Patents by Inventor Legardo Tardeo Reyes

Legardo Tardeo Reyes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6448805
    Abstract: A method and device for wafer level testing of semiconductor lasers allows probing from one side while detecting light output from the opposite side. A chuck with a transparent substrate receives the optical aperture side of a wafer of semiconductor lasers. The wafer is probed form the side opposite the side contacting the chuck and emitted light is detected on a side of the chuck opposite the side contacting the wafer.
    Type: Grant
    Filed: February 12, 2001
    Date of Patent: September 10, 2002
    Assignee: Novalux, Inc.
    Inventors: David Leslie Heald, Legardo Tardeo Reyes
  • Publication number: 20020109520
    Abstract: A method and device for wafer level testing of semiconductor lasers allows probing from one side while detecting light output from the opposite side. A chuck with a transparent substrate receives the optical aperture side of a wafer of semiconductor lasers. The wafer is probed form the side opposite the side contacting the chuck and emitted light is detected on a side of the chuck opposite the side contacting the wafer.
    Type: Application
    Filed: February 12, 2001
    Publication date: August 15, 2002
    Inventors: David Leslie Heald, Legardo Tardeo Reyes