Patents by Inventor Kyoji Shibuya

Kyoji Shibuya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220244176
    Abstract: A sample analyzing apparatus analyzes a component to be measured securely while reducing a frequency of maintenance of the sample analyzing apparatus. The sample analyzing apparatus includes a heating furnace that heats a sample held by a sample holding body and a gas analysis section that analyzes a component to be measured contained in a gas generated by heating the sample, and the gas analysis section includes a laser light source that irradiates the gas with a laser light, and a photodetector that detects an intensity of a sample light as being the laser light that has transmitted through the gas.
    Type: Application
    Filed: May 12, 2020
    Publication date: August 4, 2022
    Inventors: Takahito INOUE, Hiroshi UCHIHARA, Kyoji SHIBUYA
  • Publication number: 20220236180
    Abstract: In an analysis device that irradiates light from three or more light sources onto a cell, embodiments proposed herein prevent a reduction in the intensity of light from each light source, and are provided with at least a first light source, a second light source, and a third light source, and an optical system that guides light from the respective light sources onto a cell. The optical system is provided with a second light source optical element that reflects the light from the first light source and transmits the light from the second light source, and a third light source optical element that reflects the light from the first light source that has been reflected by the second light source optical element and the light from the second light source that has been transmitted through the second light source optical element, and transmits the light from the third light source.
    Type: Application
    Filed: June 26, 2020
    Publication date: July 28, 2022
    Applicant: HORIBA, LTD.
    Inventors: Kyoji SHIBUYA, Shota HAMAUCHI, Hiroki NISHIGAI
  • Patent number: 11374380
    Abstract: Provided is a semiconductor laser including: a core layer having an active layer and a diffraction grating layer optically coupled to the active layer; and paired clad layers arranged sandwiching the core layer, and formed with a waveguide along the core layer, and the semiconductor laser includes: a flat layer provided continuously with the diffraction grating layer along the waveguide; and a temperature control mechanism for controlling the temperature of the flat layer to a temperature different from that of the diffraction grating layer.
    Type: Grant
    Filed: September 14, 2018
    Date of Patent: June 28, 2022
    Assignee: HORIBA, Ltd.
    Inventors: Tomoji Terakado, Makoto Matsuhama, Kyoji Shibuya
  • Patent number: 11030423
    Abstract: The present invention enables an analysis device that utilizes light absorption to measure concentrations of target components by means of a simple calculation, and without any complex spectrum calculation processing being required, and analyzes target components that are contained in a sample, and is provided with a light source that emits modulated light whose wavelength is modulated relative to a central wavelength using a predetermined modulation frequency, a photodetector that detects an intensity of sample light obtained when the modulated light is transmitted through the sample, a correlation value calculation unit that calculates correlation values between intensity-related signals that are related to the intensity of the sample light, and predetermined feature signals, and a concentration calculation unit that calculates concentrations of the target components using the correlation values obtained by the correlation value calculation unit.
    Type: Grant
    Filed: December 22, 2019
    Date of Patent: June 8, 2021
    Assignee: HORIBA, LTD.
    Inventor: Kyoji Shibuya
  • Patent number: 10935489
    Abstract: The present invention relates to an analysis apparatus adapted to analyze a measurement target component contained in a sample by irradiating a measurement cell into which the sample is introduced with pulse-oscillated light, whereby suppressing reduction in wavelength resolution without shortening the pulse width. The analysis apparatus includes multiple light sources adapted to produce pulse oscillations, a light detector adapted to detect light emitted from the light source and transmitted through the measurement cell, and a signal separation part adapted to separate, from a light intensity signal obtained by the light detector, signals corresponding to a part of pulses from the light sources.
    Type: Grant
    Filed: October 3, 2018
    Date of Patent: March 2, 2021
    Assignee: HORIBA, LTD.
    Inventors: Kyoji Shibuya, Kensuke Fukushiro, Toshio Ohta, Katsumi Nishimura
  • Publication number: 20210006037
    Abstract: Provided is a semiconductor laser including: a core layer having an active layer and a diffraction grating layer optically coupled to the active layer; and paired clad layers arranged sandwiching the core layer, and formed with a waveguide along the core layer, and the semiconductor laser includes: a flat layer provided continuously with the diffraction grating layer along the waveguide; and a temperature control mechanism for controlling the temperature of the flat layer to a temperature different from that of the diffraction grating layer.
    Type: Application
    Filed: September 14, 2018
    Publication date: January 7, 2021
    Inventors: Tomoji Terakado, Makoto Matsuhama, Kyoji Shibuya
  • Patent number: 10788415
    Abstract: The present claimed invention makes it possible to simplify a structure of a multiple-reflection cell and to measure both a measuring objective component having a high concentration and a measuring objective component having a low concentration. The analysis device of this invention is to irradiate a light to a multiple-reflection cell into which a sample is introduced, to detect the light exiting from the multiple-reflection cell and to analyze a measuring objective component contained in the sample, and comprises a first light irradiation part that allows a first light to enter the multiple-reflection cell and a second light irradiation part that allows a second light to enter the multiple-reflection cell. The multiple-reflection cell has a pair of reflecting mirrors that reflect the first light and the second light.
    Type: Grant
    Filed: October 11, 2018
    Date of Patent: September 29, 2020
    Assignee: HORIBA. LTD.
    Inventor: Kyoji Shibuya
  • Publication number: 20200295535
    Abstract: The present invention is intended to reduce variations in oscillation wavenumber of a semiconductor laser element due to the influence of circumferential temperatures. The invention includes a semiconductor laser semiconductor laser element, a temperature control part to control a temperature of the semiconductor laser element, a temperature sensor to detect a temperature of the temperature control part, and a temperature control device to control a supply signal to the temperature control part so that a detected temperature obtained from the temperature sensor reaches a predetermined target temperature. The temperature control device changes a target temperature for the temperature control part depending on a supply signal to the temperature control part.
    Type: Application
    Filed: September 20, 2018
    Publication date: September 17, 2020
    Inventors: Yusuke Awane, Katsumi Nishimura, Kyoji Shibuya
  • Publication number: 20200210651
    Abstract: The present invention enables an analysis device that utilizes light absorption to measure concentrations of target components by means of a simple calculation, and without any complex spectrum calculation processing being required, and analyzes target components that are contained in a sample, and is provided with a light source that emits modulated light whose wavelength is modulated relative to a central wavelength using a predetermined modulation frequency, a photodetector that detects an intensity of sample light obtained when the modulated light is transmitted through the sample, a correlation value calculation unit that calculates correlation values between intensity-related signals that are related to the intensity of the sample light, and predetermined feature signals, and a concentration calculation unit that calculates concentrations of the target components using the correlation values obtained by the correlation value calculation unit.
    Type: Application
    Filed: December 22, 2019
    Publication date: July 2, 2020
    Applicant: HORIBA, LTD.
    Inventor: Kyoji SHIBUYA
  • Patent number: 10605726
    Abstract: The present invention is adapted to include: a light source adapted to emit reference light that is light whose wavelength is modulated at a predetermined modulation frequency; a light detector adapted to detect the intensity of measurement target light that is light after the reference light has transmitted through the measurement target component, and the intensity of the reference light; a first calculation part adapted to calculate an intensity ratio logarithm that is the logarithm of the ratio between the intensity of the measurement target light and the intensity of the reference light; a frequency component extraction part adapted to lock-in detect the intensity ratio logarithm with a reference signal having a frequency n times the modulation frequency; and a second calculation part adapted to, on the basis of the result of the detection by the frequency component extraction part, calculate the concentration or absorbance of the measurement target component.
    Type: Grant
    Filed: November 30, 2017
    Date of Patent: March 31, 2020
    Assignee: HORIBA, LTD.
    Inventors: Kyoji Shibuya, Kensuke Fukushiro, Toshio Ohta, Katsumi Nishimura
  • Patent number: 10551299
    Abstract: To provide a multipass cell permitting a reduction in a volume of an inner space into which sample gas is introduced, there are provided: a cell main body with the inner space into which the sample gas is introduced; and a pair of mirrors provided oppositely to each other in the inner space, wherein light incident from an incidence window of the cell main body is subjected to multireflection between the pair of mirrors and is emitted from an emission window of the cell main body, wherein: each of the mirrors is shaped such that light spots formed on a reflecting surface of each of the mirrors are scattered in an elongated region of a predetermined width through the light multireflection; and each of the mirrors is formed into an elongated shape along a longitudinal direction of the elongated region.
    Type: Grant
    Filed: October 3, 2018
    Date of Patent: February 4, 2020
    Assignee: HORIBA, LTD.
    Inventors: Kyoji Shibuya, Masahiro Nakane
  • Publication number: 20190113442
    Abstract: The present claimed invention makes it possible to simplify a structure of a multiple-reflection cell and to measure both a measuring objective component having a high concentration and a measuring objective component having a low concentration. The analysis device of this invention is to irradiate a light to a multiple-reflection cell into which a sample is introduced, to detect the light exiting from the multiple-reflection cell and to analyze a measuring objective component contained in the sample, and comprises a first light irradiation part that allows a first light to enter the multiple-reflection cell and a second light irradiation part that allows a second light to enter the multiple-reflection cell. The multiple-reflection cell has a pair of reflecting mirrors that reflect the first light and the second light.
    Type: Application
    Filed: October 11, 2018
    Publication date: April 18, 2019
    Applicant: HORIBA, Ltd.
    Inventor: Kyoji SHIBUYA
  • Publication number: 20190101487
    Abstract: To provide a multipass cell permitting a reduction in a volume of an inner space into which sample gas is introduced, there are provided: a cell main body with the inner space into which the sample gas is introduced; and a pair of mirrors provided oppositely to each other in the inner space, wherein light incident from an incidence window of the cell main body is subjected to multireflection between the pair of mirrors and is emitted from an emission window of the cell main body, wherein: each of the mirrors is shaped such that light spots formed on a reflecting surface of each of the mirrors are scattered in an elongated region of a predetermined width through the light multireflection; and each of the mirrors is formed into an elongated shape along a longitudinal direction of the elongated region.
    Type: Application
    Filed: October 3, 2018
    Publication date: April 4, 2019
    Applicant: HORIBA, Ltd.
    Inventors: Kyoji SHIBUYA, Masahiro NAKANE
  • Publication number: 20190101491
    Abstract: The present invention relates to an analysis apparatus adapted to analyze a measurement target component contained in a sample by irradiating a measurement cell into which the sample is introduced with pulse-oscillated light, whereby suppressing reduction in wavelength resolution without shortening the pulse width. The analysis apparatus includes multiple light sources adapted to produce pulse oscillations, a light detector adapted to detect light emitted from the light source and transmitted through the measurement cell, and a signal separation part adapted to separate, from a light intensity signal obtained by the light detector, signals corresponding to a part of pulses from the light sources.
    Type: Application
    Filed: October 3, 2018
    Publication date: April 4, 2019
    Applicant: HORIBA, Ltd.
    Inventors: Kyoji SHIBUYA, Kensuke FUKUSHIRO, Toshio OHTA, Katsumi NISHIMURA
  • Publication number: 20180172581
    Abstract: The present invention is adapted to include: a light source adapted to emit reference light that is light whose wavelength is modulated at a predetermined modulation frequency; a light detector adapted to detect the intensity of measurement target light that is light after the reference light has transmitted through the measurement target component, and the intensity of the reference light; a first calculation part adapted to calculate an intensity ratio logarithm that is the logarithm of the ratio between the intensity of the measurement target light and the intensity of the reference light; a frequency component extraction part adapted to lock-in detect the intensity ratio logarithm with a reference signal having a frequency n times the modulation frequency; and a second calculation part adapted to, on the basis of the result of the detection by the frequency component extraction part, calculate the concentration or absorbance of the measurement target component.
    Type: Application
    Filed: November 30, 2017
    Publication date: June 21, 2018
    Applicant: HORIBA, Ltd.
    Inventors: Kyoji SHIBUYA, Kensuke FUKUSHIRO, Toshio OHTA, Katsumi NISHIMURA
  • Publication number: 20110048108
    Abstract: The present invention is intended to provide a gas sensor that can detect low concentration NO2 at a few ppb level with high sensitivity, and adapted to at least include: a silver catalyst member that is provided with a flow path through which a sample gas can pass, wherein at least on a surface of the flow path, silver is exposed; a first semiconductor gas sensor element that is provided with a gas sensitive film including n-type oxide semiconductor; and a main flow path that communicatively connects between the silver catalyst member and the first semiconductor gas sensor element, to let the sample gas flow from the silver catalyst member toward the first semiconductor gas sensor element.
    Type: Application
    Filed: September 1, 2010
    Publication date: March 3, 2011
    Inventors: Yutaka Yamagishi, Kyoji Shibuya