Patents by Inventor Markus Glatthaar

Markus Glatthaar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10808330
    Abstract: The present invention relates to a process for producing one or more electrical contacts on a component, comprising (a) applying one or more coatings on the component, where at least one of the coatings is a coating of an electrically conductive material, (b) applying a self-passivating metal or semiconductor and/or a dielectric material on the coated component, (c) structuring the passivating coating by laser treatment or etching, (d) contacting the structured coating with an electroplating bath, (e) etching the regions not covered with the galvanically deposited metal.
    Type: Grant
    Filed: February 13, 2019
    Date of Patent: October 20, 2020
    Assignee: FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
    Inventors: Markus Glatthaar, Jonas Bartsch, Sven Kluska, Thibaud Hatt, Andreas Rodofili, Martin Hermle
  • Publication number: 20190256996
    Abstract: The present invention relates to a process for producing one or more electrical contacts on a component, comprising (a) applying one or more coatings on the component, where at least one of the coatings is a coating of an electrically conductive material, (b) applying a self-passivating metal or semiconductor and/or a dielectric material on the coated component, (c) structuring the passivating coating by laser treatment or etching, (d) contacting the structured coating with an electroplating bath, (e) etching the regions not covered with the galvanically deposited metal.
    Type: Application
    Filed: February 13, 2019
    Publication date: August 22, 2019
    Inventors: Markus Glatthaar, Jonas Bartsch, Sven Kluska, Thibaud Hatt, Andreas Rodofili, Martin Hermle
  • Publication number: 20190237599
    Abstract: The present invention relates to a method for producing one or more electrical contacts on a component, comprising the following steps:—providing a component which has a front and a rear, an outer layer of a transparent, electrically conductive oxide (TCO) or a self-passivating metal or semiconductor being present on the front and/or rear;—applying a structured, electrically conductive seed layer, the application of the seed layer taking place non-galvanically;—galvanically depositing at least one metal on the seed layer.
    Type: Application
    Filed: September 12, 2017
    Publication date: August 1, 2019
    Inventors: Markus Glatthaar, Jonas Bartsch, Mathias Kamp, Rukmangada Rohit
  • Publication number: 20180040744
    Abstract: The present invention relates to a method for structuring layers of oxidisable materials. At least one layer, disposed on a substrate, of an oxidisable material is hereby subjected to local oxidation with at least one oxidation step. In the case of the latter, at least one selected region of the layer of oxidisable material is oxidised so that the layer, after oxidation, is sub-divided into regions, which are electrically insulated from each other, by at least one oxidised region extending over the entire layer thickness.
    Type: Application
    Filed: October 13, 2017
    Publication date: February 8, 2018
    Applicant: FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
    Inventors: Matthias KAMP, Jonas BARTSCH, Markus GLATTHAAR
  • Patent number: 9435740
    Abstract: A method is provided for measuring a semiconductor structure, which allows the spatially resolved determination of dark saturation current and/or series resistance and/or resistance of the emitter layer of the semiconductor structure via luminescence measurement, without restrictions being given such that one of the parameters must be known in advance or spatially consistent.
    Type: Grant
    Filed: August 16, 2010
    Date of Patent: September 6, 2016
    Assignee: FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
    Inventors: Jonas Haunschild, Stefan Rein, Markus Glatthaar
  • Publication number: 20160240699
    Abstract: The invention relates to a method for structuring layers of oxidizable materials. At least one layer, disposed on a substrate, of an oxidizable material is hereby subjected to local oxidation with at least one oxidation step. In the case of the latter, at least one selected region of the layer of the oxidizable material is oxidized such that the layer, after oxidation, is subdivided into regions, which are electrically insulated from each other, by at least one oxidized region extending across the entire layer thickness after the oxidation.
    Type: Application
    Filed: September 18, 2014
    Publication date: August 18, 2016
    Applicant: FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
    Inventors: Matthias KAMP, Jonas BARTSCH, Markus GLATTHAAR
  • Patent number: 9124214
    Abstract: A method for spatially determining the series resistance of a semiconductor structure by generating luminescent radiation in the semiconductor structure under measurement conditions A and B, by determining a local calibration parameter CV,i for a plurality of prescribed locations of the semiconductor structure and determining local series resistances RS,i for a plurality of prescribed locations of the semiconductor structure. It is essential that the local series resistances RS,i are each determined as a function of a global series resistance RSg of the semiconductor structure that is identical for all local series resistances.
    Type: Grant
    Filed: May 17, 2010
    Date of Patent: September 1, 2015
    Assignees: Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung E.V., Albert-Ludwigs-Universität Freiburg
    Inventors: Jonas Haunschild, Markus Glatthaar, Stefan Rein
  • Publication number: 20120203494
    Abstract: The invention relates to a method for measuring a semiconductor structure, which has an emitter and a base, and which is a solar cell or a precursor of a solar cell, comprising the following steps: A) Generating luminescence radiation in the semiconductor structure, and spatially resolved measuring of the luminescence radiation emitted by the semiconductor structure, wherein a first measurement is conducted under a first measurement condition a, and depending on the measurement data that are obtained at least from the first measurement, a first spatially resolved, voltage-calibrated image Va(xi) for a plurality of local points xi of the solar cell is determined from the measurement data obtained in step A; B) Determining spatially resolved properties of the semiconductor structure with respect to the spatially resolved dark saturation current j0(xi), and/or the spatially resolved emitter layer resistance ?(x1), and/or the spatially resolved, local series resistance Rs(xi) for the plurality of local points xi,
    Type: Application
    Filed: August 16, 2010
    Publication date: August 9, 2012
    Applicant: ALBERT-LUDWIGS-UNIVERSITAT FREIBURG
    Inventors: Jonas Haunschild, Stefan Rein, Markus Glatthaar
  • Publication number: 20120113415
    Abstract: A method for spatially determining the series resistance of a semiconductor structure by generating luminescent radiation in the semiconductor structure under measurement conditions A and B, by determining a local calibration parameter CV,i for a plurality of prescribed locations of the semiconductor structure and determining local series resistances RS,i for a plurality of prescribed locations of the semiconductor structure. It is essential that the local series resistances RS,i are each determined as a function of a global series resistance RSg of the semiconductor structure that is identical for all local series resistances.
    Type: Application
    Filed: May 17, 2010
    Publication date: May 10, 2012
    Applicants: FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E.V., ALBERT-LUDWIGS-UNIVERSITAT FREIBURG
    Inventors: Jonas Haunschild, Markus Glatthaar, Stefan Rein
  • Publication number: 20120074971
    Abstract: A measuring device for electrically measuring a measurement structure that can be electrically contacted at one measuring side, in particular an optoelectronic element, such as a solar cell, including at least two contacting units for electrically contacting the measurement structure and at least one support element for supporting the measurement structure with the measuring side on the support element. It is essential that the measuring device includes at least one suction line for the connection to the suction unit and at least one suction opening that is connected in a fluid-conducting manner to the suction line, wherein the suction opening is arranged in and/or on the support element such that the measurement structure can be pressed against the support element by suctioning via the suction opening. When the measurement structure rests on the support element, the contacting unit can be pressed against the measuring side of the measurement structure for the electrical contacting thereof.
    Type: Application
    Filed: March 10, 2010
    Publication date: March 29, 2012
    Applicant: FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
    Inventors: Markus Glatthaar, Stefan Rein, Daniel Biro, Florian Clement, Michael Menko, Alexander Krieg