Patents by Inventor Martin S. Piltch

Martin S. Piltch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240326326
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Application
    Filed: February 13, 2024
    Publication date: October 3, 2024
    Applicant: Divergent Technologies, Inc.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20240092016
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Application
    Filed: November 17, 2023
    Publication date: March 21, 2024
    Applicant: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, MArk J. Cola, Martin S. Piltch
  • Patent number: 11931956
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Grant
    Filed: September 13, 2022
    Date of Patent: March 19, 2024
    Assignee: DIVERGENT TECHNOLOGIES, INC.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Patent number: 11858207
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Grant
    Filed: February 21, 2023
    Date of Patent: January 2, 2024
    Assignee: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Patent number: 11692876
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Grant
    Filed: July 9, 2021
    Date of Patent: July 4, 2023
    Assignee: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Publication number: 20230202100
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Application
    Filed: February 21, 2023
    Publication date: June 29, 2023
    Applicant: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Patent number: 11607875
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Grant
    Filed: August 23, 2021
    Date of Patent: March 21, 2023
    Assignee: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Publication number: 20230081180
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Application
    Filed: September 13, 2022
    Publication date: March 16, 2023
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20220382250
    Abstract: In some aspects, the additive manufacturing system may access, by a processor of an additive manufacturing system, a machine learning model that is trained to identify defects within a build plane. Also, the additive manufacturing system may capture, by an imaging system of the additive manufacturing system, an image of a build plane of the additive manufacturing system. The build plane can contain an object being manufactured through an additive manufacturing process. In addition, the additive manufacturing system may provide, by the processor, the captured image as an input to the machine learning model. Moreover, the additive manufacturing system may receive, by the processor, an output from the machine learning model identifying a defect in the build plane.
    Type: Application
    Filed: May 31, 2022
    Publication date: December 1, 2022
    Applicant: Sigma Labs, Inc.
    Inventors: Roger Frye, Christina Xuan Yu, Darren Beckett, Martin S. Piltch, Lars Jacquemetton, Kevin C. Anderson
  • Patent number: 11478854
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Grant
    Filed: August 7, 2020
    Date of Patent: October 25, 2022
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20220324026
    Abstract: This disclosure describes various methods and apparatus for calibration of temperature sensors in additive manufacturing systems. A method for calibration of temperature sensors can include selecting a first wavelength and a second wavelength spaced apart from the first wavelength; measuring an amount of energy radiated from a black body source at the first wavelength; measuring an amount of energy radiated from the black body source at the second wavelength; generating a relationship between a ratio of the amount of energy radiated at the first wavelength to the amount of energy radiated at the second wavelength; and determining, using the relationship, variations in a temperature of a build plane of an additive manufacturing system based upon a ratio of energy radiated at the first wavelength to energy radiated at the second wavelength.
    Type: Application
    Filed: April 13, 2022
    Publication date: October 13, 2022
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Martin S. Piltch, Lars Jacquemetton, Alberto M. Castro, Brett Diehl
  • Publication number: 20210404886
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: July 9, 2021
    Publication date: December 30, 2021
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Publication number: 20210394302
    Abstract: An additive manufacturing system includes a work region having a layer of metallic powder distributed across at least a portion of the work region. The system further includes a power source, a scanning and focusing system and a processor. The processor is configured to control the power source to emit a beam of energy at a power level and to manipulate the beam of energy across the work region in a plurality of build tracks to form a part from the fused metallic powder. The processor further determines a cooling rate at a termination of each of the plurality of build tracks and controls the power level of the power source in response to the determined cooling rate.
    Type: Application
    Filed: June 16, 2021
    Publication date: December 23, 2021
    Applicant: SIGMA LABS, INC.
    Inventors: Lars Jacquemetton, Martin S. Piltch, Darren Beckett
  • Publication number: 20210379666
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Application
    Filed: August 23, 2021
    Publication date: December 9, 2021
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Patent number: 11135654
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Grant
    Filed: May 18, 2018
    Date of Patent: October 5, 2021
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Patent number: 11073431
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Grant
    Filed: November 8, 2019
    Date of Patent: July 27, 2021
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Publication number: 20210138578
    Abstract: An additive manufacturing system comprises a build plane and an energy source configured to direct energy onto a work region of the build plane. An optical detector is configured to receive one or more optical signals from the work region. An optical filter is positioned between the work region and the optical detector, wherein the optical filter includes a first partially transmissive polarized filter having a first polarization axis and a second partially transmissive polarized filter having a second polarization axis. The first polarization axis is rotationally offset from the second polarization axis approximately 90 degrees. The optical filter improves the signal to noise ratio of the optical sensors.
    Type: Application
    Filed: November 6, 2020
    Publication date: May 13, 2021
    Applicant: SIGMA LABS, INC.
    Inventors: Darren Beckett, Martin S. Piltch, Scott Betts, Alberto M. Castro, Kevin Anderson, Lars Jacquemetton, Luis Aguilar
  • Publication number: 20210060647
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Application
    Filed: August 7, 2020
    Publication date: March 4, 2021
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Patent number: 10786948
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Grant
    Filed: November 18, 2015
    Date of Patent: September 29, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20200249099
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: November 8, 2019
    Publication date: August 6, 2020
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro