Patents by Inventor Liang-Teck Pang

Liang-Teck Pang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9800232
    Abstract: A method for providing a stitchable clock mesh, a dual operation mode system, and a method for providing a master clock stratum are, in turn, provided for a 3D chip stack having two or more strata. The method for providing a stitchable clock mesh includes providing, by at least one clock mesh disposed on each stratum and having multiple sectors, a global clock signal to various chip locations. The method further includes collecting, by mesh data sensors on each stratum, mesh data for the at least one mesh. The mesh data includes measured functional data and measured performance data for a current system configuration. The method also includes selectively performing, by joining circuitry, a segmentation operation or a joining operation on the least one mesh or one or more portions thereof responsive to the mesh data and the current system configuration selectable from a plurality of system target configurations.
    Type: Grant
    Filed: March 30, 2016
    Date of Patent: October 24, 2017
  • Patent number: 9612612
    Abstract: A wide bandwidth resonant clock distribution comprises a clock grid configured to distribute a clock signal to a plurality of components of an integrated circuit and a tunable sector buffer configured to receive the clock signal and provide an output to the clock grid. The tunable sector buffer is configured to set latency and slew rate of the clock signal based on an identified resonant or non-resonant mode.
    Type: Grant
    Filed: May 7, 2015
    Date of Patent: April 4, 2017
    Assignee: International Business Machines Corporation
    Inventors: Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Jason D. Hibbeler, Yong I. Kim, Liang-Teck Pang, William R. Reohr, Phillip J. Restle, Michael G. R. Thomson
  • Publication number: 20160211833
    Abstract: A method for providing a stitchable clock mesh, a dual operation mode system, and a method for providing a master clock stratum are, in turn, provided for a 3D chip stack having two or more strata. The method for providing a stitchable clock mesh includes providing, by at least one clock mesh disposed on each stratum and having multiple sectors, a global clock signal to various chip locations. The method further includes collecting, by mesh data sensors on each stratum, mesh data for the at least one mesh. The mesh data includes measured functional data and measured performance data for a current system configuration. The method also includes selectively performing, by joining circuitry, a segmentation operation or a joining operation on the least one mesh or one or more portions thereof responsive to the mesh data and the current system configuration selectable from a plurality of system target configurations.
    Type: Application
    Filed: March 30, 2016
    Publication date: July 21, 2016
  • Patent number: 9348357
    Abstract: A stitchable clock mesh, a dual operation mode method, and a master clock stratum are provided for a 3D chip stack. The stitchable clock mesh includes at least one clock mesh, on each of the two or more strata, having a plurality of sectors for providing a global clock signal. The stitchable clock mesh further includes mesh data sensors, on each of the two or more strata, for collecting mesh data for the at least one mesh. The mesh data includes measured functional data and measured performance data for a current system configuration. The stitchable clock mesh further includes mesh segmentation and joining circuitry for selectively performing a segmentation operation or a joining operation on the least one mesh or one or more portions thereof responsive to the mesh data and the current system configuration selectable from a plurality of system target configurations.
    Type: Grant
    Filed: June 30, 2014
    Date of Patent: May 24, 2016
  • Patent number: 9231603
    Abstract: There is provided a clock distribution network for synchronizing global clock signals within a 3D chip stack having two or more strata. The clock distribution circuit includes, on each of the two or more strata, phase detectors, a logic circuit, and a phase de-skewing element. Each phase detector has a respective output for providing phase information relating to a phase difference between two of the global clocks signals on respective different ones of the two or more strata. The logic circuit is connected to the respective outputs of the phase detectors for determining a phase adjustment plan for a given one of the two or more strata upon which the logic circuit is located responsive to the phase information. The phase de-skewing element is for adjusting a clock skew of a same stratum located one of the two of the global clock signals responsive to the phase adjustment plan.
    Type: Grant
    Filed: March 31, 2014
    Date of Patent: January 5, 2016
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Yong Liu, Liang-Teck Pang, Phillip J. Restle
  • Publication number: 20150378388
    Abstract: A stitchable clock mesh, a dual operation mode method, and a master clock stratum are provided for a 3D chip stack. The stitchable clock mesh includes at least one clock mesh, on each of the two or more strata, having a plurality of sectors for providing a global clock signal. The stitchable clock mesh further includes mesh data sensors, on each of the two or more strata, for collecting mesh data for the at least one mesh. The mesh data includes measured functional data and measured performance data for a current system configuration. The stitchable clock mesh further includes mesh segmentation and joining circuitry for selectively performing a segmentation operation or a joining operation on the least one mesh or one or more portions thereof responsive to the mesh data and the current system configuration selectable from a plurality of system target configurations.
    Type: Application
    Filed: June 30, 2014
    Publication date: December 31, 2015
  • Publication number: 20150280722
    Abstract: There is provided a clock distribution network for synchronizing global clock signals within a 3D chip stack having two or more strata. The clock distribution circuit includes, on each of the two or more strata, phase detectors, a logic circuit, and a phase de-skewing element. Each phase detector has a respective output for providing phase information relating to a phase difference between two of the global clocks signals on respective different ones of the two or more strata. The logic circuit is connected to the respective outputs of the phase detectors for determining a phase adjustment plan for a given one of the two or more strata upon which the logic circuit is located responsive to the phase information. The phase de-skewing element is for adjusting a clock skew of a same stratum located one of the two of the global clock signals responsive to the phase adjustment plan.
    Type: Application
    Filed: March 31, 2014
    Publication date: October 1, 2015
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Yong Liu, Liang-Teck Pang, Phillip J. Restle
  • Publication number: 20150234422
    Abstract: A wide bandwidth resonant clock distribution comprises a clock grid configured to distribute a clock signal to a plurality of components of an integrated circuit and a tunable sector buffer configured to receive the clock signal and provide an output to the clock grid. The tunable sector buffer is configured to set latency and slew rate of the clock signal based on an identified resonant or non-resonant mode.
    Type: Application
    Filed: May 7, 2015
    Publication date: August 20, 2015
    Inventors: Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Jason D. Hibbeler, Yong I. Kim, Liang-Teck Pang, William R. Reohr, Phillip J. Restle, Michael G.R. Thomson
  • Publication number: 20150179536
    Abstract: A physical test integrated circuit has a plurality of repeating circuit portions corresponding to an integrated circuit design. A first of the portions is fabricated with a nominal block mask location, and additional ones of the portions are deliberately fabricated with predetermined progressive increased offset of the block mask location from the nominal block mask location. For each of the portions, the difference in threshold voltage between a first field effect transistor and a second field effect transistor is determined. The predetermined progressive increased offset of the block mask location is in a direction from the first field effect transistor to the second field effect transistor. The block mask overlay tolerance is determined at a value of the progressive increased offset corresponding to an inflection of the difference in threshold voltage from a zero difference. A method for on-chip monitoring, and corresponding circuits, are also disclosed.
    Type: Application
    Filed: February 28, 2015
    Publication date: June 25, 2015
    Inventors: Emrah Acar, Aditya Bansal, Dureseti Chidambarrao, Liang-Teck Pang, Amith Singhee
  • Patent number: 9058130
    Abstract: A wide bandwidth resonant clock distribution comprises a clock grid configured to distribute a clock signal to a plurality of components of an integrated circuit and a tunable sector buffer configured to receive the clock signal and provide an output to the clock grid. The tunable sector buffer is configured to set latency and slew rate of the clock signal based on an identified resonant or non-resonant mode.
    Type: Grant
    Filed: February 5, 2013
    Date of Patent: June 16, 2015
    Assignee: International Business Machines Corporation
    Inventors: Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Jason D. Hibbeler, Yong I. Kim, Liang-Teck Pang, William R. Reohr, Phillip J. Restle, Michael G. R. Thomson
  • Patent number: 9054682
    Abstract: A wide bandwidth resonant clock distribution comprises a clock grid configured to distribute a clock signal to a plurality of components of an integrated circuit, a tunable sector buffer configured to receive the clock signal and provide an output to the clock grid, at least one inductor, at least one tunable resistance switch, and a capacitor network. The tunable sector buffer is programmable to set latency and slew rate of the clock signal. The inductor, tunable resistance switch, and capacitor network are connected between the clock grid and a reference voltage. The at least one tunable resistance switch is programmable to dynamically switch the at least one inductor in or out of the clock distribution to effect at least one resonant mode of operation or a non-resonant mode of operation based on a frequency of the clock signal.
    Type: Grant
    Filed: February 5, 2013
    Date of Patent: June 9, 2015
    Assignee: International Business Machines Corporation
    Inventors: Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Jason D. Hibbeler, Yong I. Kim, Liang-Teck Pang, William R. Reohr, Phillip J. Restle, Michael G. R. Thomson
  • Patent number: 8969104
    Abstract: A physical test integrated circuit has a plurality of repeating circuit portions corresponding to an integrated circuit design. A first of the portions is fabricated with a nominal block mask location, and additional ones of the portions are deliberately fabricated with predetermined progressive increased offset of the block mask location from the nominal block mask location. For each of the portions, the difference in threshold voltage between a first field effect transistor and a second field effect transistor is determined. The predetermined progressive increased offset of the block mask location is in a direction from the first field effect transistor to the second field effect transistor. The block mask overlay tolerance is determined at a value of the progressive increased offset corresponding to an inflection of the difference in threshold voltage from a zero difference. A method for on-chip monitoring, and corresponding circuits, are also disclosed.
    Type: Grant
    Filed: June 5, 2012
    Date of Patent: March 3, 2015
    Assignee: International Business Machines Corporation
    Inventors: Emrah Acar, Aditya Bansal, Dureseti Chidambarrao, Liang-Teck Pang, Amith Singhee
  • Patent number: 8928350
    Abstract: There is provided a strata manager within a 3D chip stack having two or more strata. The strata manager includes a plurality of scannable configuration registers, each being arranged on a respective one of the two or more strata for storing a set of bits. The set of bits is configured to program an operation of a corresponding one of the two or more strata on which the set of bits is stored or a device thereon. Additionally, a stratum identifier within a 3D stack and stack-wide scan circuit within a 3D stack are provided.
    Type: Grant
    Filed: September 7, 2012
    Date of Patent: January 6, 2015
    Assignee: International Business Machines Corporation
    Inventors: Liang-Teck Pang, Joel A. Silberman, Matthew R. Wordeman
  • Patent number: 8860425
    Abstract: A test circuit for detecting a leakage defect in a circuit under test includes a test stimulus circuit operative to drive an otherwise defect-free, characteristically capacitive node in the circuit under test to a prescribed voltage level, and an observation circuit having at least one threshold and adapted for connection with at least one node in the circuit under test. The observation circuit is operative to detect a voltage level of the node in the circuit under test and to generate an output signal indicative of whether the voltage level of the node is less than the threshold. The voltage level of the node being less than the threshold is indicative of a first type of leakage defect, and the voltage level of the node being greater than the threshold is indicative of a second type of leakage defect.
    Type: Grant
    Filed: March 2, 2012
    Date of Patent: October 14, 2014
    Assignee: International Business Machines Corporation
    Inventors: Liang-Teck Pang, William Robert Reohr, Phillip John Restle
  • Publication number: 20140223210
    Abstract: A wide bandwidth resonant clock distribution comprises a clock grid configured to distribute a clock signal to a plurality of components of an integrated circuit and a tunable sector buffer configured to receive the clock signal and provide an output to the clock grid. The tunable sector buffer is configured to set latency and slew rate of the clock signal based on an identified resonant or non-resonant mode.
    Type: Application
    Filed: February 5, 2013
    Publication date: August 7, 2014
    Applicant: International Business Machines Corporation
    Inventors: Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Jason D. Hibbeler, Yong I. Kim, Liang-Teck Pang, William R. Reohr, Phillip J. Restle, Michael G.R. Thomson
  • Publication number: 20140218087
    Abstract: A wide bandwidth resonant clock distribution comprises a clock grid configured to distribute a clock signal to a plurality of components of an integrated circuit, a tunable sector buffer configured to receive the clock signal and provide an output to the clock grid, at least one inductor, at least one tunable resistance switch, and a capacitor network. The tunable sector buffer is programmable to set latency and slew rate of the clock signal. The inductor, tunable resistance switch, and capacitor network are connected between the clock grid and a reference voltage. The at least one tunable resistance switch is programmable to dynamically switch the at least one inductor in or out of the clock distribution to effect at least one resonant mode of operation or a non-resonant mode of operation based on a frequency of the clock signal.
    Type: Application
    Filed: February 5, 2013
    Publication date: August 7, 2014
    Applicant: International Business Machines Corporation
    Inventors: Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Jason D. Hibbeler, Yong I. Kim, Liang-Teck Pang, William R. Reohr, Phillip J. Restle, Michael G.R. Thomson
  • Publication number: 20140167832
    Abstract: Described is an integrated circuit having a clock distribution network capable of transitioning from a non-resonant clock mode to a first resonant clock mode Transitions between clock modes or between various resonant clock frequencies are done gradually over a series of clock cycles. In example, when transitioning from a non-resonant clock mode to a first resonant clock mode, a strength of a clock sector driver is reduced over a series of clock cycles, and individual ones of a plurality of resonant switches associated with resonant circuits are modified in coordination with reducing the strength of the clock sector driver.
    Type: Application
    Filed: December 19, 2012
    Publication date: June 19, 2014
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Thomas J. Bucelot, Alan Drake, Joshua D. Friedrich, Jason D. Hibbeler, Liang-Teck Pang, William R. Reohr, Phillip John Restle, Gregory S. Still, Michael G.R. Thomson
  • Patent number: 8736342
    Abstract: Described is an integrated circuit having a clock distribution network capable of transitioning from a non-resonant clock mode to a first resonant clock mode Transitions between clock modes or between various resonant clock frequencies are done gradually over a series of clock cycles. In example, when transitioning from a non-resonant clock mode to a first resonant clock mode, a strength of a clock sector driver is reduced over a series of clock cycles, and individual ones of a plurality of resonant switches associated with resonant circuits are modified in coordination with reducing the strength of the clock sector driver.
    Type: Grant
    Filed: December 19, 2012
    Date of Patent: May 27, 2014
    Assignee: International Business Machines Corporation
    Inventors: Thomas J. Bucelot, Alan Drake, Joshua D. Friedrich, Jason D. Hibbeler, Liang-Teck Pang, William R. Reohr, Phillip John Restle, Gregory S. Still, Michael G. R. Thomson
  • Patent number: 8704576
    Abstract: A wide bandwidth resonant clock distribution comprises a clock grid configured to distribute a clock signal to a plurality of components of an integrated circuit, at least one inductor, at least one tunable resistance switch, and a capacitor network. The inductor, tunable resistance switch, and capacitor network are connected between the clock grid and a reference voltage. The at least one tunable resistance switch is programmable to dynamically switch the at least one inductor in or out of the clock distribution to effect at least one resonant mode of operation or a non-resonant mode of operation based on a frequency of the clock signal.
    Type: Grant
    Filed: February 5, 2013
    Date of Patent: April 22, 2014
    Assignee: International Business Machines Corporation
    Inventors: Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Jason D. Hibbeler, Yong I. Kim, Liang-Teck Pang, William R. Reohr, Phillip J. Restle, Michael G. R. Thomson
  • Publication number: 20130320340
    Abstract: A physical test integrated circuit has a plurality of repeating circuit portions corresponding to an integrated circuit design. A first of the portions is fabricated with a nominal block mask location, and additional ones of the portions are deliberately fabricated with predetermined progressive increased offset of the block mask location from the nominal block mask location. For each of the portions, the difference in threshold voltage between a first field effect transistor and a second field effect transistor is determined. The predetermined progressive increased offset of the block mask location is in a direction from the first field effect transistor to the second field effect transistor. The block mask overlay tolerance is determined at a value of the progressive increased offset corresponding to an inflection of the difference in threshold voltage from a zero difference. A method for on-chip monitoring, and corresponding circuits, are also disclosed.
    Type: Application
    Filed: June 5, 2012
    Publication date: December 5, 2013
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Emrah Acar, Aditya Bansal, Dureseti Chidambarrao, Liang-Teck Pang, Amith Singhee