Abstract: Provided is a semiconductor manufacturing apparatus preventing unnecessary chips from flying off when the semiconductor chips are stripped. A semiconductor manufacturing apparatus stripping the semiconductor chips obtained by dividing an approximately circular wafer into small pieces through dicing, from a dicing sheet on one surface of which the wafer including the semiconductor chips is attached, the apparatus including: a stage including protrusions; a dicing sheet holder; and a gas evacuation device evacuating gases from a space between the stage and the dicing sheet, wherein the protrusions include first protrusions each including a tapered portion that is tapered in a cross-sectional view and an end disposed on a center portion that is an approximately circular region in a center of the stage, and at least one second protrusion without any tapered portion which includes an end disposed on a perimeter portion surrounding the center portion in a plan view.

Abstract: An image pickup lens having high reliability is realized. The image pickup lens includes a substrate holding member that holds a flexible substrate. The substrate holding member is fixed with respect to a first surface. The substrate holding member has an opening which is formed therein and in which a polymer lens and a connection part are located in a plan view.

Abstract: A calculation resource cluster that is virtually created on a physical machine by container virtualization software and in which containers virtually created on the physical machine by the container virtualization software are clustered and arranged; and a cluster management unit that is virtually created and manages control related to arrangement and operation of the containers clustered. Further, included are: an abnormality detection unit that is created at an outside of the calculation resource cluster and the cluster management unit that are virtually created and detects an abnormality in the containers; and an abnormality handling unit that is created at the outside and transmits, to the cluster management unit, a command for giving an instruction to stop an abnormal container detected by the abnormality detection unit. The cluster management unit stops the abnormal container in response to the command.

Abstract: A calculation resource cluster that is virtually created on a physical machine by container virtualization software and in which containers virtually created on the physical machine by the container virtualization software are clustered and arranged; and a cluster management unit that is virtually created and manages control related to arrangement and operation of the containers clustered. Further, included are: an abnormality detection unit that is created at an outside of components virtually created and detects an abnormality in the containers; and an abnormality recovery handling unit that is created at the outside and transmits a change command to the cluster management unit at the time of detection by the abnormality detection unit. The cluster management unit sets a distribution ratio of an end point setting unit associated with an abnormal container to 0% in response to the change command.

Abstract: An update control device of a container-based cluster update system constructs a master node in a new container-based cluster and constructs a minimum number of worker nodes required to execute a migration target application. The update control device deletes a migration target application of a container-based cluster in an initial state, deletes a worker node in which no application is installed, adds the worker node to a new container-based cluster, and sequentially migrates the migration target application to perform update.

Abstract: An apparatus for manufacturing semiconductor device includes a pickup apparatus. The pickup apparatus includes: a stage including a plurality of protruding portions disposed so as to face a back surface of a dicing sheet to which a semiconductor chip is attached; and a suction unit configured to vacuum-suck a space between an outer frame, the dicing sheet, and the stage. The plurality of protruding portions includes a plurality of first protruding portions and a plurality of second protruding portions different in height or vertical elastic modulus from each other.

Abstract: A load balancer includes: a request queue that stores a request scheduled to be transmitted to a server; a transmission unit that transmits a request read from the request queue to the server capable of processing the request; a reception unit that receives a completion message indicating that processing of the request is completed; and a completion list that stores the completion message, and the transmission unit discards a request for which the completion message is stored in the completion list without transmitting the request to the server, and transmits, to the server, a request for which the completion message is not stored in the completion list and stores the request again in the request queue.

Abstract: A load balancer (2) includes: a request queue (21) that stores a request scheduled to be transmitted to a server (3); a transmission unit (22) that transmits a request read from the request queue (21) to the server (3) capable of processing the request; a reception unit (24) that receives a completion message indicating that processing of the request is completed; and a completion list (23) that stores the completion message, and the transmission unit (22) discards a request for which the completion message is stored in the completion list (23) without transmitting the request to the server (3), and transmits, to the server (3), a request for which the completion message is not stored in the completion list (23) and stores the request again in the request queue (21).

Abstract: An input capacitance measurement circuit includes a transformer, a first capacitor, a second capacitor, and a third capacitor. A primary wire of the transformer has a first end provided so as to be connectable to an anode of the semiconductor device. The primary wire of the transformer has a second end connected to a first end of the first capacitor. A secondary wire of the transformer has a first end provided so as to be connectable to a cathode of the semiconductor device. The secondary wire of the transformer has a second end connected to a first end of the second capacitor. The third capacitor has a first end provided so as to be connectable to the cathode of the semiconductor device. A second end of the first capacitor, a second end of the second capacitor, and a second end of the third capacitor are electrically connected to each other.

Abstract: According to the present disclosure, a semiconductor manufacturing apparatus comprises a pickup stage having a mechanism for lifting and lowering a semiconductor chip having a square shape. The pickup stage comprises first pushing-up blocks at four corners. Each of the first pushing-up blocks comprises a first side parallel to one side of the semiconductor chip, a second side parallel to another side of the semiconductor chip, and an offset portion formed between the first side and the second side to be offset to an inward side of an intersection point of respective extension lines of the first side and the second side.

Abstract: A semiconductor test apparatus according to the present disclosure includes: a stage on which a wafer is to be mounted; a pressurizing wall disposed on a surface of a probe card opposing the stage, extending toward the stage, and having an opening; a mark disposed on a lower surface of the pressurizing wall opposing the stage; a probe disposed in the opening; an air tube to force air into the opening; a detector to detect first spacing between a tip of the probe and the mark; and a controller to control second spacing between the wafer and the lower surface of the pressurizing wall based on the first spacing, wherein, when an electrical property of each of chips of the wafer is measured, the second spacing is controlled to be predetermined spacing by the controller, and the air is forced into the opening through the air tube.

Abstract: An input capacitance measurement circuit includes a transformer, a first capacitor, a second capacitor, and a third capacitor. A primary wire of the transformer has a first end provided so as to be connectable to an anode of the semiconductor device. The primary wire of the transformer has a second end connected to a first end of the first capacitor. A secondary wire of the transformer has a first end provided so as to be connectable to a cathode of the semiconductor device. The secondary wire of the transformer has a second end connected to a first end of the second capacitor. The third capacitor has a first end provided so as to be connectable to the cathode of the semiconductor device. A second end of the first capacitor, a second end of the second capacitor, and a second end of the third capacitor are electrically connected to each other.

Abstract: A semiconductor test apparatus according to the present disclosure includes: a stage on which a wafer is to be mounted; a pressurizing wall disposed on a surface of a probe card opposing the stage, extending toward the stage, and having an opening; a mark disposed on a lower surface of the pressurizing wall opposing the stage; a probe disposed in the opening; an air tube to force air into the opening; a detector to detect first spacing between a tip of the probe and the mark; and a controller to control second spacing between the wafer and the lower surface of the pressurizing wall based on the first spacing, wherein, when an electrical property of each of chips of the wafer is measured, the second spacing is controlled to be predetermined spacing by the controller, and the air is forced into the opening through the air tube.

Abstract: A supercharging pressure setting apparatus, includes: an engine mounted on a vehicle; a supercharger compressing an intake air introduced to the engine; a supercharger actuator adjusting a supercharging pressure to a target supercharging pressure; and a processor. The processor acquires an intake air amount to the engine; acquires a target intake air amount to the engine; sets the target supercharging pressure based on an operation state of the vehicle; determines whether the operation state of the vehicle is one of an accelerating state and a transition state to the accelerating state; and calculates a difference between the intake air amount and the target intake air amount. The processor sets the target supercharging pressure based on the difference when it is determined that the operation state of the vehicle is one of the accelerating state and the transition state.

Abstract: A supercharging control device of an internal combustion engine includes: a supercharger, disposed in the internal combustion engine, and configured to increase a supercharging pressure by changing a variable nozzle opening degree to a closed side; a supercharging pressure obtaining part, obtaining the supercharging pressure; a limit value setting part, setting a limit value which setting the opening degree of the closed side of the variable nozzle based on a pressure of a side of a turbine of the supercharger; and an opening degree setting part, setting the opening degree of the variable nozzle to the limit value when the supercharging pressure is increased toward a target supercharging pressure, and then gradually setting to an open side.

Abstract: The disclosure provides a supercharging pressure control device of an internal combustion engine capable of effectively suppressing a failure of a device such as an internal combustion engine or a supercharger when a variable nozzle is stuck. A supercharging pressure control device of an internal combustion engine according to the disclosure includes: a supercharger (turbocharger) which is provided in the internal combustion engine (engine) and controls a supercharging pressure by changing an opening degree of a variable nozzle; a rotation speed acquisition part (rotation speed sensor) which acquires a rotation speed (engine rotation speed) of the internal combustion engine; and an opening degree limiting part (ECU) which limits the opening degree of the variable nozzle based on the rotation speed when the acquired rotation speed exceeds a predetermined value.

Abstract: A supercharging pressure setting apparatus, includes: an engine mounted on a vehicle; a supercharger compressing an intake air introduced to the engine; a supercharger actuator adjusting a supercharging pressure to a target supercharging pressure; and a processor. The processor acquires an intake air amount to the engine; acquires a target intake air amount to the engine; sets the target supercharging pressure based on an operation state of the vehicle; determines whether the operation state of the vehicle is one of an accelerating state and a transition state to the accelerating state; and calculates a difference between the intake air amount and the target intake air amount. The processor sets the target supercharging pressure based on the difference when it is determined that the operation state of the vehicle is one of the accelerating state and the transition state.

Abstract: A control device of a vehicle capable of improving acceleration responsiveness and suppressing increase in the NOx emission amount when a required torque is increased during a steady lean operation. A target air-fuel ratio (AFCMD) is set according to an accelerator pedal operation of a driver. When the driver depresses an accelerator pedal to make an acceleration request during the lean operation, in which the AFCMD is set to a predetermined lean air-fuel ratio (AFLN), air-fuel ratio reduction control is executed to reduce the AFCMD according to the acceleration request. In the air-fuel ratio reduction control, when the AFCMD calculated according to a required torque (TRQCMD) is smaller than a limit air-fuel ratio (AFLMT), the AFCMD is set to the AFLMT, and the AFLMT is set to a value smaller than the AFLN set in a steady state of the lean operation and larger than a theoretical air-fuel ratio (AFST).

Abstract: A control device of an internal-combustion engine capable of improving merchantability by promptly and appropriately securing an in-cylinder fresh air amount even when an internal-combustion engine including a boost device and an EGR device is in a transient operation state is provided. A control device 1 includes an ECU 2. The ECU 2 calculates an intake air amount GGAScyl, sets an upper-limit target fresh air amount GAIR_hisH, controls a boost operation of a boost device 7 when an operating range of an internal-combustion engine 3 is in a predetermined boost range, and controls an EGR device 5 so that exhaust gas recirculation is stopped when the intake air amount GGAScyl does not reach an upper-limit target fresh air amount GAIR_hisH and the exhaust gas recirculation is executed when the intake air amount GGAScyl reaches the upper-limit target fresh air amount GAIR_hisH in the predetermined boost range.

Abstract: A stacked body includes: a substrate made of silicon carbide and having a first main surface forming an angle of 20° or less with a silicon plane; and a graphene film disposed on the first main surface and having an atomic arrangement oriented in relation to an atomic arrangement of silicon carbide forming the substrate. In an exposed surface of the graphene film which is a main surface opposite to the substrate, an area ratio of a region having a full width at half maximum of G? of 40 cm?1 or less under Raman spectroscopy analysis is 50% or more. Accordingly, the stacked body is provided that enables a high mobility to be stably ensured in an electronic device manufactured to include the graphene film forming an electrically conductive portion.