Patents by Inventor Michael L. Dupuis

Michael L. Dupuis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10859348
    Abstract: A beam directing telescope for use in a directed energy weapons system that employs active telescope component alignment and that includes a primary mirror and a secondary mirror. The secondary mirror includes a first surface having a dichroic coating that reflects and directs a high energy laser beam to the primary mirror, reflects a portion of the reference beams and passes a portion of the reference beams that are focused by a second surface of the secondary mirror. A position sensing detector (PSD) is positioned relative to the secondary mirror such that the reference beams are focused as a spot on the PSD, where the PSD senses a position of the reference beams. An actuator changes the orientation of the secondary mirror to an alignment position if the position of the focused spots on the PSD is not the position for a desired alignment of the mirrors.
    Type: Grant
    Filed: July 2, 2018
    Date of Patent: December 8, 2020
    Assignee: NORTHROP GRUMMAN SYSTEMS CORPORATION
    Inventors: Michael L. Dupuis, Joshua E. Rothenberg, Philip H. Maki, Gregory E. Foo, Christopher J. Lieto
  • Patent number: 10520360
    Abstract: A beam quality measurement system for determining beam quality of a high power laser beam from a laser system by power-in-the-bucket (PIB) measurements in a laboratory environment. The system includes a beam compressor assembly for compressing the diameter of the laser beam, and a diagnostic bench assembly that receives the reduced diameter low power beam from the beam compressor assembly. The bench assembly includes a pinhole array positioned at a focal plane of a lens and that includes a plurality of different sized pinholes and a translation stage for moving the pinhole array. The bench assembly also includes a power meter that receives the focused beam after it has passed through a pinhole in the pinhole array, where the power meter generates a signal that causes the stage to move the pinhole array to position another pinhole when the power meter identifies a maximum power received from one pinhole.
    Type: Grant
    Filed: July 31, 2018
    Date of Patent: December 31, 2019
    Assignee: Northrop Grumman Systems Corporation
    Inventors: Michael L. Dupuis, Daniel K. Smith, Daniel Lam, Christopher J. Lieto, Michael E. Farey, Joshua E. Rothenberg