Patents by Inventor Mitsuaki Uesugi

Mitsuaki Uesugi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7869061
    Abstract: A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of observable points on a specular or semi-specular surface of a measurement target. The device includes pattern displaying means 2 capable of switching and displaying a plurality of kinds of light-and-shade patterns 5, capturing means 3 for capturing mirror images, reflected in the specular or semi-specular surface of a measurement target 1, of the plurality of light-and-shade patterns displayed on the pattern displaying means, and surface-distortion distribution calculating means 10 for performing image processing on the captured mirror images of the plurality of light-and-shade patterns to calculate surface-distortion distribution of the measurement-target surface.
    Type: Grant
    Filed: September 14, 2006
    Date of Patent: January 11, 2011
    Assignees: JFE Steel Corporation, JFE Techno-Research Corporation
    Inventors: Kentaro Sato, Takanobu Saito, Takashi Iwama, Akihide Yoshitake, Mitsuaki Uesugi
  • Patent number: 7599052
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Grant
    Filed: August 13, 2008
    Date of Patent: October 6, 2009
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Publication number: 20090141287
    Abstract: A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of observable points on a specular or semi-specular surface of a measurement target. The device includes pattern displaying means 2 capable of switching and displaying a plurality of kinds of light-and-shade patterns 5, capturing means 3 for capturing mirror images, reflected in the specular or semi-specular surface of a measurement target 1, of the plurality of light-and-shade patterns displayed on the pattern displaying means, and surface-distortion distribution calculating means 10 for performing image processing on the captured mirror images of the plurality of light-and-shade patterns to calculate surface-distortion distribution of the measurement-target surface.
    Type: Application
    Filed: September 14, 2006
    Publication date: June 4, 2009
    Applicants: JFE STEEL CORPORATION, JFE TECHNO-RESEARCH CORPORATION
    Inventors: Kentaro Sato, Takanobu Saito, Takashi Iwama, Akihide Yoshitake, Mitsuaki Uesugi
  • Publication number: 20090086209
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Application
    Filed: August 13, 2008
    Publication date: April 2, 2009
    Applicant: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Patent number: 7423744
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Grant
    Filed: October 24, 2006
    Date of Patent: September 9, 2008
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Patent number: 7248366
    Abstract: The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.
    Type: Grant
    Filed: September 17, 2001
    Date of Patent: July 24, 2007
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Publication number: 20070052964
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Application
    Filed: October 24, 2006
    Publication date: March 8, 2007
    Applicant: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Patent number: 6559931
    Abstract: A 3-D coordinate measurement is performed in such a way that an electrooptical distance-measuring device is used to measure a linear distance to a target point set on a surface of a measurement object, an angle measuring device is used to measure shifted angles of an optical axis of the electrooptical distance-measuring device, and a 3-D coordinate of the target point is measured according to a measured distance and a measured angle after the optical axis of the electrooptical distance-measuring device has been aligned to the target point.
    Type: Grant
    Filed: September 20, 2002
    Date of Patent: May 6, 2003
    Assignee: NKK Corporation
    Inventors: Tsutomu Kawamura, Mitsuaki Uesugi, Hirohiko Yanagita, Noboru Kawasaki, Hisashi Ito
  • Publication number: 20030048438
    Abstract: A 3-D coordinate measurement is performed in such a way that an electrooptical distance-measuring device is used to measure a linear distance to a target point set on a surface of a measurement object, an angle measuring device is used to measure shifted angles of an optical axis of the electrooptical distance-measuring device, and a 3-D coordinate of the target point is measured according to a measured distance and a measured angle after the optical axis of the electrooptical distance-measuring device has been aligned to the target point.
    Type: Application
    Filed: September 20, 2002
    Publication date: March 13, 2003
    Applicant: NKK Corporation
    Inventors: Tsutomu Kawamura, Mitsuaki Uesugi, Hirohiko Yanagita, Noboru Kawasaki, Hisashi Ito
  • Publication number: 20020154308
    Abstract: The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.
    Type: Application
    Filed: September 17, 2001
    Publication date: October 24, 2002
    Applicant: NKK Corporation, a Japanese Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Patent number: 5129268
    Abstract: A method of measuring an average particle size of granules. The method computes the average particle size on the basis of an n-order moment M.sub.n of an image of granules accumulated in a pile or of the image subjected to binarization or floating binarization. The method is capable of highly accurate and stable measurement on granules having many irregularities in the surface thereof and accumulated in a pile. The method can be used to continuously measure in real time the particle size of granules in a rotary tray of a rotary tray-type rolling granulating machine thereby adjusting the feed rate of a liquid binder to automatically control the particle size.
    Type: Grant
    Filed: March 20, 1990
    Date of Patent: July 14, 1992
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Masami Harayama, Kazumi Ota, Sotoaki Kawaguchi, Hiroyuki Shibuya
  • Patent number: 5104227
    Abstract: A three-dimensional curved surface shape measuring apparatus of the slit light rotating type. In accordance with a composite image .theta.(x', y') produced when a slit light is rotationally scanned with respect to a picture of an object to be measured and horizontal displacements x.sub.o and vertical displacement z.sub.o of an axis of rotation of the slit light with respect to an origin of a reference plane, a necessary computational processing is performed to determine a three-dimensional shape f(x, y) of the object surface which is free of distortion due to a perspective effect of a television camera.
    Type: Grant
    Filed: March 20, 1990
    Date of Patent: April 14, 1992
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Masaichi Inomata
  • Patent number: 5102224
    Abstract: A three-dimensional curved surface shape measuring apparatus of the slit light linear scanning type. In accordance with a composite image u(x', y') produced by image composing means when a slit light is scanned over a surface of an object to be measured, a measured value or computed value u.sub.o (x', y') of a composite image with respect to a reference plane, a light projecting angle .theta. to the reference plane and a reference plane-television camera distance a, a necessary computational processing is performed to determine a three-dimensional curved surface shape f(x, y) of the surface of the object which is free of any distortions due to a perspective effect of the television camera.
    Type: Grant
    Filed: March 20, 1990
    Date of Patent: April 7, 1992
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Masaichi Inomata
  • Patent number: 5102223
    Abstract: A method and apparatus for measuring a three-dimensional curved surface shape based on a new measuring principle that a surface of an object to be measured is coded with information relating to a slit light which is used as a medium and moved or rotated at a constant speed. The manner in which a linear reflected pattern of the slit light is moved over the surface of the object to be measured is picked up by a television camera to form a composite image in which a value of each of picture elements in the image is represented by information relating to the slit light, e.g., a position, time or projection angle of the slit light at an instant that the slit light passes through one of positions on the object surface corresponding to that picture element.
    Type: Grant
    Filed: February 7, 1998
    Date of Patent: April 7, 1992
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Masaichi Inomata, Isamu Komine
  • Patent number: 4881126
    Abstract: An image composing apparatus adapted to produce a composite image in which a value of each of picture elements is represented by a maximum value or minimum value of the brightness of a video signal as well as a corresponding other signal at the instant of the maximum or minimum value. A composite image is formed in which a value of each of picture elements is represented by a count of synchronizing signals or an externally applied timing, position or angle indicative external input signal at an instant that the video signal attains the maximum value or the minimum value for each picture element.
    Type: Grant
    Filed: October 17, 1988
    Date of Patent: November 14, 1989
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Masaichi Inomata, Isamu Komine
  • Patent number: 4874955
    Abstract: A method and apparatus adapted to measure a three-dimensional curved surface shape quantitatively with high speed. A pattern of interference fringes on a surface of an object to be measured is picked up so that while moving a reference plane (or the object to be measured) in the direction of an optical axis, the resulting video signal is processed to form a composite image in which a value of each of picture elements is represented by a position of the reference plane (or a position of the object to be measured) at an instant that one of positions on the object surface corresponding to that picture element in the image attains a maximum brightness. Then, a three-dimensional curved surface shape of the object to be measured is measured on the basis of the composite image.
    Type: Grant
    Filed: October 17, 1988
    Date of Patent: October 17, 1989
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Masaichi Inomata, Isamu Komine
  • Patent number: 4848912
    Abstract: An apparatus for measuring shapes, comprises a scanner, having a plurality of arms for holding an object the shape of which is to be measured, and a turntable to which one end of each of the arms is fixed; and a device for forming a silhouette image of the object including a first optical system which has an optical axis parallel to a rotating axis of the turntable and which has a light source and a light receiving unit confronting each other to allow the object to be in between the light source and the light receiving unit of the first optical system, and a second optical system which has another optical axis substantially at a right angle to the rotating axis of the turntable and which has another light source and another light receiving unit confronting each other to allow the object to be in between the light source and the light receiving unit of the second optical system.
    Type: Grant
    Filed: January 28, 1988
    Date of Patent: July 18, 1989
    Assignee: NKK Corporation
    Inventors: Kazuo Sano, Mitsuaki Uesugi, Masami Harayama, Yoshihiro Okuno, Hiroshi Matsunaga, Yoichi Matsuju
  • Patent number: 4716459
    Abstract: A distance between a distal end of a crack formed in a fatigue test piece on which a reference line is scribed, and the reference line, is monitored. The reference line and the crack are scanned with an ITV camera to prepare the fatigue test piece having the crack of a predetermined length. Luminance levels are integrated from a video signal obtained by scanning each raster in the same direction as that of the reference line to obtain a maximum luminance level, and the reference line position is detected from the maximum luminance level. At the same time, continuity of a high-level value is discriminated from the video signal, and a crack distal end position is detected from the discrimination result. A difference between both the detected positions is calculated, and the test piece is machined so that the difference corresponds to the predetermined length.
    Type: Grant
    Filed: September 16, 1986
    Date of Patent: December 29, 1987
    Assignee: Nippon Kokan Kabushiki Kaisha
    Inventors: Eiichi Makabe, Mitsuaki Uesugi, Masaichi Inomata, Kyusuke Maruyama, Kenji Iwai, Kazuo Sano
  • Patent number: 4544268
    Abstract: A method and an apparatus for detecting a flaw on threads of a male screw, which comprises: fully applying a light from a light source onto tops, roots and flanks of threads of a male screw while rotating the male screw around the axis thereof; continuously measuring, by means of a photoelectric converter, electric signal values corresponding to variations in brightness of the male screw in the axial direction thereof during one turn of the male screw around the axis thereof; moving-averaging the thus measured electric signal values corresponding to the variations in brightness of the male screw in the axial direction thereof; determining electric signal values corresponding to variations in brightness of the male screw in the circumferential direction thereof, on the basis of the thus moving-averaged electric signal values corresponding to the variations in brightness of the male screw in the axial direction thereof; obtaining a mean square value of the thus determined electric signal values corresponding to
    Type: Grant
    Filed: January 4, 1984
    Date of Patent: October 1, 1985
    Assignee: Nippon Kokan Kabushiki Kaisha
    Inventors: Takeo Yamada, Mitsuaki Uesugi, Masaru Okamura