Patents by Inventor Mizuki Iwanami

Mizuki Iwanami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170076027
    Abstract: [Problem] To design a circuit configuration whereby communication performance degradation from noise coupling is pre-suppressed.
    Type: Application
    Filed: January 20, 2015
    Publication date: March 16, 2017
    Applicant: NEC CORPORATION
    Inventors: Mizuki IWANAMI, Kenta TSUKAMOTO, Taras KUSHTA
  • Publication number: 20160029477
    Abstract: A wiring substrate, to be interposed when an electronic component including an integrated circuit is mounted on a printed wiring board, includes a signal wire transmitting a signal from the electronic component, and a power supply wire supplying a power voltage to the electronic component, and the power supply wire is coated directly with a magnetic thin coat, and the magnetic thin coat is not provided on the signal wire so that the magnetic thin coat is arranged to be separated from the signal wire.
    Type: Application
    Filed: February 24, 2014
    Publication date: January 28, 2016
    Applicant: NEC CORPORATION
    Inventors: Mizuki IWANAMI, Taras KUSHTA
  • Patent number: 9182427
    Abstract: In an electric/magnetic field probe using an optical fiber, when a stress is applied to the fiber, the polarization state of the light propagating in the fiber changes, and the signal level of the electric or magnetic field detection becomes unstable. For coping with this problem, for suppressing the curve or waggle of the optical fiber caused by a stress applied to the fiber, an electric/magnetic field sensor unit composed of the fiber and EO/MO material is fixed on a quartz substrate, for example, and the part of the fiber other than the sensor unit is stored in an acrylic tube and fixed. Further, polarization adjustment parts like a polarization controller, an optical analyzer or the like is installed in the housing, so that a stress caused by wind pressure or contact is not applied to the fiber connected to the parts.
    Type: Grant
    Filed: June 23, 2010
    Date of Patent: November 10, 2015
    Assignee: NEC Corporation
    Inventors: Mizuki Iwanami, Tsuneo Tsukagoshi
  • Patent number: 8941402
    Abstract: An electromagnetic field measuring apparatus capable of measuring an electromagnetic field for a minuscule area in which electronic devices are densely packed with a high sensitivity is provided. In an electromagnetic field measuring apparatus according to the present invention, the amplitude level of signal light (pf) is adjusted by the analyzer (34) by adjusting its angle with respect to the plane of polarization of the signal light (pf) based on an amplitude level control signal (eb) supplied from the calculation control unit (40). An amplitude level control signal (eb) is supplied from the calculation control unit (40) to the analyzer (34) based on the spectrum (ea) of an electric signal (ed) measured by an RF spectrum analyzer (39). The amplitude level ration between the carrier and the sideband contained in the signal light (ph) incident on the optical receiver (38) is controlled to a fixed value.
    Type: Grant
    Filed: May 18, 2010
    Date of Patent: January 27, 2015
    Assignee: NEC Corporation
    Inventors: Mizuki Iwanami, Hiroshi Fukuda, Risato Ohhira
  • Patent number: 8921791
    Abstract: Provided is an infrared ray sensor that can conduct a plurality of different types of detection such as temperature detection and gas detection in a simple structure and that is small size and low cost. The infrared ray sensor (1) includes, on one base (10), a first infrared ray detection unit (31) including at least one infrared ray detection element (20) including an infrared ray detection material (22) with physical properties changing depending on properties of incident infrared rays and receives and detects ambient infrared rays, and a second infrared ray detection unit (32) including at least one infrared ray detection element (20) having an identical element structure to the infrared ray detection element of the first infrared ray detection unit (31), is irradiated with infrared rays X for measurement having specific physical properties, and detects a change in the physical properties of the infrared rays X for measurement.
    Type: Grant
    Filed: November 19, 2010
    Date of Patent: December 30, 2014
    Assignee: NEC Corporation
    Inventors: Junichiro Mataga, Mizuki Iwanami, Hiroshi Sakai, Masatake Takahashi, Yasuhiro Sasaki
  • Patent number: 8654331
    Abstract: There is provided an electromagnetic field measurement apparatus capable of achieving correct and timely circuit operation detection in an area where electronic devices are mounted at high density. An electromagnetic field measurement apparatus includes: a laser light source; a polarized wave controller that linearly polarizes laser light; an optical fiber probe that has an electrooptic material or a magnetooptic material at its leading end and in which the laser light reflected at the leading end is subjected to polarization modulation in accordance with an electric field intensity or a magnetic field intensity; and an analyzer that converts the laser light reflected by the optical fiber probe into intensity modulated light. The laser light source emits time-multiplexed laser light of a plurality of wavelengths different from one another.
    Type: Grant
    Filed: February 4, 2009
    Date of Patent: February 18, 2014
    Assignee: NEC Corporation
    Inventors: Mizuki Iwanami, Tsuneo Tsukagoshi, Risato Ohhira, Masafumi Nakada, Tomonori Yamada
  • Publication number: 20130320213
    Abstract: An infrared detection sensor array according to the present invention is characterized by being provided with a substrate, at least one hole that passes through the substrate, a first infrared detection element provided to one side of the substrate and a second infrared detection element provided on the other side of the substrate so as to at least partially cover the hole.
    Type: Application
    Filed: February 16, 2012
    Publication date: December 5, 2013
    Applicant: NEC Corporation
    Inventors: Junichiro Mataga, Masatake Takahashi, Yasuhiro Sasaki, Mizuki Iwanami
  • Patent number: 8519323
    Abstract: A magnetic field sensor fabrication method of directly forming, with an aerosol deposition method, at a tip of an optical fiber, a magnetooptical layer having a refractive index that changes depending on a magnetic field, the method includes establishing a relationship of dc?d?dr among a diameter d of the magnetooptical layer, a diameter dc of a core of the optical fiber, and a diameter dr of a clad thereof.
    Type: Grant
    Filed: March 5, 2012
    Date of Patent: August 27, 2013
    Assignee: NEC Corporation
    Inventors: Masafumi Nakada, Mizuki Iwanami, Keishi Oohashi, Norio Masuda
  • Patent number: 8508318
    Abstract: A stop band or a pass band is generated in a transmission line filter by providing a plurality of dielectric bodies having a periodic structure in the length direction of the transmission line filter and causing Bragg reflection of transmission wave. A voltage is applied to some or all of the dielectric bodies and the frequency of the stop band or the pass band is changed or controlled by adjusting the voltage.
    Type: Grant
    Filed: January 15, 2008
    Date of Patent: August 13, 2013
    Assignee: NEC Corporation
    Inventor: Mizuki Iwanami
  • Publication number: 20120312988
    Abstract: Provided is an infrared ray sensor that can conduct a plurality of different types of detection such as temperature detection and gas detection in a simple structure and that is small size and low cost. The infrared ray sensor (1) includes, on one base (10), a first infrared ray detection unit (31) including at least one infrared ray detection element (20) including an infrared ray detection material (22) with physical properties changing depending on properties of incident infrared rays and receives and detects ambient infrared rays, and a second infrared ray detection unit (32) including at least one infrared ray detection element (20) having an identical element structure to the infrared ray detection element of the first infrared ray detection unit (31), is irradiated with infrared rays X for measurement having specific physical properties, and detects a change in the physical properties of the infrared rays X for measurement.
    Type: Application
    Filed: November 19, 2010
    Publication date: December 13, 2012
    Applicant: NEC CORPORATION
    Inventors: Junichiro Mataga, Mizuki Iwanami, Hiroshi Sakai, Masatake Takahashi, Yasuhiro Sasaki
  • Patent number: 8233753
    Abstract: An electric field sensor or a magnetic field sensor includes an optical fiber and an electro-optic layer or a magneto-optic layer. The electro-optic layer or a magneto-optic layer is provided on an end surface of an end portion of the optical fiber. The end surface of the optical fiber is a convex shape. The optical fiber may have the end portion with a shape of a substantial cone formed by extending the end portion, and the electro-optic layer or the magneto-optic layer may be formed on a side surface of a front end of the substantial cone. A dielectric layer may be further included between the optic layer and the end surface.
    Type: Grant
    Filed: June 23, 2006
    Date of Patent: July 31, 2012
    Assignee: NEC Corporation
    Inventors: Mizuki Iwanami, Masafumi Nakada, Norio Masuda, Keishi Ohashi
  • Publication number: 20120164321
    Abstract: An electric field sensor is obtained by directly forming an electrooptical film of Fabry-Perot resonator structure on a polished surface at a tip of an optical fiber by an aerosol deposition method.
    Type: Application
    Filed: March 5, 2012
    Publication date: June 28, 2012
    Applicant: NEC CORPORATION
    Inventors: Masafumi NAKADA, Mizuki IWANAMI, Keishi OOHASHI, Norio MASUDA
  • Publication number: 20120121217
    Abstract: In an electric/magnetic field probe using an optical fiber, when a stress is applied to the fiber, the polarization state of the light propagating in the fiber changes, and the signal level of the electric or magnetic field detection becomes unstable. For coping with this problem, for suppressing the curve or waggle of the optical fiber caused by a stress applied to the fiber, an electric/magnetic field sensor unit composed of the fiber and EO/MO material is fixed on a quartz substrate, for example, and the part of the fiber other than the sensor unit is stored in an acrylic tube and fixed. Further, polarization adjustment parts like a polarization controller, an optical analyzer or the like is installed in the housing, so that a stress caused by wind pressure or contact is not applied to the fiber connected to the parts.
    Type: Application
    Filed: June 23, 2010
    Publication date: May 17, 2012
    Applicant: NEC CORPORATION
    Inventors: Mizuki Iwanami, Tsuneo Tsukagoshi
  • Publication number: 20120098560
    Abstract: An electromagnetic field measuring apparatus capable of measuring an electromagnetic field for a minuscule area in which electronic devices are densely packed with a high sensitivity is provided. In an electromagnetic field measuring apparatus according to the present invention, the amplitude level of signal light (pf) is adjusted by the analyzer (34) by adjusting its angle with respect to the plane of polarization of the signal light (pf) based on an amplitude level control signal (eb) supplied from the calculation control unit (40). An amplitude level control signal (eb) is supplied from the calculation control unit (40) to the analyzer (34) based on the spectrum (ea) of an electric signal (ed) measured by an RF spectrum analyzer (39). The amplitude level ration between the carrier and the sideband contained in the signal light (ph) incident on the optical receiver (38) is controlled to a fixed value.
    Type: Application
    Filed: May 18, 2010
    Publication date: April 26, 2012
    Inventors: Mizuki Iwanami, Hiroshi Fukuda, Risato Ohhira
  • Patent number: 8153955
    Abstract: An electric field sensor is obtained by directly forming an electrooptical film of Fabry-Perot resonator structure on a polished surface at a tip of an optical fiber by an aerosol deposition method.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: April 10, 2012
    Assignee: NEC Corporation
    Inventors: Masafumi Nakada, Mizuki Iwanami, Keishi Oohashi, Norio Masuda
  • Publication number: 20110001971
    Abstract: There is provided an electromagnetic field measurement apparatus capable of achieving correct and timely circuit operation detection in an area where electronic devices are mounted at high density. An electromagnetic field measurement apparatus includes: a laser light source; a polarized wave controller that linearly polarizes laser light; an optical fiber probe that has an electrooptic material or a magnetooptic material at its leading end and in which the laser light reflected at the leading end is subjected to polarization modulation in accordance with an electric field intensity or a magnetic field intensity; and an analyzer that converts the laser light reflected by the optical fiber probe into intensity modulated light. The laser light source emits time-multiplexed laser light of a plurality of wavelengths different from one another.
    Type: Application
    Filed: February 4, 2009
    Publication date: January 6, 2011
    Inventors: Mizuki Iwanami, Tsuneo Tsukagoshi, Risato Ohhira, Masafumi Nakada, Tomonori Yamada
  • Publication number: 20100109807
    Abstract: A stop band or a pass band is generated in a transmission line filter by providing a plurality of dielectric bodies having a periodic structure in the length direction of the transmission line filter and causing Bragg reflection of transmission wave. A voltage is applied to some or all of the dielectric bodies and the frequency of the stop band or the pass band is changed or controlled by adjusting the voltage.
    Type: Application
    Filed: January 15, 2008
    Publication date: May 6, 2010
    Applicant: NEC CORPORATION
    Inventor: Mizuki Iwanami
  • Publication number: 20090234619
    Abstract: An electric field sensor or a magnetic field sensor includes an optical fiber and an electro-optic layer or a magneto-optic layer. The electro-optic layer or a magneto-optic layer is provided on an end surface of an end portion of the optical fiber. The end surface of the optical fiber is a convex shape. The optical fiber may have the end portion with a shape of a substantial cone formed by extending the end portion, and the electro-optic layer or the magneto-optic layer may be formed on a side surface of a front end of the substantial cone. A dielectric layer may be further included between the optic layer and the end surface.
    Type: Application
    Filed: June 23, 2006
    Publication date: September 17, 2009
    Applicant: NEC CORPORATION
    Inventors: Mizuki Iwanami, Masafumi Nakada, Norio Masuda, Keishi Ohashi
  • Publication number: 20090224753
    Abstract: An electric field sensor is obtained by directly forming an electrooptical film of Fabry-Perot resonator structure on a polished surface at a tip of an optical fiber by an aerosol deposition method.
    Type: Application
    Filed: June 29, 2006
    Publication date: September 10, 2009
    Applicant: NEC CORPORATION
    Inventors: Masafumi Nakada, Mizuki Iwanami, Keishi Oohashi, Norio Masuda
  • Publication number: 20080238419
    Abstract: A condenser lens is incorporated into the end portion of a magnetic field measuring apparatus including a magneto-optical crystal. Alternatively, the end portion of the magnetic field measuring device includes an optical fiber having a core diameter smaller than that of a normal single-mode optical fiber.
    Type: Application
    Filed: April 25, 2008
    Publication date: October 2, 2008
    Applicant: NEC CORPORATION
    Inventors: Mizuki IWANAMI, Shigeki HOSHINO, Masahiro TSUCHIYA, Masato KISHI