Patents by Inventor Masanori Niiya

Masanori Niiya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for measuring thickness of layer on substance
    Patent number: 4745291
    Abstract: A surface layer thickness measuring apparatus lower in price with the use of a light ray measuring system only. The correct surface layer thickness may be measured, independently of the variation in the temperature of the measured, in the external light rays, in the radiation energy of the reference light ray source, in the chopper temperature, the influences by the temperature in the surface layer thickness measuring apparatus, through the mode combination by the driving operation of the opening and closing device and the total reflection mirror.
    Type: Grant
    Filed: March 31, 1987
    Date of Patent: May 17, 1988
    Assignee: Chugai Ro Co., Ltd.
    Inventor: Masanori Niiya