Patents by Inventor Michael G. Forbes

Michael G. Forbes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11449046
    Abstract: A method includes obtaining operating data associated with operation of a cross-directional industrial process controlled by at least one model-based process controller. The method also includes, during a training period, performing closed-loop model identification with a first portion of the operating data to identify multiple sets of first spatial and temporal models. The method further includes identifying clusters associated with parameter values of the first spatial and temporal models. The method also includes, during a testing period, performing closed-loop model identification with a second portion of the operating data to identify second spatial and temporal models. The method further includes determining whether at least one parameter value of at least one of the second spatial and temporal models falls outside at least one of the clusters.
    Type: Grant
    Filed: June 1, 2017
    Date of Patent: September 20, 2022
    Assignee: Honeywell Limited
    Inventors: Qiugang Lu, R. Bhushan Gopaluni, Michael G. Forbes, Philip D. Loewen, Johan U. Backstrom, Guy A. Dumont
  • Patent number: 10809674
    Abstract: A method includes repeatedly identifying one or more values for one or more model parameters of at least one model associated with a process. The one or more values for the one or more model parameters are identified using data associated with the process. The method also includes clustering the values of the one or more model parameters into one or more clusters. The method further includes identifying one or more additional values for the one or more model parameters using additional data associated with the process. In addition, the method includes detecting a mismatch between the at least one model and the process in response to determining that at least some of the one or more additional values fall outside of the one or more clusters. The values could be clustered using a support vector machine.
    Type: Grant
    Filed: June 28, 2017
    Date of Patent: October 20, 2020
    Assignee: Honeywell Limited
    Inventors: Qiugang Lu, R. Bhushan Gopaluni, Michael G. Forbes, Philip D. Loewen, Johan U. Backstrom, Guy A. Dumont
  • Patent number: 10761522
    Abstract: A method includes obtaining closed-loop data associated with operation of an industrial process controller, where the industrial process controller is configured to control at least part of an industrial process using at least one model. The method also includes generating at least one noise model associated with the industrial process controller using at least some of the closed-loop data. The method further includes filtering the closed-loop data based on the at least one noise model. In addition, the method includes generating one or more model parameters for the industrial process controller using the filtered closed-loop data.
    Type: Grant
    Filed: June 28, 2017
    Date of Patent: September 1, 2020
    Assignee: Honeywell Limited
    Inventors: Qiugang Lu, Lee D. Rippon, R. Bhushan Gopaluni, Michael G. Forbes, Philip D. Loewen, Johan U. Backstrom, Guy A. Dumont
  • Publication number: 20180081349
    Abstract: A method includes obtaining operating data associated with operation of a cross-directional industrial process controlled by at least one model-based process controller. The method also includes, during a training period, performing closed-loop model identification with a first portion of the operating data to identify multiple sets of first spatial and temporal models. The method further includes identifying clusters associated with parameter values of the first spatial and temporal models. The method also includes, during a testing period, performing closed-loop model identification with a second portion of the operating data to identify second spatial and temporal models. The method further includes determining whether at least one parameter value of at least one of the second spatial and temporal models falls outside at least one of the clusters.
    Type: Application
    Filed: June 1, 2017
    Publication date: March 22, 2018
    Inventors: Qiugang Lu, R. Bhushan Gopaluni, Michael G. Forbes, Philip D. Loewen, Johan U. Backstrom, Guy A. Dumont
  • Publication number: 20180081328
    Abstract: A method includes repeatedly identifying one or more values for one or more model parameters of at least one model associated with a process. The one or more values for the one or more model parameters are identified using data associated with the process. The method also includes clustering the values of the one or more model parameters into one or more clusters. The method further includes identifying one or more additional values for the one or more model parameters using additional data associated with the process. In addition, the method includes detecting a mismatch between the at least one model and the process in response to determining that at least some of the one or more additional values fall outside of the one or more clusters. The values could be clustered using a support vector machine.
    Type: Application
    Filed: June 28, 2017
    Publication date: March 22, 2018
    Inventors: Qiugang Lu, R. Bhushan Gopaluni, Michael G. Forbes, Philip D. Loewen, Johan U. Backstrom, Guy A. Dumont
  • Publication number: 20180081348
    Abstract: A method includes obtaining closed-loop data associated with operation of an industrial process controller, where the industrial process controller is configured to control at least part of an industrial process using at least one model. The method also includes generating at least one noise model associated with the industrial process controller using at least some of the closed-loop data. The method further includes filtering the closed-loop data based on the at least one noise model. In addition, the method includes generating one or more model parameters for the industrial process controller using the filtered closed-loop data.
    Type: Application
    Filed: June 28, 2017
    Publication date: March 22, 2018
    Inventors: Qiugang Lu, Lee D. Rippon, R. Bhushan Gopaluni, Michael G. Forbes, Philip D. Loewen, Johan U. Backstrom, Guy A. Dumont