Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for classifying queries. One of the methods includes the actions of obtaining a collection of search queries; for each query in the collection of search queries, determining whether other queries in the collection of search queries are refinements of the query, wherein the refinements of each query include the query terms and one or more additional terms not found in the query; determining a similarity between query pairs from the collection, wherein the similarity between a query pair is determined using the additional query terms from the refinements of the respective search queries of the query pair; obtaining a classified sample group of search queries using a plurality of category labels; and classifying each other search query of the collection of search queries having one or more refinements.

Abstract: A method of generating pseudo-random numbers on a parallel processing system comprises generating a plurality of sub-streams of pseudo-random numbers, wherein the sub-streams are generated in parallel by one or more co-processors, and providing the plurality of sub-streams to respective processing elements, wherein the respective processing elements employ the plurality of sub-streams to execute an application.

Abstract: In general, in one aspect, a first request to provide one or more advertisements on a first web page is received, the first web page comprising one or more items of web content related to a query. A first quality score is calculated for a first advertisement included in a set of one or more candidate advertisements. The first advertisement is presented on the first web page based at least in part on the first quality score. A second request is received to provide one or more advertisements on a second web page, the second web page comprising one or more different items of web content related to the query. A second quality score for the first advertisement is calculated based at least in part on the previous presentation of the first advertisement. It is determined whether to present the first advertisement on the second web page based at least in part on the second quality score.

Abstract: Methods and systems to modify the number and/or positioning of advertisements presented to a user based on that user's activity patterns (e.g., previous queries, query result selections, ad selections, etc.) and the order in which events constituting the activity patterns occurred. For example, the methods and systems can be based on a Markov model utilizing the user's activity patterns.

Abstract: This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light from top of the wafer.

Abstract: This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light to/from the top of a wafer. A wafer level test system uses optical and electronic probes to search for and align with an optoelectronic alignment structure. The test system uses a located optoelectronic alignment structure as a reference point to locate other devices on the wafer. The system tests the operation of selected devices disposed on the wafer. The optoelectronic alignment loop is also used as an alignment reference of known performance for an adjacent device of unknown performance.

Abstract: This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light to/from the top of the wafer. A wafer level test system uses an optical probe to search for and align with an optical alignment loop. The test system uses a located alignment loop as a reference point to locate other devices on the wafer. The test system tests the operation of selected devices disposed on the wafer. The alignment loop is also used as a reference device for an adjacent device of unknown performance.

Abstract: A method of generating pseudo-random numbers on a parallel processing system comprises generating a plurality of sub-streams of pseudo-random numbers, wherein the sub-streams are generated in parallel by one or more co-processors, and providing the plurality of sub-streams to respective processing elements, wherein the respective processing elements employ the plurality of sub-streams to execute an application.

Abstract: This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light to/from the top of a wafer. A wafer level test system uses optical and electronic probes to search for and align with an optoelectronic alignment structure. The test system uses a located optoelectronic alignment structure as a reference point to locate other devices on the wafer. The system tests the operation of selected devices disposed on the wafer. The optoelectronic alignment loop is also used as an alignment reference of known performance for an adjacent device of unknown performance.

Abstract: This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light from top of the wafer.

Abstract: This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light to/from the top of the wafer. A wafer level test system uses an optical probe to search for and align with an optical alignment loop. The test system uses a located alignment loop as a reference point to locate other devices on the wafer. The test system tests the operation of selected devices disposed on the wafer. The alignment loop is also used as a reference device for an adjacent device of unknown performance.

Abstract: This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light to/from the top of the wafer. During the optical testing, the vertical spacing between an optical probe and the wafer is set to a very close distance, to achieve efficient optical coupling. It is beneficial to keep this close distance during optical testing as a constant in testing different optical components at different locations on the wafer. In one implementation, a spacing sensor may be used to measure the height of the optical probe from the wafer surface. This sensor may be a capacitance sensor that is mounted at the optical probe.

Abstract: This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light from top of the wafer.

Abstract: This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical and optoelectronic testing by coupling probe light to/from the top of the wafer. In the described exemplary implementations, wafers are designed with one or more optical alignment features or structures. The alignment structures are alongside the devices to be tested, but are easier to find or locate by optical means, than the devices to be tested. An optical diffraction grating structure such as a Littrow grating may be used as reflective alignment structures. (FIG. 6B and paragraph 56.) A Littrow grating as an alignment structure produces a retro-reflection. A Littrow grating is a one-port optical device, with input and output beams going along the same path. Various exemplary implementations are shown in FIGS. 3C, 5, 6A, 6B, 7A and 7B and described in paragraphs 18–21, 39–40 and 53–64.

Abstract: A method and apparatus for assembling software components into an application. In an embodiment, the apparatus generally relates to an application creator which assembles software modules at run time into a container application. The container application supports interface inheritance and implementation inheritance from an existing software component.