Patents by Inventor Martin Berz

Martin Berz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10823547
    Abstract: A method is presented for determining a phase of an input beam (110, Ein) without a reference ray. In the method, an input beam (110, Ein) having a plurality of input rays is split into a main beam (112, E1) and a reference beam (114, E2) in such a way that each input ray is split into a main ray of the main beam (112, E1) and a comparative ray of the reference beam (114, E2). The main beam (112, E1) is propagated along a first interferometer arm, and the reference beam (114, E2) is propagated along the second interferometer arm. The propagated main beam (112, E1) and the propagated reference beam (114, E2) are superposed to form an interference beam having a plurality of interference rays.
    Type: Grant
    Filed: June 1, 2017
    Date of Patent: November 3, 2020
    Inventor: Martin Berz
  • Patent number: 10663351
    Abstract: A three-dimensional interferometer for measuring a light field produced by an object, comprising a first interferometer arm, a second interferometer arm, a beam splitter arranged between an object point of the object and the first interferometer arm and the second interferometer arm, and is set up to split a beam coming from the object point at the beam splitter into the first beam and the second beam, a detection plane or a detection surface which is arranged downstream of the first interferometer arm and the second interferometer arm and is set up in such a manner that the first beam and the second beam are made to interfere in an interference region on said plane or surface, and an overlapping device which is arranged between the detection plane and the first interferometer arm and the second interferometer arm.
    Type: Grant
    Filed: February 17, 2017
    Date of Patent: May 26, 2020
    Inventor: Martin Berz
  • Patent number: 10386174
    Abstract: An interferometer includes a first interferometer arm and a second interferometer arm. A first central beam, originating from a central image point of an image, passes through the first interferometer arm. A second central beam, originating from the central image point, passes through the second interferometer arm. The first central beam and the second central beam are superimposed and generate a kperpendicular=0 interference at a superposition point. A first light beam perpendicular to the first central beam, originating from an image point of the image, passes through the first interferometer arm. A second light beam perpendicular to the second central beam, originating from the image point, passes through the second interferometer arm. The first light beam and the second light beam overlap at the superposition point. At the superposition point, a wave vector component of the first light beam opposes a wave vector component of the second light beam.
    Type: Grant
    Filed: August 19, 2015
    Date of Patent: August 20, 2019
    Inventor: Martin Berz
  • Publication number: 20190219378
    Abstract: A method is presented for determining a phase of an input beam (110, Ein) without a reference ray. In the method, an input beam (110, Ein) having a plurality of input rays is split into a main beam (112, E1) and a reference beam (114, E2) in such a way that each input ray is split into a main ray of the main beam (112, E1) and a comparative ray of the reference beam (114, E2). The main beam (112, E1) is propagated along a first interferometer arm, and the reference beam (114, E2) is propagated along the second interferometer arm. The propagated main beam (112, E1) and the propagated reference beam (114, E2) are superposed to form an interference beam having a plurality of interference rays.
    Type: Application
    Filed: June 1, 2017
    Publication date: July 18, 2019
    Inventor: Martin Berz
  • Publication number: 20190145831
    Abstract: The invention relates to a three-dimensional interferometer (100) for measuring a light field generated by an object (110), in particular the determination of an electric field (E1ij, E2ij), especially of the phase (?1ij, ?2ij) or of the phase (?1ij, ?2ij) and of the intensity or the absolute value of the electric field (E1ij, E2ij), having a first interferometer arm (150), which can be so configured or adjusted, especially configured, that a first light beam runs through it, a second interferometer arm (152) so configurable or adjustable, especially configured, that a second light beam runs through it, a beam splitter (101)—that is configured—located between an object point (112) of the object (110) on the one hand and the first interferometer arm (150) and the second interferometer arm (152) on the other hand, to split a light beam emanating from the object point (112) at the beam splitter (101) into the first light beam and the second light beam, a detection plane (131) or detection surface, which is locat
    Type: Application
    Filed: February 17, 2017
    Publication date: May 16, 2019
    Inventor: Martin BERZ
  • Publication number: 20170268866
    Abstract: An interferometer includes a first interferometer arm and a second interferometer arm. A first central beam, originating from a central image point of an image, passes through the first interferometer arm. A second central beam, originating from the central image point, passes through the second interferometer arm. The first central beam and the second central beam are superimposed and generate a kperpendicular=0 interference at a superposition point. A first light beam perpendicular to the first central beam, originating from an image point of the image, passes through the first interferometer arm. A second light beam perpendicular to the second central beam, originating from the image point, passes through the second interferometer arm. The first light beam and the second light beam overlap at the superposition point. At the superposition point, a wave vector component of the first light beam opposes a wave vector component of the second light beam.
    Type: Application
    Filed: August 19, 2015
    Publication date: September 21, 2017
    Inventor: Martin BERZ
  • Patent number: 9024256
    Abstract: An electron microscope is provided. In another aspect, an electron microscope employs a radio frequency which acts upon electrons used to assist in imaging a specimen. Furthermore, another aspect provides an electron beam microscope with a time resolution of less than 1 picosecond with more than 105 electrons in a single shot or image group. Yet another aspect employs a super-cooled component in an electron microscope.
    Type: Grant
    Filed: August 6, 2014
    Date of Patent: May 5, 2015
    Assignee: Board of Trustees of Michigan State University
    Inventors: Chong-Yu Ruan, Martin Berz, Zhensheng Tao
  • Publication number: 20140346355
    Abstract: An electron microscope is provided. In another aspect, an electron microscope employs a radio frequency which acts upon electrons used to assist in imaging a specimen. Furthermore, another aspect provides an electron beam microscope with a time resolution of less than 1 picosecond with more than 105 electrons in a single shot or image group. Yet another aspect employs a super-cooled component in an electron microscope.
    Type: Application
    Filed: August 6, 2014
    Publication date: November 27, 2014
    Applicant: Board of Trustees of Michigan State University
    Inventors: Chong-Yu Ruan, Martin Berz, Zhensheng Tao