Abstract: An optical heterodyne interference measurement apparatus includes a beam generation unit, a beam splitter, a mirror, a first photodetector, a linear polarizer, a second photodetector, a linear polarizer, an AD conversion unit, and a computer. The beam generation unit generates and outputs a first light beam and a second light beam having polarizations orthogonal to each other. The first light beam and the second light beam have optical frequencies different from each other by a heterodyne frequency. The computer sets, when ?p is set to any peak frequency being temporally constant in a frequency spectrum of intensity noise included in the first light beam or the second light beam output from the beam generation unit, the heterodyne frequency ?h to a value of a rational multiple of the peak frequency ?p.

Abstract: A distance image acquisition apparatus includes a light source, an irradiation optical system, an imaging optical system, an imaging element, and a processing unit. The imaging element receives a light pulse output from the light source, reflected by an object, and passed through the imaging optical system on a light receiving surface. Each of a plurality of pixels on the light receiving surface includes a photodiode for generating charges by receiving light, and a charge accumulation portion for accumulating the charges generated in the photodiode. The processing unit commonly applies a control pattern to the plurality of pixels. The control pattern indicates a period in which the charges generated in the photodiode are accumulated in the charge accumulation portion. The processing unit acquires a distance image of the object based on an amount of charges generated in the photodiode and accumulated in the charge accumulation portion.

Abstract: A shape measurement apparatus includes a light source, an irradiation optical system, an imaging optical system, a spatial light modulator, a focusing optical system, a linear sensor, and a processing unit. The irradiation optical system forms the light into a line shape and irradiates an object. The imaging optical system forms an image of the light reflected by the object. The spatial light modulator, in which a one-dimensional intensity modulation pattern is set on a light modulation plane, spatially intensity-modulates and outputs the light. The focusing optical system focuses the light output from the spatial light modulator in a line shape. The linear sensor receives the light focused in the line shape by pixels. The processing unit performs analysis by the compressive sensing technique for each of the pixels based on the intensity modulation pattern and an output signal from the linear sensor.