Abstract: A method, an interferometer, and a signal processing device, each for determining an input phase and/or an input amplitude of an input light field, are disclosed. Here, an input light field is divided into a first light field and a second light field by amplitude splitting. The first light field and the second light field are propagated such that the propagated second light field is defocused relative to the propagated first light field. The propagated first light field is superimposed on the propagated light field and caused to interfere.

Abstract: A method is presented for determining a phase of an input beam (110, Ein) without a reference ray. In the method, an input beam (110, Ein) having a plurality of input rays is split into a main beam (112, E1) and a reference beam (114, E2) in such a way that each input ray is split into a main ray of the main beam (112, E1) and a comparative ray of the reference beam (114, E2). The main beam (112, E1) is propagated along a first interferometer arm, and the reference beam (114, E2) is propagated along the second interferometer arm. The propagated main beam (112, E1) and the propagated reference beam (114, E2) are superposed to form an interference beam having a plurality of interference rays.

Abstract: A three-dimensional interferometer for measuring a light field produced by an object, comprising a first interferometer arm, a second interferometer arm, a beam splitter arranged between an object point of the object and the first interferometer arm and the second interferometer arm, and is set up to split a beam coming from the object point at the beam splitter into the first beam and the second beam, a detection plane or a detection surface which is arranged downstream of the first interferometer arm and the second interferometer arm and is set up in such a manner that the first beam and the second beam are made to interfere in an interference region on said plane or surface, and an overlapping device which is arranged between the detection plane and the first interferometer arm and the second interferometer arm.

Abstract: An interferometer includes a first interferometer arm and a second interferometer arm. A first central beam, originating from a central image point of an image, passes through the first interferometer arm. A second central beam, originating from the central image point, passes through the second interferometer arm. The first central beam and the second central beam are superimposed and generate a kperpendicular=0 interference at a superposition point. A first light beam perpendicular to the first central beam, originating from an image point of the image, passes through the first interferometer arm. A second light beam perpendicular to the second central beam, originating from the image point, passes through the second interferometer arm. The first light beam and the second light beam overlap at the superposition point. At the superposition point, a wave vector component of the first light beam opposes a wave vector component of the second light beam.

Abstract: A method is presented for determining a phase of an input beam (110, Ein) without a reference ray. In the method, an input beam (110, Ein) having a plurality of input rays is split into a main beam (112, E1) and a reference beam (114, E2) in such a way that each input ray is split into a main ray of the main beam (112, E1) and a comparative ray of the reference beam (114, E2). The main beam (112, E1) is propagated along a first interferometer arm, and the reference beam (114, E2) is propagated along the second interferometer arm. The propagated main beam (112, E1) and the propagated reference beam (114, E2) are superposed to form an interference beam having a plurality of interference rays.

Abstract: The invention relates to a three-dimensional interferometer (100) for measuring a light field generated by an object (110), in particular the determination of an electric field (E1ij, E2ij), especially of the phase (?1ij, ?2ij) or of the phase (?1ij, ?2ij) and of the intensity or the absolute value of the electric field (E1ij, E2ij), having a first interferometer arm (150), which can be so configured or adjusted, especially configured, that a first light beam runs through it, a second interferometer arm (152) so configurable or adjustable, especially configured, that a second light beam runs through it, a beam splitter (101)—that is configured—located between an object point (112) of the object (110) on the one hand and the first interferometer arm (150) and the second interferometer arm (152) on the other hand, to split a light beam emanating from the object point (112) at the beam splitter (101) into the first light beam and the second light beam, a detection plane (131) or detection surface, which is locat

Abstract: An interferometer includes a first interferometer arm and a second interferometer arm. A first central beam, originating from a central image point of an image, passes through the first interferometer arm. A second central beam, originating from the central image point, passes through the second interferometer arm. The first central beam and the second central beam are superimposed and generate a kperpendicular=0 interference at a superposition point. A first light beam perpendicular to the first central beam, originating from an image point of the image, passes through the first interferometer arm. A second light beam perpendicular to the second central beam, originating from the image point, passes through the second interferometer arm. The first light beam and the second light beam overlap at the superposition point. At the superposition point, a wave vector component of the first light beam opposes a wave vector component of the second light beam.

Abstract: An electron microscope is provided. In another aspect, an electron microscope employs a radio frequency which acts upon electrons used to assist in imaging a specimen. Furthermore, another aspect provides an electron beam microscope with a time resolution of less than 1 picosecond with more than 105 electrons in a single shot or image group. Yet another aspect employs a super-cooled component in an electron microscope.

Abstract: An electron microscope is provided. In another aspect, an electron microscope employs a radio frequency which acts upon electrons used to assist in imaging a specimen. Furthermore, another aspect provides an electron beam microscope with a time resolution of less than 1 picosecond with more than 105 electrons in a single shot or image group. Yet another aspect employs a super-cooled component in an electron microscope.