Patents by Inventor Mirna Slim

Mirna Slim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method to quantify discrete pore shapes, volumes, and surface areas using confocal profilometry
    Patent number: 8311788
    Abstract: Methods for characterizing a sample of porous media using a measuring device along with a multipoint statistical (MPS) model. Retrieving a set of reflected measured data provided by the measuring device of a surface of the sample in order to produce a sample imaging log, wherein the retrieved set of measured data is communicated to a processor. Selecting depth-defined surface portions of the sample from the sample imaging log as a training image for inputting in the MPS model. Determining pattern based simulations from the training image using one of a pixel-based template which is applied to the training image. Constructing from the pattern based simulations a complete-sampling image log of surface portions of the sample. Repeat the above steps in order to construct three dimensional (3D) sample images from stacked successive pattern based simulations so as to construct at least one 3D model of the sample.
    Type: Grant
    Filed: July 1, 2009
    Date of Patent: November 13, 2012
    Assignee: Schlumberger Technology Corporation
    Inventors: Neil Francis Hurley, Tuanfeng Zhang, Guangping Xu, Lili Xu, Mirna Slim
  • Method to quantify discrete pore shapes, volumes, and surface areas using confocal profilometry
    Publication number: 20110004448
    Abstract: Methods for characterizing a sample of porous media using a measuring device along with a multipoint statistical (MPS) model. Retrieving a set of reflected measured data provided by the measuring device of a surface of the sample in order to produce a sample imaging log, wherein the retrieved set of measured data is communicated to a processor. Selecting depth-defined surface portions of the sample from the sample imaging log as a training image for inputting in the MPS model. Determining pattern based simulations from the training image using one of a pixel-based template which is applied to the training image. Constructing from the pattern based simulations a complete-sampling image log of surface portions of the sample. Repeat the above steps in order to construct three dimensional (3D) sample images from stacked successive pattern based simulations so as to construct at least one 3D model of the sample.
    Type: Application
    Filed: July 1, 2009
    Publication date: January 6, 2011
    Applicant: Schlumberger Technology Corporation
    Inventors: Neil Francis Hurley, Tuanfeng Zhang, Guangping Xu, Lili Xu, Mirna Slim