Abstract: A distance-measuring imaging device includes: a drive controller that outputs a light emission control signal for instructing emission of pulsed light and an exposure control signal for instructing exposure to reflected light; an image capturer that includes a plurality of pixels and outputs an exposure signal of each of the plurality of pixels that has been exposed at a timing of the exposure control signal; a pixel calculator that generates a composite signal with a pixel filter that combines exposure signals of adjacent pixels among the plurality of pixels using a weight coefficient for the exposure signal; and a time-of-flight (TOF) calculator that generates a distance image, based on the composite signal. The pixel calculator includes at least two pixel filters having different composite scale factors, and selects the pixel filter from the at least two pixel filters.

Abstract: A solid-state image sensing element (1) has a main face provided with an imaging region (1a) in which unit pixels containing photoelectric conversion elements are formed in matrix. Peripheral circuit elements (3, 4) are configured to control imaging operation of the solid-state image sensing element (1) or to perform signal processing of an image output of the solid-state image sensing element (1). The imaging region (1a) is covered with a transparent material (2). The peripheral circuit elements (3, 4) are mounted to a region of the main face of the solid-state image sensing element (1) except for the imaging region (1a) such that main faces of the peripheral circuit elements (3, 4) face the main face of the solid-state image sensing element (1).

Abstract: A solid-state imaging device which can, in response to the problem of black-crush occurring in an image when strong light is enters the device, positively detect black-crush in a state in which a variance margin has been secured.

Abstract: An imaging device outputs brightness information according to an amount of incident light and includes: an imaging unit that includes a plurality of unit cells arranged one dimensionally or two-dimensionally, each unit cell including a photoelectric conversion part that generates a first output voltage in a reset state and a second output voltage according to an amount of incident light, and each unit cell generating a reset voltage that corresponds to the first output voltage and a read voltage that corresponds to the second output voltage; and an output unit operable to output, in relation to each unit cell, brightness information indicating a difference between the reset voltage and the read voltage when normal light is incident to the imaging device and the read voltage is in a predetermined range, and brightness information indicating high brightness when strong light is incident to the imaging device and the read voltage is not in the predetermined range.

Abstract: A solid-state imaging device includes first-group pixels 41, second-group pixels 42 skipped during thinning drive, and a scanning section 13. The scanning section 13 drives each of the first-group pixels 41 to perform read operation of outputting the output signal and initializing the amount of the signal charge accumulated in the photoelectric conversion element to a first level, and also drives each of the second-group pixels 42 to perform discharge operation of initializing the amount of the signal charge accumulated in the photoelectric conversion element to a second level that is higher than the first level and lower than a saturation signal level of the photoelectric conversion element 12.

Abstract: An amplification type solid state imaging device in use includes at least a light-receiving portion 10 formed by arranging on a semiconductor substrate 7 one-dimensionally or two-dimensionally a plurality of pixels that convert incident light to signal charge and output electric signals corresponding to the amount of the signal charge, a reader for reading out sequentially the electric signals from the respective pixels, a noise rejection circuit 11 for suppressing spurious signals for the electric signals read out by the reader, and a first light-shielding layer 1 positioned on the upper part of the light-receiving portion 10 so as to restrict entry of light into parts other than photoelectric conversion portions 10a of the pixels. Furthermore, a second light-shielding layer 2 for restricting entry of light into the noise rejection circuit 11 is provided on the upper part of the noise rejection circuit 11.

Abstract: By providing dummy pixels separately from effective pixels, the total number of pixel rows is equalized with the number of horizontal sync signals included in one frame interval (which is called an “HD number”). A period during which a reset signal for an electronic shuttering operation is being supplied to an arbitrary pixel row overlaps with a period during which another pixel row is selected to perform a readout operation thereon. Thus, it is possible to suppress a variation in reset potential among effective pixels.

Abstract: A solid-state imaging device includes first-group pixels 41, second-group pixels 42 skipped during thinning drive, and a scanning section 13. The scanning section 13 drives each of the first-group pixels 41 to perform read operation of outputting the output signal and initializing the amount of the signal charge accumulated in the photoelectric conversion element to a first level, and also drives each of the second-group pixels 42 to perform discharge operation of initializing the amount of the signal charge accumulated in the photoelectric conversion element to a second level that is higher than the first level and lower than a saturation signal level of the photoelectric conversion element 12.

Abstract: A high dynamic range solid-state image pickup device is provided with a plurality of unit cells, which convert light into signal charges and accumulate the signal charges. The unit cells are arranged by rows and columns for outputting a signal voltage corresponding to the signal charges. A selector and a read transistor set an accumulation time period for accumulating the signal charges in the unit cells to a first period and a second period different from each other. The row selector and a vertical selection transistor select a row. Sampling capacitors (210a, 210b) are connected to the unit cell of each column. A pulse generator and sampling transistors select an arbitrary sampling capacitor from the sampling capacitors. The pulse generator and the sampling transistors perform selection so as to accumulate the signal voltage corresponding to the signal charges accumulated during the first period and the second period in the sampling capacitors, respectively.

Abstract: A solid-state imaging device includes first-group pixels 41, second-group pixels 42 skipped during thinning drive, and a scanning section 13. The scanning section 13 drives each of the first-group pixels 41 to perform read operation of outputting the output signal and initializing the amount of the signal charge accumulated in the photoelectric conversion element to a first level, and also drives each of the second-group pixels 42 to perform discharge operation of initializing the amount of the signal charge accumulated in the photoelectric conversion element to a second level that is higher than the first level and lower than a saturation signal level of the photoelectric conversion element 12.

Abstract: A solid-state image sensing element (1) has a main face provided with an imaging region (1a) in which unit pixels containing photoelectric conversion elements are formed in matrix. Peripheral circuit elements (3, 4) are configured to control imaging operation of the solid-state image sensing element (1) or to perform signal processing of an image output of the solid-state image sensing element (1). The imaging region (1a) is covered with a transparent material (2). The peripheral circuit elements (3, 4) are mounted to a region of the main face of the solid-state image sensing element (1) except for the imaging region (1a) such that main faces of the peripheral circuit elements (3, 4) face the main face of the solid-state image sensing element (1).

Abstract: An imaging device outputs brightness information according to an amount of incident light and includes: an imaging unit that includes a plurality of unit cells arranged one dimensionally or two-dimensionally, each unit cell including a photoelectric conversion part that generates a first output voltage in a reset state and a second output voltage according to an amount of incident light, and each unit cell generating a reset voltage that corresponds to the first output voltage and a read voltage that corresponds to the second output voltage; and an output unit operable to output, in relation to each unit cell, brightness information indicating a difference between the reset voltage and the read voltage when normal light is incident to the imaging device and the read voltage is in a predetermined range, and brightness information indicating high brightness when strong light is incident to the imaging device and the read voltage is not in the predetermined range.

Abstract: A solid-state imaging device which can, in response to the problem of black-crush occurring in an image when strong light is enters the device, positively detect black-crush in a state in which a variance margin has been secured.

Abstract: An imaging device outputs brightness information according to an amount of incident light and includes: an imaging unit that includes a plurality of unit cells arranged one dimensionally or two-dimensionally, each unit cell including a photoelectric conversion part that generates a first output voltage in a reset state and a second output voltage according to an amount of incident light, and each unit cell generating a reset voltage that corresponds to the first output voltage and a read voltage that corresponds to the second output voltage; and an output unit operable to output, in relation to each unit cell, brightness information indicating a difference between the reset voltage and the read voltage when normal light is incident to the imaging device and the read voltage is in a predetermined range, and brightness information indicating high brightness when strong light is incident to the imaging device and the read voltage is not in the predetermined range.

Abstract: By providing dummy pixels separately from effective pixels, the total number of pixel rows is equalized with the number of horizontal sync signals included in one frame interval (which is called an “HD number”). A period during which a reset signal for an electronic shuttering operation is being supplied to an arbitrary pixel row overlaps with a period during which another pixel row is selected to perform a readout operation thereon. Thus, it is possible to suppress a variation in reset potential among effective pixels.

Abstract: An amplification type solid state imaging device in use includes at least a light-receiving portion 10 formed by arranging on a semiconductor substrate 7 one-dimensionally or two-dimensionally a plurality of pixels that convert incident light to signal charge and output electric signals corresponding to the amount of the signal charge, a reader for reading out sequentially the electric signals from the respective pixels, a noise rejection circuit 11 for suppressing spurious signals for the electric signals read out by the reader, and a first light-shielding layer 1 positioned on the upper part of the light-receiving portion 10 so as to restrict entry of light into parts other than photoelectric conversion portions 10a of the pixels. Furthermore, a second light-shielding layer 2 for restricting entry of light into the noise rejection circuit 11 is provided on the upper part of the noise rejection circuit 11.

Abstract: An amplification type solid state imaging device in use includes at least a light-receiving portion 10 formed by arranging on a semiconductor substrate 7 one-dimensionally or two-dimensionally a plurality of pixels that convert incident light to signal charge and output electric signals corresponding to the amount of the signal charge, a reader for reading out sequentially the electric signals from the respective pixels, a noise rejection circuit 11 for suppressing spurious signals for the electric signals read out by the reader, and a first light-shielding layer 1 positioned on the upper part of the light-receiving portion 10 so as to restrict entry of light into parts other than photoelectric conversion portions 10a of the pixels. Furthermore, a second light-shielding layer 2 for restricting entry of light into the noise rejection circuit 11 is provided on the upper part of the noise rejection circuit 11.

Abstract: A solid-state image sensing apparatus which can improve the S/N ratio without enlarging the chip area in both of the mode in which pixel signals are summed and the mode in which pixel signals are not summed is provided. The solid-state image sensing apparatus includes an image sensing region 510 in which a plurality of unit cells 500 is laid out two-dimensionally, the first vertical signal line 520, a row selection circuit 530, a column selection circuit 560, a horizontal signal line 570 and a signal processing unit 100, having a sampling capacitors which accumulate signals corresponding to amplified signals of the unit cells, which selects the case of summing the signals or the case of not summing the signals, wherein the capacitance of the sampling capacitor which accumulates a signal corresponding to an amplified signal of a unit cell for each row when the sum is performed is smaller than the capacitance required for reading out the signal from said capacitor.

Abstract: By providing dummy pixels separately from effective pixels, the total number of pixel rows is equalized with the number of horizontal sync signals included in one frame interval (which is called an “HD number”). A period during which a reset signal for an electronic shuttering operation is being supplied to an arbitrary pixel row overlaps with a period during which another pixel row is selected to perform a readout operation thereon. Thus, it is possible to suppress a variation in reset potential among effective pixels.

Abstract: A solid-state imaging device which can, in response to the problem of black-crush occurring in an image when strong light is enters the device, positively detect black-crush in a state in which a variance margin has been secured.