Abstract: A semiconductor integrated circuit device is composed of logic gates each provided with at least two MOS transistors. The logic gates are connected to a first potential point and a second potential point. The semiconductor integrated circuit device includes a current control device connected between the logic gate and the first potential point and/or between the logic gate and the second potential point for controlling a value of a current flowing in the logic gate depending on an operating state of the logic gate. The circuit can be used in devices that cycle in operation between high and low power consumption modes, such as microprocessors that have both an operation mode and a low power back-up or sleep mode used for power reduction.

Abstract: A data processor in which a speed of an address translating operation is raised is disclosed. A translation lookaside buffer is divided into a buffer for data and a buffer for instruction, address translation information for instruction is also stored into a translation lookaside buffer for data, and when a translation miss occurs in a translation lookaside buffer for instruction, new address translation information is fetched from the translation lookaside buffer for data. A high speed of the address translating operation can be realized as compared with that in case of obtaining address translation information from an external address translation table each time a translation miss occurs in the translation lookaside buffer for instruction.

Abstract: A system for testing a semiconductor integrated circuit includes a plurality of programmable logic cells (LCL) having storage elements (MC1 through MC4) and each capable of outputting an arbitrary logic output corresponding to an input according to information stored in each storage element are spread over areas other than circuit blocks (CPU, ROM, etc.) on a semiconductor chip without space. Each in-chip circuit block is tested by use of the programmable logic cell.

Abstract: A signal from a crystal resonator or an external clock signal are input from terminals xta1 or exta1, and the signal from the crystal resonator or external clock signal are selected by mode terminal mod8 and input to an oscillator OSC. An input clock signal ckl1 is frequency-divided to desired values by a divider DIV1. A divided clock signal clk2 is input as the reference clock of a phase-locked loop PLL1 or delay-locked loop DLL1, and a clock signal output by a circuit selected by a selector SEL3 passes via a divider DIV2 to be distributed to an LSI. The phase-locked loop PLL1 has a clock settling time of at least 40 clock periods, whereas the clock settling time of the delay-locked loop DLL1 is 2-3 periods.

Abstract: A semiconductor integrated circuit device is composed of logic gates each provided with at least two MOS transistors. The logic gates are connected to a first potential point and a second potential point. The semiconductor integrated circuit device includes a current control device connected between the logic gate and the first potential point and/or between the logic gate and the second potential point for controlling a value of a current flowing in the logic gate depending on an operating state of the logic gate. The circuit can be used in devices that cycle in operation between high and low power consumption modes, such as microprocessors that have both an operation mode and a low power back-up or sleep mode used for power reduction.

Abstract: An FPU pipeline is synchronized with a CPU pipeline. Synchronization is achieved by having stalls and freezes in any one pipeline cause stalls and freezes in the other pipeline as well. Exceptions are kept precise even for long floating point operations. Precise exceptions are achieved by having a first execution stage of the FPU pipeline generate a busy signal, when a first floating point instruction enters a first execution stage of the FPU pipeline. When a second floating point instruction is decoded by the FPU pipeline before the first floating point instruction has finished executing in the first stage of the FPU pipeline, then both pipelines are stalled.

Abstract: An operational margin of a memory of a semiconductor integrated circuit device including an SRAM is improved. In order to set the Vth of driving MISFETs Qd, transfer MISFETs Qt and MISFETs for load resistance QL forming memory cells of an SRAM, relatively and intentionally higher than the Vth of predetermined MISFETS of SRAM peripheral circuits and logic circuits such as microprocessor, an impurity introduction step is introduced to set the Vth of the driving MISFETs Qd, transfer MISFETs Qt and MISFETs for load resistance, separately from an impurity introduction step for setting the Vth of the predetermined MISFETS.

Abstract: A logic test having less over-head for testing a logic circuit in a chip is implemented by constituting a test circuit in the chip without introducing a novel device process of FPGA. A memory of a self-configuration type is provided in the chip and a test circuit is constituted in the memory of a self-configuration type or an ordinary memory through a tester HDL, thereby testing other memories and logic circuits in the chip. The test circuit is reconstituted such that the memory used in the structure of the test circuit can be operated as an ordinary memory.

Abstract: An operational margin of a memory of a semiconductor integrated circuit device including an SRAM is improved. In order to set the Vth of driving MISFETs Qd, transfer MISFETs Qt and MISFETs for load resistance QL forming memory cells of an SRAM, relatively and intentionally higher than the Vth of predetermined MISFETs of SRAM peripheral circuits and logic circuits, such as a microprocessor, an impurity introduction step is introduced to set the Vth of the driving MISFETs Qd, transfer MISFETs Qt and MISFETs for load resistance, separately from an impurity introduction step for setting the Vth of the predetermined MISFETs.

Abstract: An FPU pipeline is synchronized with a CPU pipeline. Synchronization is achieved by having stalls and freezes in any one pipeline cause stalls and freezes in the other pipeline as well. Exceptions are kept precise even for long floating point operations. Precise exceptions are achieved by having a first execution stage of the FPU pipeline generate a busy signal, when a first floating point instruction enters a first execution stage of the FPU pipeline. When a second floating point instruction is decoded by the FPU pipeline before the first floating point instruction has finished executing in the first stage of the FPU pipeline, then both pipelines are stalled.

Abstract: A semiconductor integrated circuit device is composed of logic gates each provided with at least two MOS transistors. The logic gates are connected to a first potential point and a second potential point. The semiconductor integrated circuit device includes a current control device connected between the logic gate and the first potential point and/or between the logic gate and the second potential point for controlling a value of a current flowing in the logic gate depending on an operating state of the logic gate. The circuit can be used in devices that cycle in operation between high and low power consumption modes, such as microprocessors that have both an operation mode and a low power back-up or sleep mode used for power reduction.

Abstract: A semiconductor integrated circuit device is composed of logic gates each provided with at least two MOS transistors. The logic gates are connected to a first potential point and a second potential point. The semiconductor integrated circuit device includes a current control device connected between the logic gate and the first potential point and/or between the logic gate and the second potential point for controlling a value of a current flowing in the logic gate depending on an operating state of the logic gate. The circuit can be used in devices that cycle in operation between high and low power consumption modes, such as microprocessors that have both an operation mode and a low power back-up or sleep mode used for power reduction.

Abstract: A semiconductor integrated circuit device is composed of logic gates each provided with at least two MOS transistors. The logic gates are connected to a first potential point and a second potential point. The semiconductor integrated circuit device includes a current control device connected between the logic gate and the first potential point and/or between the logic gate and the second potential point for controlling a value of a current flowing in the logic gate depending on an operating state of the logic gate. The circuit can be used in devices that cycle in operation between high and low power consumption modes, such as microprocessors that have both an operation mode and a low power back-up or sleep mode used for power reduction.

Abstract: A main storage apparatus is a synchronous dynamic memory having a plurality of memory banks and a mode register for determining an operation mode, a main storage controller is coupled to a processor and the main storage apparatus, and means to realize controlling of parallel access to a plurality of banks of the memory and controlling of setting of an operation mode to the built-in register is arranged in the main storage controller. Accordingly, the use of a conventional processor of high generality and a conventional memory can be ensured.

Abstract: A main storage apparatus is a synchronous dynamic memory having a plurality of memory banks and a mode register for determining an operation mode, a main storage controller is coupled to a processor and the main storage apparatus, and means to realize controlling of parallel access to a plurality of banks of the memory and controlling of setting of an operation mode to the built-in register is arranged in the main storage controller. Accordingly, the use of a conventional processor of high generality and a conventional memory can be ensured.

Abstract: A conventional system for testing a semiconductor integrated circuit has a problem in that the time required to test it is long, the cost required for its test increases, and yields are reduced due to the occurrence of a failure in a test circuit itself.

Abstract: A data processor for executing instructions using operand data stored in a main memory includes an instruction control unit having a first associative memory storing instructions read out from the main memory. The data processor also includes an instruction controller reading out an instruction from the first associative memory when the instruction is present in the first associative memory and reading an instruction from the main memory when the instruction is not present in the first associative memory. The controller also has as an output instruction to be executed. An instruction execution unit has a second associative memory storing operand data read out from the main memory. An instruction executor executes the instruction by using operand data read out from the second associative memory when the operand data is present in the second associative memory and from the main memory when the operand data is not present in the second associative memory.

Abstract: A logic test having less over-head for testing a logic circuit in a chip is implemented by constituting a test circuit in the chip without introducing a novel device process of FPGA. A memory of a self-configuration type is provided in the chip and a test circuit is constituted in the memory of a self-configuration type or an ordinary memory through a tester HDL, thereby testing other memories and logic circuits in the chip. The test circuit is reconstituted such that the memory used in the structure of the test circuit can be operated as an ordinary memory.

Abstract: A logic test having less over-head for testing a logic circuit in a chip is implemented by constituting a test circuit in the chip without introducing a novel device process of FPGA. A memory of a self-configuration type is provided in the chip and a test circuit is constituted in the memory of a self-configuration type or an ordinary memory through a tester HDL, thereby testing other memories and logic circuits in the chip. The test circuit is reconstituted such that the memory used in the structure of the test circuit can be operated as an ordinary memory.

Abstract: A semiconductor integrated circuit device is composed of logic gates each provided with at least two MOS transistors. The logic gates are connected to a first potential point and a second potential point. The semiconductor integrated circuit device includes a current control device connected between the logic gate and the first potential point and/or between the logic gate and the second potential point for controlling a value of a current flowing in the logic gate depending on an operating state of the logic gate. The circuit can be used in devices that cycle in operation between high and low power consumption modes, such as microprocessors that have both an operation mode and a low power back-up or sleep mode used for power reduction.