Patents by Inventor Miki Taki
Miki Taki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9978044Abstract: An analyzing device requires regular maintenance for maintaining a predetermined analyzing performance thereof. However, the more complex the analyzing device becomes, the more number of maintenance items are provided. For example, if a plurality of types of maintenances to be performed by removing same component, efficiency may be improved by performing the same as a whole. However, when conforming with a manual, if recommended timings to perform the maintenance are shifted delicately, there is a probability of occurrence of a case where the same components are removed several times for maintenance during a short time. At the time when an instruction to perform maintenance is issued, maintenance items to be performed are extracted, the extracted maintenance items are sorted into a recommended performance order in conformity to a preset rule such that the similar maintenance or the maintenance of the same portion or the like are performed continuously.Type: GrantFiled: January 10, 2012Date of Patent: May 22, 2018Assignee: Hitachi High-Technologies CorporationInventors: Miki Taki, Naomi Ishii
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Patent number: 9383375Abstract: An automatic analysis device may enable easy selection of a desired reagent-setting position and efficient execution of reagent information confirmation and reagent usage setup by displaying, at a high level of visibility and in an enlarged format, both of the selected reagent-setting position and means for moving, for example, a mouse pointer to an anterior or posterior display position with respect to the selected reagent-setting position. A display controller may cause display of a list of reagent-setting positions provided in a reagent disk. An extended display controller may cause display, in an enlarged format, of a reagent-setting position that has been selected from the reagent-setting position list displayed by the display controller. The display of the selected reagent-setting position may be enlarged distinctly from that of other reagent-setting positions.Type: GrantFiled: December 12, 2012Date of Patent: July 5, 2016Assignee: Hitachi High-Technologies CorporationInventors: Sayaka Sarwar, Hiroki Mori, Miki Taki, Yoichi Aruga
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Patent number: 9341638Abstract: An automatic analyzer enables users to perform working steps easily and reliably by switching a display screen irrespective of a skill level of the user. The automatic analyzer, which determines a consistency of a test item, includes a display/input section to display a plurality of working steps relating to necessary work flow for measurement. The display/input section is adapted to selectively present a maximized workflow display and a reduced workflow display. The maximized workflow display shows a series of operations and works, and further shows a plurality of operations and works in an order that the plurality of operations and works are processed. In a reduced display of the work flow, the reduced workflow display shows details of a specific operation or work, and a position of the specific operation or work in a sequence that the entire series of operations and works are processed.Type: GrantFiled: May 22, 2012Date of Patent: May 17, 2016Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Sayaka Sarwar, Tatsuya Tokunaga, Miki Taki, Toshihide Orihashi, Hiroki Mori, Yoichi Aruga, Takashi Nakasawa
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Patent number: 9291634Abstract: Chemical analysis apparatus for inserting a sample serving as an analyzable substance and a reagent into a reaction container and agitating by irradiating sound waves to the reaction container, the chemical analysis apparatus including: a piezoelectric element generating sound waves; and a driver for driving the piezoelectric element, and including: a wave form producing device for producing an oscillation waveform having a fundamental frequency of the sound waves to be irradiated; an auxiliary waveform producing device for producing an oscillation wave form having a frequency lower than that of the oscillation waveform; a multiplying circuit creating a multiplied waveform between the waveform and the wave form; and, a power amplifier for power-amplifying the multiplied waveform, wherein it is intermittently irradiated with the sound wave in the reaction container, and further, the wave form producing device has a function capable of frequency-modulation with a prescribed frequency width.Type: GrantFiled: February 4, 2014Date of Patent: March 22, 2016Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Hajime Katou, Ryo Miyake, Hiroyasu Uchida, Katsuhiro Kambara, Takenori Okusa, Shigenori Watari, Yoichiro Suzuki, Tomonori Mimura, Miki Taki, Akira Inagaki
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Publication number: 20140322080Abstract: Disclosed is an automatic analysis device that enables easy selection of a desired reagent-setting position and efficient execution of reagent information confirmation and reagent usage setup, by displaying, at a high level of visibility and in an enlarged format, both of the selected reagent-setting position and means for moving, for example, a mouse pointer to an anterior or posterior display position with respect to the selected reagent-setting position. A display controller 312A displays a list of reagent-setting positions provided in a reagent disk 301. An extended display controller 312A1 displays, in an enlarged format, a reagent-setting position that has been selected from the reagent-setting position list displayed by the display controller, the display of the selected reagent-setting position being enlarged distinctly from that of other reagent-setting positions.Type: ApplicationFiled: December 12, 2012Publication date: October 30, 2014Inventors: Sayaka Sarwar, Hiroki Mori, Miki Taki, Yoichi Aruga
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Publication number: 20140147348Abstract: Chemical analysis apparatus for inserting a sample serving as an analyzable substance and a reagent into a reaction container and agitating by irradiating sound waves to the reaction container, the chemical analysis apparatus including: a piezoelectric element generating sound waves; and a driver for driving the piezoelectric element, and including: a wave form producing device for producing an oscillation waveform having a fundamental frequency of the sound waves to be irradiated; an auxiliary waveform producing device for producing an oscillation wave form having a frequency lower than that of the oscillation waveform; a multiplying circuit creating a multiplied waveform between the waveform and the wave form; and, a power amplifier for power-amplifying the multiplied waveform, wherein it is intermittently irradiated with the sound wave in the reaction container, and further, the wave form producing device has a function capable of frequency-modulation with a prescribed frequency width.Type: ApplicationFiled: February 4, 2014Publication date: May 29, 2014Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Hajime KATOU, Ryo MIYAKE, Hiroyasu UCHIDA, Katsuhiro KAMBARA, Takenori OKUSA, Shigenori WATARI, Yoichiro SUZUKI, Tomonori MIMURA, Miki TAKI, Akira INAGAKI
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Publication number: 20140147335Abstract: An automatic analyzer enables users to perform working steps easily and reliably by switching a display screen irrespective of a skill level of the user. The automatic analyzer, which determines a consistency of a test item, includes a display/input section to display a plurality of working steps relating to necessary work flow for measurement. The display/input section is adapted to selectively present a maximized workflow display and a reduced workflow display. The maximized workflow display shows a series of operations and works, and further shows a plurality of operations and works in an order that the plurality of operations and works are processed. In a reduced display of the work flow, the reduced workflow display shows details of a specific operation or work, and a position of the specific operation or work in a sequence that the entire series of operations and works are processed.Type: ApplicationFiled: May 22, 2012Publication date: May 29, 2014Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Sayaka Sarwar, Tatsuya Tokunaga, Miki Taki, Toshihide Orihashi, Hiroki Mori, Yoichi Aruga, Takashi Nakasawa
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Patent number: 8658102Abstract: A chemical analysis apparatus comprising reaction containers containing therein a substance to be analyzed; an agitating mechanism spaced from the substance to be analyzed and agitating said substance to be analyzed with a liquid in said reaction container; and, a measuring portion for measuring physical properties of the substance to be analyzed, said agitating mechanism having a sound supply portion supplying sound waves to the substance to be analyzed, wherein said sound supply portion comprises a mechanism changing, in time, intensity of ultrasonic waves to be irradiated so as to apply pulsation to a swirl flow in the reaction container.Type: GrantFiled: May 24, 2010Date of Patent: February 25, 2014Assignee: Hitachi High-Technologies CorporationInventors: Hajime Katou, Ryo Miyake, Hiroyasu Uchida, Katsuhiro Kambara, Takenori Okusa, Shigenori Watari, Yoichiro Suzuki, Tomonori Mimura, Miki Taki, Akira Inagaki
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Publication number: 20130311243Abstract: An analyzing device requires regular maintenance for maintaining a predetermined analyzing performance thereof. However, the more complex the analyzing device becomes, the more number of maintenance items are provided. For example, if a plurality of types of maintenances to be performed by removing same component, efficiency may be improved by performing the same as a whole. However, when conforming with a manual, if recommended timings to perform the maintenance are shifted delicately, there is a probability of occurrence of a case where the same components are removed several times for maintenance during a short time. At the time when an instruction to perform maintenance is issued, maintenance items to be performed are extracted, the extracted maintenance items are sorted into a recommended performance order in conformity to a preset rule such that the similar maintenance or the maintenance of the same portion or the like are performed continuously.Type: ApplicationFiled: January 10, 2012Publication date: November 21, 2013Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Miki Taki, Naomi Ishii
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Patent number: 8538119Abstract: A particle image analyzing method is adapted so that while raising image-reviewing efficiency at a cropped image level of particle components in a sample, the entire sample can be observed without significantly changing a related apparatus configuration. Prior to image reviewing of an imaging region, cropped images thereof are reviewed and, with reference to the images arranged for each kind of particle component, if the operator judges any particles to have been falsely identified, the operator uses an operating unit to modify positions of the particles to those of correct component items. An overall image of the imaging region is displayed and if any components to be added (overlooked components) appear, the kinds of these components are identified and quantitative data on each kind of component is registered. Upon completion of the registration, the concentration of the sample is recalculated and a comment is entered in a comment field.Type: GrantFiled: May 12, 2009Date of Patent: September 17, 2013Assignee: Hitachi High-Technologies CorporationInventors: Miki Taki, Norio Oowada
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Publication number: 20120134559Abstract: The particle analysis apparatus includes means that perform processes upon image processing of images (110) acquired in a measurement of the sample, simultaneously with a normal image processing for classifying target particles. The means included are: image processing means (110a) for calculating information of RGB density distributions of each whole image; abnormal state determination processing means (110c) for determining whether or not the acquired images are in an abnormal state according to tendencies of the RGB density distributions; and an abnormality judgment process means for making final determination of the existence of an abnormality by calculating an appearance frequency of abnormal images after all measurements for the one sample is completed. These means allow diagnosis of abnormalities to be conducted simultaneously with normal analysis without changing the configuration of the conventional apparatus.Type: ApplicationFiled: July 23, 2010Publication date: May 31, 2012Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Akiko Suzuki, Norio Oowada, Miki Taki, Satoshi Mitsuyama, Chihiro Manri
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Patent number: 8151190Abstract: An analysis device allowing any person to utilize job guidance for setting and assignment operations with high efficiency regardless of a level of skill in an automatic analysis device which has a complicated screen configuration with an increase of functions. A storage unit stores a job guidance file and a correspondence list file indicating correspondences between procedure IDs, codes, buttons, etc. in the job guidance file and screen IDs for device control program software. When an operator selects the procedure ID or the like in a displayed job guidance window, control is performed such that the screen ID corresponding to the selected procedure ID or the like is searched for in the correspondence list file, and the displayed screen is shifted to one corresponding to the searched screen ID for the device control program software.Type: GrantFiled: August 4, 2006Date of Patent: April 3, 2012Assignee: Hitachi High-Technologies CorporationInventors: Miki Taki, Yoshimitsu Takagi
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Publication number: 20110090247Abstract: A particle image analyzing method is adapted so that while raising image-reviewing efficiency at a cropped image level of particle components in a sample, the entire sample can be observed without significantly changing a related apparatus configuration. Prior to image reviewing of an imaging region, cropped images thereof are reviewed and, with reference to the images arranged for each kind of particle component, if the operator judges any particles to have been falsely identified, the operator uses an operating unit to modify positions of the particles to those of correct component items. An overall image of the imaging region is displayed and if any components to be added (overlooked components) appear, the kinds of these components are identified and quantitative data on each kind of component is registered. Upon completion of the registration, the concentration of the sample is recalculated and a comment is entered in a comment field.Type: ApplicationFiled: May 12, 2009Publication date: April 21, 2011Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Miki Taki, Norio Oowada
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Publication number: 20100233027Abstract: A chemical analysis apparatus comprising reaction containers containing therein a substance to be analyzed; an agitating mechanism spaced from the substance to be analyzed and agitating said substance to be analyzed with a liquid in said reaction container; and, a measuring portion for measuring physical properties of the substance to be analyzed, said agitating mechanism having a sound supply portion supplying sound waves to the substance to be analyzed, wherein said sound supply portion comprises a mechanism changing, in time, intensity of ultrasonic waves to be irradiated so as to apply pulsation to a swirl flow in the reaction container.Type: ApplicationFiled: May 24, 2010Publication date: September 16, 2010Inventors: Hajime KATOU, Ryo Miyake, Hiroyasu Uchida, Katsuhiro Kambara, Takenori Okusa, Shigenori Watari, Yoichiro Suzuki, Tomonori Mimura, Miki Taki, Akira Inagaki
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Patent number: 7722815Abstract: Provided is a chemical analysis apparatus comprising a mechanism which can efficiently agitate a substance to be agitated so that a sample and a reagent are agitated and mixed together in a shorter time with a saved consumption power, incorporating a plurality of sound sources or reflecting plates, and a reaction container is located between one of the sound sources and another of the sound sources or one of the reflecting plates, whereby sound waves can be irradiated toward the reaction container in several directions in order to efficiently fluidize a solution in the reaction container.Type: GrantFiled: January 21, 2003Date of Patent: May 25, 2010Assignee: Hitachi High-Technologies CorporationInventors: Hajime Katou, Ryo Miyake, Hiroyasu Uchida, Katsuhiro Kambara, Takenori Okusa, Shigenori Watari, Yoichiro Suzuki, Tomonori Mimura, Miki Taki, Akira Inagaki
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Patent number: D681226Type: GrantFiled: July 24, 2012Date of Patent: April 30, 2013Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Hitoshi Tokieda, Takenori Okusa, Miki Taki, Hiroyuki Noda
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Patent number: D681227Type: GrantFiled: July 24, 2012Date of Patent: April 30, 2013Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Hitoshi Tokieda, Takenori Okusa, Miki Taki, Hiroyuki Noda, Kosuke Matoba
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Patent number: D681228Type: GrantFiled: July 24, 2012Date of Patent: April 30, 2013Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Hitoshi Tokieda, Takenori Okusa, Miki Taki, Hiroyuki Noda
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Patent number: D685494Type: GrantFiled: July 24, 2012Date of Patent: July 2, 2013Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Hitoshi Tokieda, Takenori Okusa, Miki Taki, Hiroyuki Noda
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Patent number: D685495Type: GrantFiled: July 24, 2012Date of Patent: July 2, 2013Assignee: Hitachi High-Technologies CorporationInventors: Mitsuru Oonuma, Hitoshi Tokieda, Takenori Okusa, Miki Taki, Hiroyuki Noda