excess of its breakdown voltage includes a detector for detecting the over-voltage condition and a protection circuit for protecting the device in response to detection of the over-voltage condition. The protection circuit may include a transmission gate and a PMOS transistor for producing a protection signal. The protection signal may be applied to a gate and/or a drain and/or a source and/or a well of the device such that a voltage across the device does not exceed the breakdown voltage. The protection signal may be derived from the over-voltage condition independent of whether a supply of power to the device is present.

Abstract: A compensation circuit and a method that compensates for process, voltage and temperature (PVT) variations in an integrated circuit that includes functional modules. The compensation circuit includes a signal generator, a first code generator, a second code generator, and a mapping module. The signal generator generates a first signal and a second signal depending on aligned process corner, voltage and temperature variations and skewed process corner variations respectively. The first code generator receives the first signal, and generates a first calibration code. The second code generator receives the second signal, and generates a second calibration code. The mapping module provides the first and second calibration codes for compensating for the aligned process corner, voltage and temperature variations and the skewed process corner variations associated with the functional modules respectively.

Abstract: A compensation circuit and a method for detecting and compensating for process, voltage, and temperature (PVT) variations in an integrated circuit. The integrated circuit includes plural logic modules that include PMOS transistors and NMOS transistors. The compensation circuit includes first and second functional modules, which generate first and second calibration signals. The first and the second calibration signals are used to compensate for the PVT variations in PMOS and NMOS transistors.

Abstract: An apparatus for protecting a device against an over-voltage condition that is in excess of its breakdown voltage includes a detector for detecting the over-voltage condition and a protection circuit for protecting the device in response to detection of the over-voltage condition. The protection circuit may include a transmission gate and a PMOS transistor for producing a protection signal. The protection signal may be applied to a gate and/or a drain and/or a source and/or a well of the device such that a voltage across the device does not exceed the breakdown voltage. The protection signal may be derived from the over-voltage condition independent of whether a supply of power to the device is present.

Abstract: A compensation circuit and a method for compensating for process, voltage and temperature (PVT) variations in an integrated circuit (IC). The IC includes several functional modules, each of which includes a set of functional units, and generates an output signal in response to an input signal. The compensation circuit includes a code generator and a logic module. The code generator generates a digital code for each functional unit. The digital codes are based on phase differences between the input signal and the output signal. The logic module generates calibration codes based on the digital codes. The calibration codes compensate for the PVT variations in the corresponding functional units.

Abstract: A transmission line driver with slew rate control includes high and low side ramp generators for generating charge and discharge ramp signals, respectively, which are input to respective comparators and a pair of source follower transistors. A pair of additional transistors is connected to the pair of source follower transistors and a pair of staggered drivers is connected to the pair of additional transistors.

Abstract: A compensation circuit and a method that compensates for process, voltage and temperature (PVT) variations in an integrated circuit that includes functional modules. The compensation circuit includes a signal generator, a first code generator, a second code generator, and a mapping module. The signal generator generates a first signal and a second signal depending on aligned process corner, voltage and temperature variations and skewed process corner variations respectively. The first code generator receives the first signal, and generates a first calibration code. The second code generator receives the second signal, and generates a second calibration code. The mapping module provides the first and second calibration codes for compensating for the aligned process corner, voltage and temperature variations and the skewed process corner variations associated with the functional modules respectively.

Abstract: A compensation circuit and a method for detecting and compensating for process, voltage, and temperature (PVT) variations in an integrated circuit. The integrated circuit includes plural logic modules that include PMOS transistors and NMOS transistors. The compensation circuit includes first and second functional modules, which generate first and second calibration signals. The first and the second calibration signals are used to compensate for the PVT variations in PMOS and NMOS transistors.

Abstract: A compensation circuit and a method for compensating for process, voltage and temperature (PVT) variations in an integrated circuit (IC). The IC includes several functional modules, each of which includes a set of functional units, and generates an output signal in response to an input signal. The compensation circuit includes a code generator and a logic module. The code generator generates a digital code for each functional unit. The digital codes are based on phase differences between the input signal and the output signal. The logic module generates calibration codes based on the digital codes. The calibration codes compensate for the PVT variations in the corresponding functional units.

Abstract: A capacitor structure for an integrated circuit having at least first, second and third layers, with each layer having first and second conductors, includes multiple sidewall capacitors formed between sidewalls of the first conductor and the second conductor in each layer. Several inter-layer capacitors are formed between the first and second conductors in the first and second layers. Further, via capacitors are formed between sidewalls of adjacent vias corresponding to different conductors. The vias are formed between the second and third layers.

Abstract: A digital clock frequency doubler for increasing an input frequency of an input clock signal includes an input block, and a generator block. The input block receives the input clock signal, and generates a pulse signal having an ON period equal to the input clock signal period. The generator block is coupled to the input block. The generator block receives the pulse signal and divides a period of the pulse signal by a period of a high frequency digital signal and then generates an output clock signal with an output frequency that is about two times the input frequency.

Abstract: A digital clock frequency doubler for increasing an input frequency of an input clock signal includes an input block, and a generator block. The input block receives the input clock signal, and generates a pulse signal having an ON period equal to the input clock signal period. The generator block is coupled to the input block. The generator block receives the pulse signal and divides a period of the pulse signal by a period of a high frequency digital signal and then generates an output clock signal with an output frequency that is about two times the input frequency.

Abstract: A transmission line driver with slew rate control includes high and low side ramp generators for generating charge and discharge ramp signals, respectively, which are input to respective comparators and a pair of source follower transistors. A pair of additional transistors is connected to the pair of source follower transistors and a pair of staggered drivers is connected to the pair of additional transistors.

Abstract: A circuit for converting an input signal at a first voltage level to an output signal at a second voltage level uses only thin oxide transistors. The circuit includes a first unit operating at a first power supply voltage and receiving the input signal, a second unit operating at a second power supply voltage, and a third unit coupling the first unit to the second unit. The third unit enables generation of the output signal. Use of an extra fabrication mask for thick oxide transistors is avoided by using only thin oxide transistors.