Abstract: A temporary fixation substrate having one main surface to which a plurality of electronic components adhere and are temporarily fixed by a resin mold has a chamfered region at an end over an entire circumference of each of the one main surface and the other main surface, and an arithmetic average roughness of the chamfered region at least on a side of the one main surface is 0.1 ?m to 10 ?m and is greater than an arithmetic average roughness of the one main surface.

Abstract: A laser processing apparatus disclosed in the present application includes: an optical deflection unit capable of changing a deflection direction of and outgoing energy of an incoming laser pulse by changes of a frequency of and an amplitude of a driving signal to be supplied; and a control unit configured to supply driving signals with amplitudes corresponding to respective frequencies. In a laser processing apparatus configured to process a workpiece by leading outgoing laser pulse of the optical deflection unit to the workpiece and irradiating the workpiece with the laser pulse, as the amplitude corresponding to each of the frequencies, the control unit supplies an amplitude having the ratio that is close to the lowest ratio among ratios of the outgoing energy with respect to the incoming energy of the laser pulse at an amplitude having the largest outgoing energy of the optical deflection unit.

Abstract: A solid-state imaging apparatus includes: a pixel array section in which pixels including photoelectric conversion elements are two-dimensionally arranged in a matrix form, and a plurality of systematic pixel drive lines to transmit drive signals to read out signals from the pixels are arranged for each pixel row; and a row scanning section to simultaneously output the drive signals through the plurality of systematic pixel drive lines to a plurality of pixel rows for different pixel columns.

Abstract: A laser processing apparatus disclosed in the present application includes: an optical deflection unit capable of changing a deflection direction of and outgoing energy of an incoming laser pulse by changes of a frequency of and an amplitude of a driving signal to be supplied; and a control unit configured to supply driving signals with amplitudes corresponding to respective frequencies. In a laser processing apparatus configured to process a workpiece by leading outgoing laser pulse of the optical deflection unit to the workpiece and irradiating the workpiece with the laser pulse, as the amplitude corresponding to each of the frequencies, the control unit supplies an amplitude having the ratio that is close to the lowest ratio among ratios of the outgoing energy with respect to the incoming energy of the laser pulse at an amplitude having the largest outgoing energy of the optical deflection unit.

Abstract: A solid-state imaging apparatus includes: a pixel array section in which pixels including photoelectric conversion elements are two-dimensionally arranged in a matrix form, and a plurality of systematic pixel drive lines to transmit drive signals to read out signals from the pixels are arranged for each pixel row; and a row scanning section to simultaneously output the drive signals through the plurality of systematic pixel drive lines to a plurality of pixel rows for different pixel columns.

Abstract: In a reference signal comparison AD conversion scheme, a reference signal SLP_ADC and each of P and D phases of a pixel signal voltage Vx are compared. A count clock CKcnt1 is counted based on the comparison result. The counting result data is converted into signal data Dsig, i.e., the difference between the P and D phases, which is also subjected to CDS. At this time, the n-bit AD conversion is performed on each of the P and D phases of the pixel signal voltage Vx, followed by summation for digital integration. This prevents any possible detrimental effects that may be caused by summation in the analog domain. Although the signal data becomes W times greater, noise will likely become ?W times greater. This alleviates the problem of random noise resulting from AD conversion such as quantizing noise and circuit noise that do not exist in the analog domain, thus reducing the noise.

Abstract: In a reference signal comparison AD conversion scheme, a reference signal SLP_ADC and each of P and D phases of a pixel signal voltage Vx are compared. A count clock CKcnt1 is counted based on the comparison result. The counting result data is converted into signal data Dsig, i.e., the difference between the P and D phases, which is also subjected to CDS. At this time, the n-bit AD conversion is performed on each of the P and D phases of the pixel signal voltage Vx, followed by summation for digital integration. This prevents any possible detrimental effects that may be caused by summation in the analog domain. Although the signal data becomes W times greater, noise will likely become ?W times greater. This alleviates the problem of random noise resulting from AD conversion such as quantizing noise and circuit noise that do not exist in the analog domain, thus reducing the noise.

Abstract: In a reference signal comparison AD conversion scheme, a reference signal SLP_ADC and each of P and D phases of a pixel signal voltage VX are compared. A count clock CKcnt1 is counted based on the comparison result. The counting result data is converted into signal data Dsig, i.e., the difference between the P and D phases, which is also subjected to CDS. At this time, the n-bit AD conversion is performed on each of the P and D phases of the pixel signal voltage VX, followed by summation for digital integration. This prevents any possible detrimental effects that may be caused by summation in the analog domain. Although the signal data becomes W times greater, noise will likely become ?W times greater. This alleviates the problem of random noise resulting from AD conversion such as quantizing noise and circuit noise that do not exist in the analog domain, thus reducing the noise.

Abstract: A solid-state imaging apparatus includes: a pixel array section in which pixels including photoelectric conversion elements are two-dimensionally arranged in a matrix form, and a plurality of systematic pixel drive lines to transmit drive signals to read out signals from the pixels are arranged for each pixel row; and a row scanning section to simultaneously output the drive signals through the plurality of systematic pixel drive lines to a plurality of pixel rows for different pixel columns.

Abstract: A solid-state imaging device includes plural photoelectric conversion means arranged along light receiving surfaces, readout means for reading out signal charge generated in the photoelectric conversion means, a voltage supply means for supplying various levels of voltages to respective units including the photoelectric conversion means and the readout means, a detection means for detecting level change of a prescribed supply voltage in supply voltages by the voltage supply means and a control means for controlling so that the level change is converged when level change of the prescribed supply voltage is detected by the detection means.

Abstract: A solid-state imaging apparatus includes a comparator for comparing a pixel signal obtained by a pixel section and a reference signal the value of which varies in a stepwise manner, an analog-digital converter for outputting, as a digital value, the amount of time when the pixel signal and the reference signal change levels by the comparator; a reset signal generator for generating a reset signal that triggers a reset operation to be input to the comparator in order to adjust the reference in the analog-digital converter, and a waveform processor provided between the reset signal generator and the comparator for increasing the degree of dullness of a waveform of the reset signal.

Abstract: In a reference signal comparison AD conversion scheme, a reference signal SLP_ADC and each of P and D phases of a pixel signal voltage VX are compared. A count clock CKcnt1 is counted based on the comparison result. The counting result data is converted into signal data Dsig, i.e., the difference between the P and D phases, which is also subjected to CDS. At this time, the n-bit AD conversion is performed on each of the P and D phases of the pixel signal voltage VX, followed by summation for digital integration. This prevents any possible detrimental effects that may be caused by summation in the analog domain. Although the signal data becomes W times greater, noise will likely become ?W times greater. This alleviates the problem of random noise resulting from AD conversion such as quantizing noise and circuit noise that do not exist in the analog domain, thus reducing the noise.

Abstract: A solid-state imaging apparatus includes: a pixel array section in which pixels including photoelectric conversion elements are two-dimensionally arranged in a matrix form, and a plurality of systematic pixel drive lines to transmit drive signals to read out signals from the pixels are arranged for each pixel row; and a row scanning section to simultaneously output the drive signals through the plurality of systematic pixel drive lines to a plurality of pixel rows for different pixel columns.

Abstract: A timing adjustment circuit includes at least one data line; a phase synchronization circuit that includes a plurality of oscillation delay elements which oscillate an oscillation signal, and that is configured to oscillate the oscillation signal by synchronizing a phase of a feedback clock with a phase of a reference clock; at least one delay circuit that includes a delay element which is disposed on the data line and which is equivalent to one of the plurality of oscillation delay elements, and that is configured to delay data which is to be transmitted on the data line; and a delay adjustment unit configured to adjust an amount of delay of the delay element of the delay circuit in accordance with a signal associated with oscillation of the phase synchronization circuit.

Abstract: In a reference signal comparison AD conversion scheme, a reference signal SLP_ADC and each of P and D phases of a pixel signal voltage Vx are compared. A count clock CKcnt1 is counted based on the comparison result. The counting result data is converted into signal data Dsig, i.e., the difference between the P and D phases, which is also subjected to CDS. At this time, the n-bit AD conversion is performed on each of the P and D phases of the pixel signal voltage Vx, followed by summation for digital integration. This prevents any possible detrimental effects that may be caused by summation in the analog domain. Although the signal data becomes W times greater, noise will likely become ?W times greater. This alleviates the problem of random noise resulting from AD conversion such as quantizing noise and circuit noise that do not exist in the analog domain, thus reducing the noise.

Abstract: A timing adjustment circuit includes at least one data line; a phase synchronization circuit that includes a plurality of oscillation delay elements which oscillate an oscillation signal, and that is configured to oscillate the oscillation signal by synchronizing a phase of a feedback clock with a phase of a reference clock; at least one delay circuit that includes a delay element which is disposed on the data line and which is equivalent to one of the plurality of oscillation delay elements, and that is configured to delay data which is to be transmitted on the data line; and a delay adjustment unit configured to adjust an amount of delay of the delay element of the delay circuit in accordance with a signal associated with oscillation of the phase synchronization circuit.

Abstract: A timing adjustment circuit includes at least one data line; a phase synchronization circuit that includes a plurality of oscillation delay elements which oscillate an oscillation signal, and that is configured to oscillate the oscillation signal by synchronizing a phase of a feedback clock with a phase of a reference clock; at least one delay circuit that includes a delay element which is disposed on the data line and which is equivalent to one of the plurality of oscillation delay elements, and that is configured to delay data which is to be transmitted on the data line; and a delay adjustment unit configured to adjust an amount of delay of the delay element of the delay circuit in accordance with a signal associated with oscillation of the phase synchronization circuit.

Abstract: A timing adjustment circuit includes at least one data line; a phase synchronization circuit that includes a plurality of oscillation delay elements which oscillate an oscillation signal, and that is configured to oscillate the oscillation signal by synchronizing a phase of a feedback clock with a phase of a reference clock; at least one delay circuit that includes a delay element which is disposed on the data line and which is equivalent to one of the plurality of oscillation delay elements, and that is configured to delay data which is to be transmitted on the data line; and a delay adjustment unit configured to adjust an amount of delay of the delay element of the delay circuit in accordance with a signal associated with oscillation of the phase synchronization circuit.

Abstract: A timing adjustment circuit includes at least one data line; a phase synchronization circuit that includes a plurality of oscillation delay elements which oscillate an oscillation signal, and that is configured to oscillate the oscillation signal by synchronizing a phase of a feedback clock with a phase of a reference clock; at least one delay circuit that includes a delay element which is disposed on the data line and which is equivalent to one of the plurality of oscillation delay elements, and that is configured to delay data which is to be transmitted on the data line; and a delay adjustment unit configured to adjust an amount of delay of the delay element of the delay circuit in accordance with a signal associated with oscillation of the phase synchronization circuit.

Abstract: A solid-state imaging apparatus includes a comparator for comparing a pixel signal obtained by a pixel section and a reference signal the value of which varies in a stepwise manner, an analog-digital converter for outputting, as a digital value, the amount of time when the pixel signal and the reference signal change levels by the comparator; a reset signal generator for generating a reset signal that triggers a reset operation to be input to the comparator in order to adjust the reference in the analog-digital converter, and a waveform processor provided between the reset signal generator and the comparator for increasing the degree of dullness of a waveform of the reset signal.