Patents by Inventor Miki Taki

Miki Taki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9978044
    Abstract: An analyzing device requires regular maintenance for maintaining a predetermined analyzing performance thereof. However, the more complex the analyzing device becomes, the more number of maintenance items are provided. For example, if a plurality of types of maintenances to be performed by removing same component, efficiency may be improved by performing the same as a whole. However, when conforming with a manual, if recommended timings to perform the maintenance are shifted delicately, there is a probability of occurrence of a case where the same components are removed several times for maintenance during a short time. At the time when an instruction to perform maintenance is issued, maintenance items to be performed are extracted, the extracted maintenance items are sorted into a recommended performance order in conformity to a preset rule such that the similar maintenance or the maintenance of the same portion or the like are performed continuously.
    Type: Grant
    Filed: January 10, 2012
    Date of Patent: May 22, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Miki Taki, Naomi Ishii
  • Patent number: 9383375
    Abstract: An automatic analysis device may enable easy selection of a desired reagent-setting position and efficient execution of reagent information confirmation and reagent usage setup by displaying, at a high level of visibility and in an enlarged format, both of the selected reagent-setting position and means for moving, for example, a mouse pointer to an anterior or posterior display position with respect to the selected reagent-setting position. A display controller may cause display of a list of reagent-setting positions provided in a reagent disk. An extended display controller may cause display, in an enlarged format, of a reagent-setting position that has been selected from the reagent-setting position list displayed by the display controller. The display of the selected reagent-setting position may be enlarged distinctly from that of other reagent-setting positions.
    Type: Grant
    Filed: December 12, 2012
    Date of Patent: July 5, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Sayaka Sarwar, Hiroki Mori, Miki Taki, Yoichi Aruga
  • Patent number: 9341638
    Abstract: An automatic analyzer enables users to perform working steps easily and reliably by switching a display screen irrespective of a skill level of the user. The automatic analyzer, which determines a consistency of a test item, includes a display/input section to display a plurality of working steps relating to necessary work flow for measurement. The display/input section is adapted to selectively present a maximized workflow display and a reduced workflow display. The maximized workflow display shows a series of operations and works, and further shows a plurality of operations and works in an order that the plurality of operations and works are processed. In a reduced display of the work flow, the reduced workflow display shows details of a specific operation or work, and a position of the specific operation or work in a sequence that the entire series of operations and works are processed.
    Type: Grant
    Filed: May 22, 2012
    Date of Patent: May 17, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Sayaka Sarwar, Tatsuya Tokunaga, Miki Taki, Toshihide Orihashi, Hiroki Mori, Yoichi Aruga, Takashi Nakasawa
  • Patent number: 9291634
    Abstract: Chemical analysis apparatus for inserting a sample serving as an analyzable substance and a reagent into a reaction container and agitating by irradiating sound waves to the reaction container, the chemical analysis apparatus including: a piezoelectric element generating sound waves; and a driver for driving the piezoelectric element, and including: a wave form producing device for producing an oscillation waveform having a fundamental frequency of the sound waves to be irradiated; an auxiliary waveform producing device for producing an oscillation wave form having a frequency lower than that of the oscillation waveform; a multiplying circuit creating a multiplied waveform between the waveform and the wave form; and, a power amplifier for power-amplifying the multiplied waveform, wherein it is intermittently irradiated with the sound wave in the reaction container, and further, the wave form producing device has a function capable of frequency-modulation with a prescribed frequency width.
    Type: Grant
    Filed: February 4, 2014
    Date of Patent: March 22, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Hajime Katou, Ryo Miyake, Hiroyasu Uchida, Katsuhiro Kambara, Takenori Okusa, Shigenori Watari, Yoichiro Suzuki, Tomonori Mimura, Miki Taki, Akira Inagaki
  • Publication number: 20140322080
    Abstract: Disclosed is an automatic analysis device that enables easy selection of a desired reagent-setting position and efficient execution of reagent information confirmation and reagent usage setup, by displaying, at a high level of visibility and in an enlarged format, both of the selected reagent-setting position and means for moving, for example, a mouse pointer to an anterior or posterior display position with respect to the selected reagent-setting position. A display controller 312A displays a list of reagent-setting positions provided in a reagent disk 301. An extended display controller 312A1 displays, in an enlarged format, a reagent-setting position that has been selected from the reagent-setting position list displayed by the display controller, the display of the selected reagent-setting position being enlarged distinctly from that of other reagent-setting positions.
    Type: Application
    Filed: December 12, 2012
    Publication date: October 30, 2014
    Inventors: Sayaka Sarwar, Hiroki Mori, Miki Taki, Yoichi Aruga
  • Publication number: 20140147348
    Abstract: Chemical analysis apparatus for inserting a sample serving as an analyzable substance and a reagent into a reaction container and agitating by irradiating sound waves to the reaction container, the chemical analysis apparatus including: a piezoelectric element generating sound waves; and a driver for driving the piezoelectric element, and including: a wave form producing device for producing an oscillation waveform having a fundamental frequency of the sound waves to be irradiated; an auxiliary waveform producing device for producing an oscillation wave form having a frequency lower than that of the oscillation waveform; a multiplying circuit creating a multiplied waveform between the waveform and the wave form; and, a power amplifier for power-amplifying the multiplied waveform, wherein it is intermittently irradiated with the sound wave in the reaction container, and further, the wave form producing device has a function capable of frequency-modulation with a prescribed frequency width.
    Type: Application
    Filed: February 4, 2014
    Publication date: May 29, 2014
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Hajime KATOU, Ryo MIYAKE, Hiroyasu UCHIDA, Katsuhiro KAMBARA, Takenori OKUSA, Shigenori WATARI, Yoichiro SUZUKI, Tomonori MIMURA, Miki TAKI, Akira INAGAKI
  • Publication number: 20140147335
    Abstract: An automatic analyzer enables users to perform working steps easily and reliably by switching a display screen irrespective of a skill level of the user. The automatic analyzer, which determines a consistency of a test item, includes a display/input section to display a plurality of working steps relating to necessary work flow for measurement. The display/input section is adapted to selectively present a maximized workflow display and a reduced workflow display. The maximized workflow display shows a series of operations and works, and further shows a plurality of operations and works in an order that the plurality of operations and works are processed. In a reduced display of the work flow, the reduced workflow display shows details of a specific operation or work, and a position of the specific operation or work in a sequence that the entire series of operations and works are processed.
    Type: Application
    Filed: May 22, 2012
    Publication date: May 29, 2014
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Sayaka Sarwar, Tatsuya Tokunaga, Miki Taki, Toshihide Orihashi, Hiroki Mori, Yoichi Aruga, Takashi Nakasawa
  • Patent number: 8658102
    Abstract: A chemical analysis apparatus comprising reaction containers containing therein a substance to be analyzed; an agitating mechanism spaced from the substance to be analyzed and agitating said substance to be analyzed with a liquid in said reaction container; and, a measuring portion for measuring physical properties of the substance to be analyzed, said agitating mechanism having a sound supply portion supplying sound waves to the substance to be analyzed, wherein said sound supply portion comprises a mechanism changing, in time, intensity of ultrasonic waves to be irradiated so as to apply pulsation to a swirl flow in the reaction container.
    Type: Grant
    Filed: May 24, 2010
    Date of Patent: February 25, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hajime Katou, Ryo Miyake, Hiroyasu Uchida, Katsuhiro Kambara, Takenori Okusa, Shigenori Watari, Yoichiro Suzuki, Tomonori Mimura, Miki Taki, Akira Inagaki
  • Publication number: 20130311243
    Abstract: An analyzing device requires regular maintenance for maintaining a predetermined analyzing performance thereof. However, the more complex the analyzing device becomes, the more number of maintenance items are provided. For example, if a plurality of types of maintenances to be performed by removing same component, efficiency may be improved by performing the same as a whole. However, when conforming with a manual, if recommended timings to perform the maintenance are shifted delicately, there is a probability of occurrence of a case where the same components are removed several times for maintenance during a short time. At the time when an instruction to perform maintenance is issued, maintenance items to be performed are extracted, the extracted maintenance items are sorted into a recommended performance order in conformity to a preset rule such that the similar maintenance or the maintenance of the same portion or the like are performed continuously.
    Type: Application
    Filed: January 10, 2012
    Publication date: November 21, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Miki Taki, Naomi Ishii
  • Patent number: 8538119
    Abstract: A particle image analyzing method is adapted so that while raising image-reviewing efficiency at a cropped image level of particle components in a sample, the entire sample can be observed without significantly changing a related apparatus configuration. Prior to image reviewing of an imaging region, cropped images thereof are reviewed and, with reference to the images arranged for each kind of particle component, if the operator judges any particles to have been falsely identified, the operator uses an operating unit to modify positions of the particles to those of correct component items. An overall image of the imaging region is displayed and if any components to be added (overlooked components) appear, the kinds of these components are identified and quantitative data on each kind of component is registered. Upon completion of the registration, the concentration of the sample is recalculated and a comment is entered in a comment field.
    Type: Grant
    Filed: May 12, 2009
    Date of Patent: September 17, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Miki Taki, Norio Oowada
  • Publication number: 20120134559
    Abstract: The particle analysis apparatus includes means that perform processes upon image processing of images (110) acquired in a measurement of the sample, simultaneously with a normal image processing for classifying target particles. The means included are: image processing means (110a) for calculating information of RGB density distributions of each whole image; abnormal state determination processing means (110c) for determining whether or not the acquired images are in an abnormal state according to tendencies of the RGB density distributions; and an abnormality judgment process means for making final determination of the existence of an abnormality by calculating an appearance frequency of abnormal images after all measurements for the one sample is completed. These means allow diagnosis of abnormalities to be conducted simultaneously with normal analysis without changing the configuration of the conventional apparatus.
    Type: Application
    Filed: July 23, 2010
    Publication date: May 31, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Akiko Suzuki, Norio Oowada, Miki Taki, Satoshi Mitsuyama, Chihiro Manri
  • Patent number: 8151190
    Abstract: An analysis device allowing any person to utilize job guidance for setting and assignment operations with high efficiency regardless of a level of skill in an automatic analysis device which has a complicated screen configuration with an increase of functions. A storage unit stores a job guidance file and a correspondence list file indicating correspondences between procedure IDs, codes, buttons, etc. in the job guidance file and screen IDs for device control program software. When an operator selects the procedure ID or the like in a displayed job guidance window, control is performed such that the screen ID corresponding to the selected procedure ID or the like is searched for in the correspondence list file, and the displayed screen is shifted to one corresponding to the searched screen ID for the device control program software.
    Type: Grant
    Filed: August 4, 2006
    Date of Patent: April 3, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Miki Taki, Yoshimitsu Takagi
  • Publication number: 20110090247
    Abstract: A particle image analyzing method is adapted so that while raising image-reviewing efficiency at a cropped image level of particle components in a sample, the entire sample can be observed without significantly changing a related apparatus configuration. Prior to image reviewing of an imaging region, cropped images thereof are reviewed and, with reference to the images arranged for each kind of particle component, if the operator judges any particles to have been falsely identified, the operator uses an operating unit to modify positions of the particles to those of correct component items. An overall image of the imaging region is displayed and if any components to be added (overlooked components) appear, the kinds of these components are identified and quantitative data on each kind of component is registered. Upon completion of the registration, the concentration of the sample is recalculated and a comment is entered in a comment field.
    Type: Application
    Filed: May 12, 2009
    Publication date: April 21, 2011
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Miki Taki, Norio Oowada
  • Publication number: 20100233027
    Abstract: A chemical analysis apparatus comprising reaction containers containing therein a substance to be analyzed; an agitating mechanism spaced from the substance to be analyzed and agitating said substance to be analyzed with a liquid in said reaction container; and, a measuring portion for measuring physical properties of the substance to be analyzed, said agitating mechanism having a sound supply portion supplying sound waves to the substance to be analyzed, wherein said sound supply portion comprises a mechanism changing, in time, intensity of ultrasonic waves to be irradiated so as to apply pulsation to a swirl flow in the reaction container.
    Type: Application
    Filed: May 24, 2010
    Publication date: September 16, 2010
    Inventors: Hajime KATOU, Ryo Miyake, Hiroyasu Uchida, Katsuhiro Kambara, Takenori Okusa, Shigenori Watari, Yoichiro Suzuki, Tomonori Mimura, Miki Taki, Akira Inagaki
  • Patent number: 7722815
    Abstract: Provided is a chemical analysis apparatus comprising a mechanism which can efficiently agitate a substance to be agitated so that a sample and a reagent are agitated and mixed together in a shorter time with a saved consumption power, incorporating a plurality of sound sources or reflecting plates, and a reaction container is located between one of the sound sources and another of the sound sources or one of the reflecting plates, whereby sound waves can be irradiated toward the reaction container in several directions in order to efficiently fluidize a solution in the reaction container.
    Type: Grant
    Filed: January 21, 2003
    Date of Patent: May 25, 2010
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hajime Katou, Ryo Miyake, Hiroyasu Uchida, Katsuhiro Kambara, Takenori Okusa, Shigenori Watari, Yoichiro Suzuki, Tomonori Mimura, Miki Taki, Akira Inagaki
  • Patent number: D681226
    Type: Grant
    Filed: July 24, 2012
    Date of Patent: April 30, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Hitoshi Tokieda, Takenori Okusa, Miki Taki, Hiroyuki Noda
  • Patent number: D681227
    Type: Grant
    Filed: July 24, 2012
    Date of Patent: April 30, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Hitoshi Tokieda, Takenori Okusa, Miki Taki, Hiroyuki Noda, Kosuke Matoba
  • Patent number: D681228
    Type: Grant
    Filed: July 24, 2012
    Date of Patent: April 30, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Hitoshi Tokieda, Takenori Okusa, Miki Taki, Hiroyuki Noda
  • Patent number: D685494
    Type: Grant
    Filed: July 24, 2012
    Date of Patent: July 2, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Hitoshi Tokieda, Takenori Okusa, Miki Taki, Hiroyuki Noda
  • Patent number: D685495
    Type: Grant
    Filed: July 24, 2012
    Date of Patent: July 2, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Hitoshi Tokieda, Takenori Okusa, Miki Taki, Hiroyuki Noda