Patents by Inventor Mary Sue Kulpins

Mary Sue Kulpins has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10368825
    Abstract: Methods and systems are provided for automatic exposure control in computed tomography imaging systems. In one embodiment, a method comprises in response to an object-specific dose metric input by a user via a user interface operably coupled to a scanner, predicting an image quality of a diagnostic scan, calculating an output level of a source of the scanner for the image quality, and performing the diagnostic scan at the output level when the image quality is higher than a threshold. In this way, patient-specific image quality settings may be determined.
    Type: Grant
    Filed: January 20, 2016
    Date of Patent: August 6, 2019
    Assignee: General Electric Company
    Inventors: Dominic Joseph Crotty, Roy A. Nilsen, Jiahua Fan, Mary Sue Kulpins, Franco Rupcich, Grant Morey Stevens
  • Publication number: 20170202534
    Abstract: Methods and systems are provided for automatic exposure control in computed tomography imaging systems. In one embodiment, a method comprises in response to an object-specific dose metric input by a user via a user interface operably coupled to a scanner, predicting an image quality of a diagnostic scan, calculating an output level of a source of the scanner for the image quality, and performing the diagnostic scan at the output level when the image quality is higher than a threshold. In this way, patient-specific image quality settings may be determined.
    Type: Application
    Filed: January 20, 2016
    Publication date: July 20, 2017
    Inventors: Dominic Joseph Crotty, Roy A. Nilsen, Jiahua Fan, Mary Sue Kulpins, Franco Rupcich, Grant Morey Stevens
  • Patent number: 8396273
    Abstract: A method is provided that includes acquiring a first set of image data from X-rays produced at a first energy level and a second set of image data from X-rays produced at a second energy level. The method includes generating a first noise mask for a first basis material and a second noise mask for a second basis material and removing pixels corresponding to cross contaminating structural information from the first noise mask and the second noise mask. The method includes processing a first materially decomposed image generated from the first set of image data and the second set of digital data using the second noise mask after removal of the cross contaminating structural information and processing a second MD image generated from the first set of image data and the second set of digital data using the first noise mask after removal of the cross contaminating structural information.
    Type: Grant
    Filed: December 30, 2009
    Date of Patent: March 12, 2013
    Assignee: General Electric Company
    Inventors: Baojun Li, Naveen Stephan Chandra, Jed Douglas Pack, Jiang Hsieh, Xiaoye Wu, Mary Sue Kulpins
  • Patent number: 8363917
    Abstract: A CT system includes a generator configured to energize an x-ray source to a first kilovoltage (kVp) and to a second kVp, and a computer that is programmed to acquire a first view dataset with the x-ray source energized to the first kVp and a second view dataset with the x-ray source energized to the second kVp, generate a base correction image using the first view dataset and the second view dataset, and reconstruct a pair of base material images from the first view dataset and from the second view dataset. The computer is also programmed to estimate artifact correlation in the pair of base material images using the base correction image, generate a pair of final base material images and a final monochromatic image, and correct one of the pair of final base material images and the final monochromatic image at a keV value using the estimated artifact correlation.
    Type: Grant
    Filed: October 14, 2009
    Date of Patent: January 29, 2013
    Assignee: General Electric Company
    Inventors: Jiahua Fan, Naveen Chandra, Andrew Johnson, Jiang Hsieh, Fang Dong, Mary Sue Kulpins, Peter Crandall
  • Patent number: 8315352
    Abstract: An imaging system includes an x-ray source that emits a beam of x-rays toward an object, a detector that receives high frequency electromagnetic energy attenuated by the object, a data acquisition system (DAS) operably connected to the detector, and a computer operably connected to the DAS. The computer is programmed to compute detector coefficients based on a static low kVp measurement and a static high kVp measurement, capture incident spectra at high and low kVp during fast kVp switching, compute effective X-ray incident spectra at high and low kVp during fast kVp switching using the captured incident spectra, scan a water phantom and normalize the computed detector coefficients to water, adjust the computed effective X-ray incident spectra based on the normalized detector coefficients, compute basis material decomposition functions using the adjusted X-ray incident spectra, and generate one or more basis material density images using the computed basis material decomposition functions.
    Type: Grant
    Filed: September 16, 2010
    Date of Patent: November 20, 2012
    Assignee: General Electric Company
    Inventors: Xiaoye Wu, Dan Xu, Naveen Chandra, Zhanyu Ge, Jiang Hsieh, Daniel David Harrison, Mary Sue Kulpins
  • Publication number: 20120069952
    Abstract: An imaging system includes an x-ray source that emits a beam of x-rays toward an object, a detector that receives high frequency electromagnetic energy attenuated by the object, a data acquisition system (DAS) operably connected to the detector, and a computer operably connected to the DAS. The computer is programmed to compute detector coefficients based on a static low kVp measurement and a static high kVp measurement, capture incident spectra at high and low kVp during fast kVp switching, compute effective X-ray incident spectra at high and low kVp during fast kVp switching using the captured incident spectra, scan a water phantom and normalize the computed detector coefficients to water, adjust the computed effective X-ray incident spectra based on the normalized detector coefficients, compute basis material decomposition functions using the adjusted X-ray incident spectra, and generate one or more basis material density images using the computed basis material decomposition functions.
    Type: Application
    Filed: September 16, 2010
    Publication date: March 22, 2012
    Inventors: Xiaoye Wu, Dan Xu, Naveen Chandra, Zhanyu Ge, Jiang Hsieh, Daniel David Harrison, Mary Sue Kulpins
  • Publication number: 20110158498
    Abstract: A method is provided that includes acquiring a first set of image data from X-rays produced at a first energy level and a second set of image data from X-rays produced at a second energy level. The method includes generating a first noise mask for a first basis material and a second noise mask for a second basis material and removing pixels corresponding to cross contaminating structural information from the first noise mask and the second noise mask. The method includes processing a first materially decomposed image generated from the first set of image data and the second set of digital data using the second noise mask after removal of the cross contaminating structural information and processing a second MD image generated from the first set of image data and the second set of digital data using the first noise mask after removal of the cross contaminating structural information.
    Type: Application
    Filed: December 30, 2009
    Publication date: June 30, 2011
    Applicant: General Electric Company
    Inventors: Baojun Li, Naveen Stephan Chandra, Jed Douglas Pack, Jiang Hsieh, Xiaoye Wu, Mary Sue Kulpins
  • Publication number: 20110085719
    Abstract: A CT system includes a generator configured to energize an x-ray source to a first kilovoltage (kVp) and to a second kVp, and a computer that is programmed to acquire a first view dataset with the x-ray source energized to the first kVp and a second view dataset with the x-ray source energized to the second kVp, generate a base correction image using the first view dataset and the second view dataset, and reconstruct a pair of base material images from the first view dataset and from the second view dataset. The computer is also programmed to estimate artifact correlation in the pair of base material images using the base correction image, generate a pair of final base material images and a final monochromatic image, and correct one of the pair of final base material images and the final monochromatic image at a keV value using the estimated artifact correlation.
    Type: Application
    Filed: October 14, 2009
    Publication date: April 14, 2011
    Inventors: Jiahua Fan, Naveen Chandra, Andrew Johnson, Jiang Hsieh, Fang Dong, Mary Sue Kulpins, Peter Crandall
  • Patent number: 7747057
    Abstract: A method for performing BIS correction includes scanning an object with a computed tomography (CT) system to obtain data, reconstructing an image using the obtained data, and using the image to perform BIS correction.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: June 29, 2010
    Assignee: General Electric Company
    Inventors: Xiaoye Wu, Paavana Sainath, Thomas Louis Toth, Thomas John Myers, Mary Sue Kulpins, Xiangyang Tang, Roy-Arnulf Helge Nilsen
  • Patent number: 7684589
    Abstract: A method and apparatus for processing raw image data to create processed images. Raw image data is acquired. The raw image data is decomposed by a data decomposer into N subsets of raw image data. The number N is based on a number of available image generation processors. The N subsets of raw image data are processed by at least one image generation processor to create processed image data. If more than one image generation processor is available, the image generation processors perform image processing on the raw image data in parallel with respect to each other.
    Type: Grant
    Filed: February 9, 2009
    Date of Patent: March 23, 2010
    Assignee: General Electric Company
    Inventors: Roy Arnulf Nilsen, Evgeny Drapkin, Mary Sue Kulpins
  • Publication number: 20090169085
    Abstract: A method and apparatus for processing raw image data to create processed images. Raw image data is acquired. The raw image data is decomposed by a data decomposer into N subsets of raw image data. The number N is based on a number of available image generation processors. The N subsets of raw image data are processed by at least one image generation processor to create processed image data. If more than one image generation processor is available, the image generation processors perform image processing on the raw image data in parallel with respect to each other.
    Type: Application
    Filed: February 9, 2009
    Publication date: July 2, 2009
    Applicant: General Electric Company
    Inventors: Roy Arnulf Nilsen, Evgeny Drapkin, Mary Sue Kulpins
  • Patent number: 7489799
    Abstract: A method and apparatus for processing raw image data to create processed images. Raw image data is acquired. The raw image data is decomposed by a data decomposer into N subsets of raw image data. The number N is based on a number of available image generation processors. The N subsets of raw image data are processed by at least one image generation processor to create processed image data. If more than one image generation processor is available, the image generation processors perform image processing on the raw image data in parallel with respect to each other.
    Type: Grant
    Filed: November 30, 2004
    Date of Patent: February 10, 2009
    Assignee: General Electric Company
    Inventors: Roy Amulf Nilsen, Evgeny Drapkin, Mary Sue Kulpins
  • Publication number: 20070274581
    Abstract: A method for performing BIS correction includes scanning an object with a computed tomography (CT) system to obtain data, reconstructing an image using the obtained data, and using the image to perform BIS correction.
    Type: Application
    Filed: May 26, 2006
    Publication date: November 29, 2007
    Inventors: Xiaoye Wu, Paavana Sainath, Thomas Louis Toth, Thomas John Myers, Mary Sue Kulpins, Xiangyang Tang, Roy-Arnulf Helge Nilsen
  • Patent number: 6327329
    Abstract: Methods and apparatus for detecting cell to cell variation to ensure that the maximum allowable channel to channel variation is not exceeded are described. In one embodiment, an algorithm is periodically executed to measure the relative gains in the channels. The gains are measured, for example, by recording the signal from an air scan and normalizing to a common reference. Part of the normalization process includes accounting for the non uniformity of the x-ray beam, for example, the heel effect. It is assumed that the x-ray flux profile in z is slowly changing in the x-direction and is obtained by low pass filtering in x. The normalized values are then compared to a predetermined specification. If any particular cell is not within the specification parameters, then the module in which such cell resides may be replaced. In addition to measuring gain variation and comparing it to a specification, a trending analysis also may be performed.
    Type: Grant
    Filed: August 25, 1998
    Date of Patent: December 4, 2001
    Assignee: General Electric Company
    Inventors: Neil B. Bromberg, Hui David He, Mary Sue Kulpins