Patents by Inventor Mihir K. Ravel

Mihir K. Ravel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6507624
    Abstract: A bandpass sampling system (10) of this invention employs a conventional mixer (14) driven by a frequency-tunable LO (16) to upconvert a signal frequency band to an IF frequency band that is above the signal frequency band. The IF frequency band is passed through an IF bandpass filter (18) to provide to subsequent digitization stages (20, 24) an IF bandpass range of signal frequency components. In this architecture, the IF bandpass filter acts as an anti-alias filter for the digitization stages. The LO frequency is selected to place the upconverted signal frequency band within the pass band of the IF bandpass filter. The resultant IF bandpass signal is sampled and digitized at a rate that is commensurate with the IF bandwidth, but typically much lower than the IF bandpass center frequency. Signal sampling is carried out by a sample-and-hold or a track-and-hold circuit (20), the output of which is applied to an ADC (24) that is clocked (22) at the same rate as the sampling circuit.
    Type: Grant
    Filed: April 21, 1999
    Date of Patent: January 14, 2003
    Assignee: Tektronix, Inc.
    Inventors: Stephen P. Jachim, Mihir K. Ravel, Steven H. Pepper
  • Patent number: 5488866
    Abstract: A time-interleaved method for efficient operation of an acoustic wave sensor array couples each sensor repetitively and one at a time via a digitally-addressable analog switch, or multiplexer, to a single oscillator driver to form an oscillation circuit. A frequency of oscillation for each acoustic wave sensor is determined. The frequency for each acoustic wave sensor then is converted into a measurement value for the parameter to which each acoustic wave sensor is sensitive.
    Type: Grant
    Filed: April 11, 1994
    Date of Patent: February 6, 1996
    Assignee: Tektronix, Inc.
    Inventors: Mihir K. Ravel, Steven H. Pepper
  • Patent number: 5412330
    Abstract: An optical module for an optically based measurement system, such as an electro-optic system (10) for measuring electrical characteristics of a device under test (14), has a probe arm (26), a layer of electro-optic material (27), and a first optical system for delivering a measurement beam (44) to the layer and for producing therefrom an information-carrying beam having optical characteristics indicative of the electric characteristics. The first optical system includes a first lens (128), and (optional) polarization bias adjustment (130), a dichroic beamsplitter (112), and a second lens (114). The module also has a second optical system for delivering an observation beam (66) through the layer and onto a portion (68) of the device and for forming from rays (69) stemming from the observation beam a light pattern (70) indicative of the portion. The information-carrying beam is analyzed in a polarization analysis module into component beams (136, 138) in respective linearly independent polarization states.
    Type: Grant
    Filed: June 16, 1993
    Date of Patent: May 2, 1995
    Assignee: Tektronix, Inc.
    Inventors: Mihir K. Ravel, Michael D. Jones, Steven H. Pepper
  • Patent number: 5406829
    Abstract: A temperature control system for acoustic wave chemical sensors monitors the frequency output from a reference sensor packaged within a heat conductive case with a test sensor. Since the frequency output fluctuates as a function of temperature, variations in frequency from a nominal value representing a desired steady state temperature for the sensors are detected and used as a control signal for a heating element attached to the heat conductive case.
    Type: Grant
    Filed: April 19, 1994
    Date of Patent: April 18, 1995
    Assignee: Tektronix, Inc.
    Inventors: Mihir K. Ravel, Steven H. Pepper