Patents by Inventor Leslie Barber

Leslie Barber has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9492750
    Abstract: An apparatus and method for electronically creating combined digital images of a person and incorporating them into a series of site-specific background images or film clips making it appear as if the user were actually a part of the original imaging sequence. As to housing, camera, processor, output devices, control boards, cables, currency machine; see Pat. No. 6,507, 361. In one embodiment the camera can move to take the images from different angles and in an alternative embodiment there are multiple cameras situated such that they sequentially capture and store a series of images to be incorporated into the product.
    Type: Grant
    Filed: July 31, 2006
    Date of Patent: November 15, 2016
    Inventor: Pamela Leslie Barber
  • Publication number: 20090042654
    Abstract: An apparatus and method for electronically creating combined digital images of a person and incorporating them into a series of site-specific background images or film clips making it appear as if the user were actually a part of the original imaging sequence. As to housing, camera, processor, output devices, control boards, cables, currency machine; see Pat. No. 6,507,361. In one embodiment the camera can move to take the images from different angles and in an alternative embodiment there are multiple cameras situated such that they sequentially capture and store a series of images to be incorporated into the product.
    Type: Application
    Filed: July 31, 2006
    Publication date: February 12, 2009
    Inventor: Pamela Leslie Barber
  • Publication number: 20080063984
    Abstract: Process solutions comprising one or more surfactants are used to reduce the number of defects in the manufacture of semiconductor devices. In certain embodiments, the process solution may reduce post-development defects such as pattern collapse or line width roughness when employed as a rinse solution either during or after the development of the patterned photoresist layer. Also disclosed is a method for reducing the number of defects such as pattern collapse and/or line width roughness on a plurality of photoresist coated substrates employing the process solution of the present invention.
    Type: Application
    Filed: November 15, 2007
    Publication date: March 13, 2008
    Applicant: AIR PRODUCTS AND CHEMICALS, INC.
    Inventors: Peng Zhang, Danielle Curzi, Eugene Karwacki, Leslie Barber
  • Publication number: 20070229795
    Abstract: Suitable additives that may be added into immersion fluids, immersion fluids comprising at least one carrier medium selected from an aqueous fluid, a non-aqueous fluid, and mixtures thereof, and immersions fluids comprising at least one carrier medium and at least one additive useful for performing immersion lithography at an operating wavelength ranging from 140 nm to 365 nm are disclosed herein.
    Type: Application
    Filed: May 29, 2007
    Publication date: October 4, 2007
    Applicant: AIR PRODUCTS AND CHEMICALS, INC.
    Inventors: Peng Zhang, Bridgette Budhlall, Gene Parris, Leslie Barber
  • Publication number: 20070010409
    Abstract: Process solutions comprising one or more surfactants are used to reduce the number of pattern collapse defects on a plurality of photoresist coated substrates during the manufacture of semiconductor devices.
    Type: Application
    Filed: September 14, 2006
    Publication date: January 11, 2007
    Inventors: Peng Zhang, Danielle Curzi, Eugene Karwacki, Leslie Barber
  • Publication number: 20070010412
    Abstract: Process solutions comprising one or more surfactants are used to reduce the number of defects in the manufacture of semiconductor devices. In certain preferred embodiments, the process solution of the present invention may reduce post-development defects such as pattern collapse when employed as a rinse solution either during or after the development of the patterned photoresist layer. Also disclosed is a method for reducing the number of pattern collapse defects on a plurality of photoresist coated substrates employing the process solution of the present invention.
    Type: Application
    Filed: September 14, 2006
    Publication date: January 11, 2007
    Inventors: Peng Zhang, Danielle Curzi, Eugene Karwacki, Leslie Barber
  • Publication number: 20050173682
    Abstract: Suitable additives that may be added into immersion fluids, immersion fluids comprising at least one carrier medium selected from an aqueous fluid, a non-aqueous fluid, and mixtures thereof, and immersions fluids comprising at least one carrier medium and at least one additive useful for performing immersion lithography at an operating wavelength ranging from 140 nm to 365 nm are disclosed herein.
    Type: Application
    Filed: January 7, 2005
    Publication date: August 11, 2005
    Inventors: Peng Zhang, Bridgette Budhlall, Gene Parris, Leslie Barber
  • Publication number: 20050176605
    Abstract: Disclosed herein are process solutions, which may be aqueous-based, non-aqueous-based, and combinations thereof, that contain at least one alkoxylated acetylenic diol surfactant. In one aspect, the process solution comprises water and an alkoxylated acetylenic diol surfactant having the formula A: where r and t are 1 or 2, (n+m) is 1 to 30 and (p+q) is 1 to 30.
    Type: Application
    Filed: February 1, 2005
    Publication date: August 11, 2005
    Inventors: Kevin Lassila, Paula Uhrin, Peng Zhang, Danielle King Curzi, Eugene Karwacki, Leslie Barber, Brenda Ross
  • Publication number: 20050161644
    Abstract: Suitable additives that may be added into immersion fluids, immersion fluids comprising at least one carrier medium selected from an aqueous fluid, a non-aqueous fluid, and mixtures thereof, and immersions fluids comprising at least one carrier medium and at least one additive useful for performing immersion lithography at an operating wavelength ranging from 140 nm to 248 nm are disclosed herein.
    Type: Application
    Filed: January 23, 2004
    Publication date: July 28, 2005
    Inventors: Peng Zhang, Bridgette Budhlall, Gene Parris, Leslie Barber