Patents by Inventor Kyung-seok Jin

Kyung-seok Jin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Object Re-Identification Apparatus and Method Thereof
    Publication number: 20240071071
    Abstract: In an embodiment an apparatus includes a processor configured to generate a feature extraction module using a dataset in which an attribute for each object is defined, receive an image obtained by a camera, extract an attribute of an object of interest from the image using the learned feature extraction module, identify an object re-identification candidate group based on the extracted attribute of the object of interest and re-identify the object of interest based on the identified object re-identification candidate group.
    Type: Application
    Filed: April 13, 2023
    Publication date: February 29, 2024
    Inventors: Hyeon Seok Jung, Kyung Hwan Cho, Moon Sub Jin, Kyu Sang Choi, Bum Sub Ham, Chan Ho Eom, Geon Lee
  • Magnetic sensor test apparatus and method of testing a magnetic sensor
    Patent number: 9671484
    Abstract: Provided are a magnetic sensor test apparatus and a magnetic sensor test method. The magnetic sensor test apparatus includes a vertical coil and at least one periphery coil disposed peripherally about the vertical coil. Both the vertical coil and the periphery coil may be configured to generate a horizontal and/or a vertical magnetic field in a semiconductor wafer.
    Type: Grant
    Filed: May 27, 2014
    Date of Patent: June 6, 2017
    Assignee: HAECHITECH CORPORATION
    Inventors: Ki-bog Youm, Young-bae Choi, Young-sug Seong, Kyung-seok Jin
  • MAGNETIC SENSOR TEST APPARATUS AND METHOD
    Publication number: 20150042318
    Abstract: Provided are a magnetic sensor test apparatus and a magnetic sensor test method. The magnetic sensor test apparatus includes a vertical coil configured to generate a magnetic field and at least one periphery coil. The magnetic sensor test apparatus and method may test a magnetic sensor on a semiconductor wafer.
    Type: Application
    Filed: May 27, 2014
    Publication date: February 12, 2015
    Applicant: MagnaChip Semiconductor, Ltd.
    Inventors: Ki-bog Youm, Young-bae Choi, Young-sug Seong, Kyung-seok Jin