Patents by Inventor Molly Piels

Molly Piels has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11747363
    Abstract: Described are various configurations for performing efficient optical and electrical testing of an opto-electrical device using a compact opto-electrical probe. The compact opto-electrical probe can include electrical contacts arranged for a given electrical contact layout of the opto-electrical device, and optical interface with a window in a probe core that transmits light from the opto-electrical device. An adjustable optical coupler of the probe can be mechanically positioned to receive light from the device's emitter to perform simultaneous optical and electrical analysis of the device.
    Type: Grant
    Filed: December 16, 2021
    Date of Patent: September 5, 2023
    Assignee: OpenLight Photonics, Inc.
    Inventors: Molly Piels, Anand Ramaswamy, Brandon Gomez
  • Publication number: 20230216271
    Abstract: A symmetric distributed feedback (DFB) laser that is integrated in a silicon based photonic integrated circuit can output light from both sides of the symmetric DFB laser onto waveguides. The light in the waveguides can be phase adjusted and combined using an optical coupler. The symmetric DFB laser can generate light and symmetrically output light onto different lanes of a multi-lane transmitter.
    Type: Application
    Filed: December 30, 2021
    Publication date: July 6, 2023
    Inventors: John Parker, Molly Piels, Hanxing Shi
  • Publication number: 20220107341
    Abstract: Described are various configurations for performing efficient optical and electrical testing of an opto-electrical device using a compact opto-electrical probe. The compact opto-electrical probe can include electrical contacts arranged for a given electrical contact layout of the opto-electrical device, and optical interface with a window in a probe core that transmits light from the opto-electrical device. An adjustable optical coupler of the probe can be mechanically positioned to receive light from the device's emitter to perform simultaneous optical and electrical analysis of the device.
    Type: Application
    Filed: December 16, 2021
    Publication date: April 7, 2022
    Inventors: Molly Piels, Anand Ramaswamy, Brandon Gomez
  • Patent number: 11243230
    Abstract: Described are various configurations for performing efficient optical and electrical testing of an opto-electrical device using a compact opto-electrical probe. The compact opto-electrical probe can include electrical contacts arranged for a given electrical contact layout of the opto-electrical device, and optical interface with a window in a probe core that transmits light from the opto-electrical device. An adjustable optical coupler of the probe can be mechanically positioned to receive light from the device's emitter to perform simultaneous optical and electrical analysis of the device.
    Type: Grant
    Filed: December 30, 2019
    Date of Patent: February 8, 2022
    Assignee: Juniper Networks, Inc.
    Inventors: Molly Piels, Anand Ramaswamy, Brandon Gomez
  • Publication number: 20220029705
    Abstract: An optical device such as an optical transceiver can include a cascaded built-in self-test structure that can be configured in testing mode using an active power mode and can sufficiently attenuate light away from a loopback path in an inactive power mode. The optical device can include a wafer top emitter that can be used to tune a light source for testing and calibration of optical components while the built-in self-test structure is in active mode.
    Type: Application
    Filed: September 15, 2021
    Publication date: January 27, 2022
    Inventors: John Parker, John Garcia, Brandon Gomez, Molly Piels, Anand Ramaswamy
  • Patent number: 11153009
    Abstract: An optical device such as an optical transceiver can include a cascaded built-in self-test structure that can be configured in testing mode using an active power mode and can sufficiently attenuate light away from a loopback path in an inactive power mode. The optical device can include a wafer top emitter that can be used to tune a light source for testing and calibration of optical components while the built-in self-test structure is in active mode.
    Type: Grant
    Filed: July 21, 2020
    Date of Patent: October 19, 2021
    Assignee: Juniper Networks, Inc.
    Inventors: John Parker, John Garcia, Brandon Gomez, Molly Piels, Anand Ramaswamy
  • Publication number: 20210199691
    Abstract: Described are various configurations for performing efficient optical and electrical testing of an opto-electrical device using a compact opto-electrical probe. The compact opto-electrical probe can include electrical contacts arranged for a given electrical contact layout of the opto-electrical device, and optical interface with a window in a probe core that transmits light from the opto-electrical device. An adjustable optical coupler of the probe can be mechanically positioned to receive light from the device's emitter to perform simultaneous optical and electrical analysis of the device.
    Type: Application
    Filed: December 30, 2019
    Publication date: July 1, 2021
    Inventors: Molly Piels, Anand Ramaswamy, Brandon Gomez