Abstract: A wire cover is to be mounted on a rear side in a connecting direction of a connector to be connected to a mating connector. The connector includes a plurality of female terminals disposed apart from each other in a lateral direction and a plurality of wires connected to the respective female terminals and pulled out from the rear side in the connecting direction. The wire cover includes a housing having an insertion opening through which the plurality of wires are inserted and a draw-out opening through which the plurality of wires inserted through the insertion opening are drawn out rightward, and an assisting member for assisting three-dimensional bending of the respective wires inside the housing. The respective wires are three-dimensionally bent inside the housing and drawn out through the draw-out opening by being assisted by the assisting member.

Abstract: The fine particle measurement apparatus according to the present technology includes a detection section, a multiplication factor setting section, a correction factor calculation section, and a spectrum generation section. The detection section has a plurality of detectors for detecting light from fine particles. The multiplication factor setting section sets a multiplication factor for each of the plurality of detectors. The correction factor calculation section calculates a correction factor on the basis of the set multiplication factor. The spectrum generation section generates spectral data by correcting a value detected by the detector, with the calculated correction factor.

Abstract: To enable multicolor analysis while suppressing upsizing. An optical measurement device according to an embodiment includes: a spectral optical system (37) that disperses fluorescence emitted from a biological specimen; and an image sensor (34) that receives the fluorescence dispersed by the spectral optical system and generates fluorescence information. The image sensor is divided into a plurality of regions that receive different wavelength components of the fluorescence and generate fluorescence information for each of the wavelength components.

Abstract: Detection omission is reduced. An optical measuring device according to an embodiment includes: a plurality of excitation light sources (32A to 32D) that irradiates a plurality of positions on a flow path through which a specimen flows with excitation rays having different wavelengths; and a solid-state imaging device (34) that receives a plurality of fluorescent rays emitted from the specimen passing through each of the plurality of positions, in which the solid-state imaging device includes: a pixel array unit (91) in which a plurality of pixels is arrayed in a matrix; and a plurality of first detection circuits (93) connected to a plurality of pixels not adjacent to each other in the same column of the pixel array unit, respectively.

Abstract: A microparticle analysis device (1) is provided with a light source (16), a two-dimensional photoelectric conversion sensor (28), and a calculation unit (10C). The light source (16) irradiates a microparticle (M) flowing in a flow path (14C) with excitation light (L1). The two-dimensional photoelectric conversion sensor (28) receives fluorescence emitted from the microparticle (M) by a light receiving surface (30) including a plurality of light reception units (32) arranged two-dimensionally, and acquires data of a fluorescence signal including stored charge values of the plurality of light reception units (32), respectively. The calculation unit (10C) calculates an evaluation value including an area that is a total value of a plurality of stored charge values included in the data of the fluorescence signal.

Abstract: To provide a technique capable of handling quantitative data in a spectrum type microparticle measurement device without causing deterioration of the SNR. The present technology provides a microparticle measurement spectrometer including: a spectroscopic element that disperses light emitted from microparticles flowing through a flow path; and a photoelectric conversion array that has a plurality of light receiving elements having different detection wavelength ranges and converts optical information obtained by the light receiving elements into electrical information, in which the photoelectric conversion array has a uniform output of all channels when light with which the amount of light per unit wavelength becomes same is incident.

Abstract: A microscope system includes a microscope apparatus including a stage on which a sample is placed and an objective lens that collects laser light to the sample on the stage, a light source unit including a light source that emits the laser light, a scanning mechanism configured to guide the laser light from the light source unit and change a direction of the guided laser light to scan the sample on the stage, a photodetector configured to guide returned light from the objective lens of the microscope apparatus and convert the guided light into an electrical signal, a controller configured to control at least the scanning mechanism and generate image data from the electrical signal output from the photodetector, and a computer connected to the controller through a bus interface and configured to process the image data transferred from the controller through the bus interface.

Abstract: Provided is a fine particle measurement apparatus that offers improved spectral separation capability with reduced noise. The fine particle measurement apparatus according to the present technology includes a detection section, a multiplication factor setting section, a correction factor calculation section, and a spectrum generation section. The detection section has a plurality of detectors for detecting light from fine particles. The multiplication factor setting section sets a multiplication factor for each of the plurality of detectors. The correction factor calculation section calculates a correction factor on the basis of the set multiplication factor. The spectrum generation section generates spectral data by correcting a value detected by the detector, with the calculated correction factor.

Abstract: There is provided a measurement apparatus including a control unit configured to control an on/off state of illumination that does not contribute to acquisition of measurement data on the basis of an acquisition time period of the measurement data.

Abstract: A microscope system includes a microscope apparatus including a stage on which a sample is placed and an objective lens that collects laser light to the sample on the stage, a light source unit including a light source that emits the laser light, a scanning mechanism configured to guide the laser light from the light source unit and change a direction of the guided laser light to scan the sample on the stage, a photodetector configured to guide returned light from the objective lens of the microscope apparatus and convert the guided light into an electrical signal, a controller configured to control at least the scanning mechanism and generate image data from the electrical signal output from the photodetector, and a computer connected to the controller through a bus interface and configured to process the image data transferred from the controller through the bus interface.

Abstract: A microscope system includes a microscope apparatus including a stage on which a sample is placed and an objective lens that collects laser light to the sample on the stage, a light source unit including a light source that emits the laser light, a scanning mechanism configured to guide the laser light from the light source unit and change a direction of the guided laser light to scan the sample on the stage, a photodetector configured to guide returned light from the objective lens of the microscope apparatus and convert the guided light into an electrical signal, a controller configured to control at least the scanning mechanism and generate image data from the electrical signal output from the photodetector, and a computer connected to the controller through a bus interface and configured to process the image data transferred from the controller through the bus interface.

Abstract: [Solving Means] A signal processing apparatus is a signal processing apparatus for an optical tomographic measurement apparatus that generates measurement light and reference light and measures a tomographic structure of a measurement object on the basis of a signal intensity of interference light between the reference light and return light of the measurement light from the measurement object. An arithmetic unit is configured to calculate a signal intensity of simple reflection among the return light of the measurement light, the simple reflection being one time of reflection at a plurality of layers virtually set in a depth direction from a surface layer side of the measurement object. The arithmetic unit is configured to calculate a signal intensity of multiple reflection on the basis of the signal intensity of the simple reflection, the signal intensity of multiple reflection being a signal intensity of return light generated by being reflected at the plurality of layers three or more times.

Abstract: There is provided a laser scanning microscope apparatus including a first moving part equipped with an objective lens and configured to move the objective lens in a first direction, and a second moving part configured to be movable in a second direction orthogonal to the first moving part and equipped with the first moving part and a reflecting mirror that guides laser light radiated to an observation object and returning light of the observation object in a predetermined direction.

Abstract: [Solving Means] A signal processing apparatus is a signal processing apparatus for an optical tomographic measurement apparatus that generates measurement light and reference light and measures a tomographic structure of a measurement object on the basis of a signal intensity of interference light between the reference light and return light of the measurement light from the measurement object. An arithmetic unit is configured to calculate a signal intensity of simple reflection among the return light of the measurement light, the simple reflection being one time of reflection at a plurality of layers virtually set in a depth direction from a surface layer side of the measurement object. The arithmetic unit is configured to calculate a signal intensity of multiple reflection on the basis of the signal intensity of the simple reflection, the signal intensity of multiple reflection being a signal intensity of return light generated by being reflected at the plurality of layers three or more times.

Abstract: There is provided a measurement apparatus including a control unit configured to control an on/off state of illumination that does not contribute to acquisition of measurement data on the basis of an acquisition time period of the measurement data.

Abstract: An information processing apparatus and method provide logic for processing information. In one implementation, a computer-implemented method includes receiving spatial positions associated with a plurality of images. The method determines displacements of the images in opposing first and second horizontal directions, based on at least the spatial positions. The method then generates, using a processor, first and second composites of the images, based on the determined displacements.

Abstract: There is provided a measurement apparatus including a control unit configured to control an on/off state of illumination that does not contribute to acquisition of measurement data on the basis of an acquisition time period of the measurement data.

Abstract: There is provided a laser scanning microscope system including a mode-locked laser unit configured to radiate a laser beam with a predetermined frequency, an intermittent light-emitting unit configured to intermittently emit the laser beam radiated from the mode-locked laser unit in a predetermined intermittent light-emission period, a detector configured to convert a fluorescent substance into an electric signal, the fluorescent substance receiving the intermittently emitted laser beam and then being excited from an object, and an A/D conversion unit configured to sample the electric signal in a sampling period synchronized with the intermittent light-emission period.

Abstract: There is provided a scanning unit including a first base provided with a scanning mechanism at least having a laser light source that emits laser light of a predetermined wavelength and a scanner that scans a scanned body by using the laser light, a second base that is located at a surface of the first base opposite a surface thereof provided with the scanning mechanism and that is thermally separated from the first base; and a temperature adjustment mechanism that is provided between the first base and the second base and that adjusts a temperature of the scanning mechanism.

Abstract: In an image processing apparatus, a sensor output data acquisition unit acquires data of layered image information from a sensor group. A slice image generation unit generates data of a two-dimensional image for each slice plane surfaces in which distribution is acquired. An image axis conversion unit generates similar data of a two-dimensional image for a plurality of plane surfaces that are perpendicular to an axis different from a sensor axis. A slice image management unit of a display processing unit manages a slice image that is used for drawing according to the position of a viewpoint or the like. Memory for drawing sequentially stores data of an image necessary for drawing. An additional object image storage unit stores image data of an object that is additionally displayed such as a cursor or the like. An image drawing unit draws a three-dimensional object using data of the slice image.