Patents by Inventor Maxime Beaudoin Pouliot

Maxime Beaudoin Pouliot has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11635346
    Abstract: A first nest structure and a second nest structure are brought into alignment. When the alignment of the first nest structure and second nest structure is obtained, the operation of at least one vacuum pump is controlled such that a bearing element is released from the first nest structure and secured in the second nest structure. Movement of the bearing element from the first nest structure to the second nest structure occurs without slippage resulting in preservation of a common frame of reference used when the bearing element is in the first nest structure and the second nest structure.
    Type: Grant
    Filed: February 1, 2022
    Date of Patent: April 25, 2023
    Assignee: General Electric Company
    Inventors: Jessen Compagnat, Marc Andre Ethier, Maxime Beaudoin-Pouliot, John Karigiannis, Stephane Harel
  • Patent number: 10746667
    Abstract: An inspection system includes an imaging device, visible light source, ultraviolet light source, and at least one processor. The imaging device generates a first image set of a work piece while the ultraviolet light source illuminates the work piece with ultraviolet light to cause fluorescent dye thereon to emit light, and generates a second image set of the work piece while the visible light source illuminates the work piece with visible light. The first and second image sets are generated at the same positions of the imaging device relative to the work piece. The processor maps the second image set to a computer design model of the work piece based on features depicted in the second image set and the positions of the imaging device. The processor determines a defect location on the work piece based on an analysis of the first image set and the computer design model.
    Type: Grant
    Filed: November 27, 2018
    Date of Patent: August 18, 2020
    Assignee: General Electric Company
    Inventors: Xiao Bian, John Karigiannis, Stephane Harel, Steeves Bouchard, Maxime Beaudoin Pouliot, Wayne Grady, David Scott Diwinsky, Bernard Patrick Bewlay
  • Publication number: 20200166467
    Abstract: An inspection system includes an imaging device, visible light source, ultraviolet light source, and at least one processor. The imaging device generates a first image set of a work piece while the ultraviolet light source illuminates the work piece with ultraviolet light to cause fluorescent dye thereon to emit light, and generates a second image set of the work piece while the visible light source illuminates the work piece with visible light. The first and second image sets are generated at the same positions of the imaging device relative to the work piece. The processor maps the second image set to a computer design model of the work piece based on features depicted in the second image set and the positions of the imaging device. The processor determines a defect location on the work piece based on an analysis of the first image set and the computer design model.
    Type: Application
    Filed: November 27, 2018
    Publication date: May 28, 2020
    Inventors: Xiao Bian, John Karigiannis, Stephane Harel, Steeves Bouchard, Maxime Beaudoin Pouliot, Wayne Grady, David Scott Diwinsky, Bernard Patrick Bewlay
  • Patent number: 10060857
    Abstract: A system includes one or more processors configured to create a projection matrix based on a three-dimensional (3D) model of a part and sensor data associated with a workpiece in a workspace of a robotic manipulator. The projection matrix provides a mapping between sensor coordinates associated with the sensor data and 3D coordinates associated with the 3D model. The one or more processors are configured to identify a set of sensor coordinates from the sensor data corresponding to a feature indication associated with the workpiece, and to determine from the set of sensor coordinates a set of 3D coordinates using the projection matrix.
    Type: Grant
    Filed: November 16, 2017
    Date of Patent: August 28, 2018
    Assignee: General Electric Company
    Inventors: Steeves Bouchard, Stephane Harel, John Karigiannis, Nicolas Saudrais, David Cantin, Ser Nam Lim, Maxime Beaudoin Pouliot, Jean-Philippe Choiniere