Patents by Inventor Masaaki Iguchi

Masaaki Iguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5234742
    Abstract: A pellicle for lithography based on the exposure method especially adapted for lithographic lights having wave lengths of 500 nm or smaller, characterized in that the pellicle film is made of a high polymer organic silicon compound, preferably of a general molecular formula: ##STR1## where R.sup.1, R.sup.2, and R.sup.3 are the same or different alkyl groups having one to eight carbon atoms, and n is an integer between 100 and 40,000.
    Type: Grant
    Filed: June 19, 1992
    Date of Patent: August 10, 1993
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Etsuo Hatano, Yoshihiro Kubota, Akira Yamamoto, Toyohisa Sakurada, Masaaki Iguchi
  • Patent number: 4929572
    Abstract: The dopant body of arsenic for doping of a semiconductor substrate, e.g., silicon wafer, is a sintered body of a powder mixture comprising silicon arsenide, silica and, optionally, arsenic oxide in a specified proportion. The dopant body can be easily prepared and has various advantages over conventional elementary arsenic powder or a shaped body of silicon arsenide alone in respect of the high mechanical strength of the dopant body and absence of the problem of environmental contamination.
    Type: Grant
    Filed: July 17, 1989
    Date of Patent: May 29, 1990
    Assignees: Furukawa Co., Ltd., Shin-Etsu Chemical Co., Ltd.
    Inventors: Shigeaki Saito, Toshiharu Matsueda, Yoshihiro Kubota, Masaaki Iguchi
  • Patent number: 4898641
    Abstract: The single crystal wafer of lithium tantalate provided by the invention is characterized by the limited range of variation of the value of double refraction which should not exceed .+-.6.times.10.sup.-4 so that the value of the double refraction is given by 4.5.times.10.sup.-3 .+-.6.times.10.sup.-4. When single crystal wafers of lithium tantalate each satisfying the above requirements are used for the manufacture of SAW devices, the devices may have a very small deviation of the SAW sound velocity from the standard value and the range of variation of the SAW sound velocity within a wafer is also very small so that the SAW devices can be manufactured with greatly improved productivity and excellent quality.
    Type: Grant
    Filed: July 19, 1988
    Date of Patent: February 6, 1990
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Masahiro Ogihara, Shinji Makikawa, Masaaki Iguchi
  • Patent number: 4776917
    Abstract: The single crystal wafer of lithium tantalate provided by the invention is characterized by the limited range of variation of the value of double refraction which should not exceed .+-.6.times.10.sup.-4 so that the value of the double refraction is given by 4.5.times.10.sup.-3 .+-.6.times.10.sup.-4. When single crystal wafers of lithium tantalate each satisfying the above requirements are used for the manufacture of SAW devices, the devices may have a very small deviation of the SAW sound velocity from the standard value and the range of variation of the SAW sound velocity within a wafer is also very small so that the SAW devices can be manufactured with greatly improved productivity and excellent quality.
    Type: Grant
    Filed: March 4, 1987
    Date of Patent: October 11, 1988
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Masahiro Ogihara, Shinji Makikawa, Masaaki Iguchi
  • Patent number: 4755314
    Abstract: The x-cut single crystal wafer of lithium tantalate according to the invention is characterized by the orientation flat formed in a specific crystallographic orientation. The plane of the orientation flat should be (A) in parallel with the (018) plane or a plane which is in parallel with the x-axis and makes an angle of 15.degree. or smaller with the (018) plane or (B) in parallel with a plane which is in parallel with the x-axis and perpendicular to the (018) plane or a plane which is in parallel with the x-axis and makes an angle of 15.degree. or smaller with the plane which is in parallel with the x-axis and perpendicular to the (018) plane. In contrast to conventional lithium tantalate single crystal wafers provided with an orientation flat in a direction parallel to the 112.degree.
    Type: Grant
    Filed: December 3, 1985
    Date of Patent: July 5, 1988
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Susumu Sakaguchi, Masaaki Iguchi
  • Patent number: 4483734
    Abstract: In the crystal growing of GGG (gadolinium gallium garnet) by the Czochralski technique from a melt of the oxide mixture of gadolinium and gallium, zinc is added to the oxide melt as a dopant element in a limited amount so that the danger of crack formation in the grown single crystals can be greatly decreased contributing to the improvement of the productivity. Moreover, the GGG single crystal grown with zinc doping has remarkably reduced light absorption in the wavelength region of around 300 nm responsible to the yellowish tint of the crystals.
    Type: Grant
    Filed: April 18, 1983
    Date of Patent: November 20, 1984
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Susumu Sakaguchi, Kazuyoshi Watanabe, Masahiro Ogihara, Toshihiko Ryuoh, Masaaki Iguchi, Norifumi Yoshida
  • Patent number: 4412886
    Abstract: The invention provides a method for surface-finishing of a single crystal wafer of a ferroelectric material into a substrate plate suitable for use, for example, as a SAW filter element which is mirror-polished only on one of the surfaces, the other surface having an adequate roughness. Different from conventional methods, the inventive method comprises the successive steps of (a) slicing a single crystal boule into wafers, (b) lapping of the wafer on both surfaces to impart adequate roughness to the surfaces, (c) chemically etching the thus lapped surfaces to remove the strain produced in the preceding mechanical working, and (d) mirror-polishing one of the thus etched surfaces so that high uniformity of the thickness and greatly decreased warping of the wafer can be ensured.
    Type: Grant
    Filed: April 4, 1983
    Date of Patent: November 1, 1983
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventors: Susumu Sakaguchi, Kenichi Taguchi, Masaaki Iguchi, Kunihiro Ito
  • Patent number: 4001010
    Abstract: Method and apparatus for processing reduced iron in which granular iron oxide charged into a vertical furnace is reduced by a reducing gas comprising mainly carbon monoxide and hydrogen, a substantial portion of the waste gas generated in the reduction process being regenerated in a recirculating system. The reduced iron which has been reduced in the vertical furnace is continuously discharged at a temperature above 500.degree. C under isolation from the exterior atmosphere and is received in a plurality of air tight, sealable component adjusting receptacles. The reduced iron received in the receptacles is subjected to component adjustment at a temperature ranging from 700.degree. to 1100.degree. C by using the regenerated reducing gas and, thereafter, it is discharged from the receptacles under isolation from the exterior atmosphere so as to be received in air tight sealable cooling receptacles thereby cooling the same to a temperature lower than 100.degree.
    Type: Grant
    Filed: August 26, 1974
    Date of Patent: January 4, 1977
    Assignee: Nippon Steel Corporation
    Inventors: Kenjiro Kanbara, Masayuki Hattori, Satoru Miyasita, Masaaki Iguchi, Jihei Yoda