Patents by Inventor Naoki Takeda

Naoki Takeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11940347
    Abstract: A pressure sensor has a stem in which a pressure introduction hole into which a pressure medium is introduced and a diaphragm deformable according to the pressure of the pressure medium are formed, and a strain detecting element which is arranged on the diaphragm via an insulating film and being configured to output a detection signal according to the deformation of the diaphragm. The strain detecting element is configured to have a portion made of polysilicon. A low doping layer having a higher electrical resistivity than polysilicon and a higher crystallinity than the insulating film is arranged between the insulating film and the strain detecting element.
    Type: Grant
    Filed: October 22, 2021
    Date of Patent: March 26, 2024
    Assignees: DENSO CORPORATION, NAGANO KEIKI CO., LTD.
    Inventors: Hiroshi Kodama, Naoki Yoshida, Kaori Miyashita, Eiji Takeda, Nobuaki Yamada, Yoshihiro Tomomatsu, Yasushi Yanagisawa, Yusuke Midorikawa, Shirou Kamanaru, Kenichi Yokoyama, Inao Toyoda, Hisayuki Takeuchi, Naohisa Niimi, Masao Takahashi, Yasutake Ura, Kouji Asano, Yukihiro Kamada
  • Publication number: 20240096101
    Abstract: A server includes a control unit. The control unit determines whether a parked vehicle is used as a shelter based on a first image which is included in an image captured by a camera and which is obtained by imaging the vehicle and surroundings of the vehicle.
    Type: Application
    Filed: November 28, 2023
    Publication date: March 21, 2024
    Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Yui SUGIE, Koichi SUZUKI, Naoki UENOYAMA, Hiroki TAKEDA, Hirohiko MORIKAWA, Genshi KUNO
  • Patent number: 11923760
    Abstract: A switching power supply apparatus has a line-to-ground capacitance C31 between a first winding terminal of a transformer and a conductor portion, and a line-to-ground capacitance C32 between a second winding terminal of the transformer and the conductor portion. The switching power supply apparatus is provided with a capacitor being connected between a first output terminal of a switching circuit and the first winding terminal of the transformer, and a capacitor being connected between a second output terminal of the switching circuit and the second winding terminal of the transformer. Capacitances of the capacitors C21, C22 are set to satisfy: C21>C22, for C31>C32; C21=C22, for C31=C32; and C21<C22, for C31<C32.
    Type: Grant
    Filed: February 12, 2020
    Date of Patent: March 5, 2024
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Naoki Sawada, Taiki Nishimoto, Noriaki Takeda
  • Publication number: 20230384340
    Abstract: A fluid measurement system includes a first sensor and a second sensor disposed on a same pipe and spaced apart from each other by a predetermined distance; and a measurement controller configured to calculate a flow velocity of a fluid flowing through the pipe based on first output that is output from the first sensor and second output that is output from the second sensor. The measurement controller performs a process including (a) comparing the first output and the second output in a first period of time so as to repeatedly calculate a first time difference between the first output and the second output while shifting the first period of time, (b) calculating a second time difference based on a frequency of occurrence of a plurality of first time differences each calculated in the first period of time, and (c) calculating the flow velocity based on the second time difference.
    Type: Application
    Filed: March 14, 2023
    Publication date: November 30, 2023
    Inventors: Naomichi JIMBO, Naoki TAKEDA
  • Publication number: 20230288328
    Abstract: A laser gas analyzer includes a light emitting unit including a laser element configured to emit laser light having a target wavelength band including a wavelength of an absorption line spectrum of the target gas, and a modulated light generation unit configured to supply a drive current to the laser element so that the laser element sweeps and modulates the laser light to have the target wavelength band, and a light receiving unit including a light receiving element configured to receive the laser light passing through the target space and output a detection signal, and a light reception signal processing unit configured to analyze the target gas according to the detection signal from the light receiving element. The light emitting unit and the light receiving unit communicate with each other using the laser light.
    Type: Application
    Filed: January 30, 2023
    Publication date: September 14, 2023
    Applicant: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki TAKEDA, Ikumi YOSHIMINE
  • Publication number: 20230280285
    Abstract: A sensor system for measuring a gas liquid ratio of a two-phase fluid that flows through a pipe is provided. The sensor system includes a transmitter configured to transmit a radio wave into the pipe. The sensor system includes a receiver configured to receive the radio wave through the pipe. The sensor system includes a controller configured to calculate the gas liquid ratio based on both the radio wave received by the receiver and a decay time taken for attenuation of the radio wave after the transmitter terminates the transmission of the radio wave.
    Type: Application
    Filed: January 24, 2023
    Publication date: September 7, 2023
    Inventors: Naomichi JIMBO, Naoki TAKEDA
  • Patent number: 11652023
    Abstract: Provided is a highly reliable semiconductor device capable of reducing stress generated in a semiconductor element even when a highly elastic joining material such as a Pb-free material is used in a power semiconductor having a double-sided mounting structure. The semiconductor device includes a semiconductor element including a gate electrode only on one surface, an upper electrode connected to the surface of the semiconductor element on which the gate electrode is provided, and a lower electrode connected to a surface opposite to the surface of the semiconductor element on which the gate electrode is provided.
    Type: Grant
    Filed: October 23, 2020
    Date of Patent: May 16, 2023
    Assignee: Hitachi Power Semiconductor Device, Ltd.
    Inventors: Naoki Takeda, Tomohiro Onda, Kenya Kawano, Hiroshi Shintani, Yu Harubeppu, Hisashi Tanie
  • Publication number: 20230074352
    Abstract: Provide is a highly reliable semiconductor device in which stress generated in a semiconductor chip is reduced and an increase in thermal resistance is suppressed. The semiconductor device includes: a semiconductor chip including a first main electrode on one surface thereof and a second main electrode and a gate electrode on the other surface thereof; a first electrode connected to the one surface of the semiconductor chip via a first bonding material; and a second electrode connected to the other surface of the semiconductor chip via a second bonding material. The first electrode is a plate-shaped electrode and has a groove in a region overlapping with the semiconductor chip. The groove penetrates in a thickness direction of the first electrode and reaches an end portion of the first electrode when viewed in a plan view.
    Type: Application
    Filed: July 27, 2022
    Publication date: March 9, 2023
    Applicant: Hitachi Power Semiconductor Device, Ltd.
    Inventors: Naoki TAKEDA, Hisashi TANIE, Kisho ASHIDA, Yu HARUBEPPU, Tomohiro ONDA, Masato NAKAMURA
  • Patent number: 11022534
    Abstract: An analyzing device is provided, which can accurately analyze information related to generation sources. A generation source analyzing device is provided, which includes a measurement value acquiring unit to acquire time-series measurement values of a concentration of each of a plurality of measured object components at a measurement point, a correlation calculating unit to calculate a correlation value between the time-series measurement values of at least one set of the measured object components, and a generation source analyzing unit to analyze information related to generation sources of at least one measured object component based on the correlation value calculated by the correlation calculating unit.
    Type: Grant
    Filed: February 22, 2018
    Date of Patent: June 1, 2021
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Bo Li, Yoshiki Hasegawa, Kazuhiro Koizumi, Yu Kawamura
  • Publication number: 20210143081
    Abstract: Provided is a highly reliable semiconductor device capable of reducing stress generated in a semiconductor element even when a highly elastic joining material such as a Pb-free material is used in a power semiconductor having a double-sided mounting structure. The semiconductor device includes a semiconductor element including a gate electrode only on one surface, an upper electrode connected to the surface of the semiconductor element on which the gate electrode is provided, and a lower electrode connected to a surface opposite to the surface of the semiconductor element on which the gate electrode is provided.
    Type: Application
    Filed: October 23, 2020
    Publication date: May 13, 2021
    Inventors: Naoki TAKEDA, Tomohiro ONDA, Kenya KAWANO, Hiroshi SHINTANI, Yu HARUBEPPU, Hisashi TANIE
  • Patent number: 10951684
    Abstract: A non-limiting example information processing system includes a plurality of user terminals, and a download task list for each user terminal is managed by a list server. Existence/non-existence of renewal of the download task list is managed by a revision server, and the user terminal inquires of the revision server the existence/non-existence of the renewal. If the download task list is renewed, the user terminal acquires the download task list from the list server, and acquires a content from a content server according to an acquired download task list.
    Type: Grant
    Filed: September 26, 2014
    Date of Patent: March 16, 2021
    Assignee: NINTENDO CO., LTD.
    Inventors: Teruhiko Goda, Naoki Takeda, Eiji Tokunaga, Koichi Nakao
  • Patent number: 10659565
    Abstract: A non-limiting example information processing system includes a plurality of user terminals, and a download task list for each user terminal is managed by a list server. The download task list includes a list for each user terminal and a list for each of groups into which a plurality of user terminals are classified. If the download task list is renewed, the user terminal acquires the download task list from the list server, and acquires a content from a content server according to an acquired download task list.
    Type: Grant
    Filed: September 26, 2014
    Date of Patent: May 19, 2020
    Assignee: NINTENDO CO., LTD.
    Inventors: Teruhiko Goda, Naoki Takeda, Eiji Tokunaga, Koichi Nakao
  • Patent number: 10356370
    Abstract: A feature extracting unit obtains sensor data from a plurality of sensors to calculate each feature. When an event determining unit determines the occurrence of an event based on each feature, a display data constructor generates remote-controller display data for displaying the event, and controls a remote-controller display device to display the remote-controller display data. When a user decision is input from a user input IF based on this display, a control unit controls the sensors to be turned ON or OFF. When an infrared sensor detects an abnormality, a microwave sensor whose power consumption is small after the infrared sensor is turned ON. When the microwave sensor detects an abnormality, a video camera and a microphone are turned ON, and the microwave sensor is turned OFF. A communication unit wirelessly transmits an image signal captured by the video camera and an audio signal processed by the microphone.
    Type: Grant
    Filed: June 9, 2017
    Date of Patent: July 16, 2019
    Assignee: Sony Corporation
    Inventors: Tetsujiro Kondo, Naoki Kobayashi, Yasuhiro Fujimori, Yasuaki Takahashi, Koji Ohta, Naoki Takeda
  • Patent number: 10302610
    Abstract: To analyze a generation source of a target component emitted in a form of a gas. To provide a generation source analyzing device comprising an acquiring section which acquires a concentration measurement value of a gas which includes a target component, and a concentration measurement value of a particle component which is generated in association with the gas, and an analyzing section which analyzes a distance from a measurement point to a generation source of the target component based on a concentration measurement value of the gas and a concentration measurement value of the particle component. The acquiring section may acquire a concentration measurement value of a precursor gas which becomes a raw material which generates the particle component, and a concentration measurement value of a secondary generated particle component which is generated from the precursor gas.
    Type: Grant
    Filed: April 24, 2017
    Date of Patent: May 28, 2019
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Yoshiki Hasegawa, Kazuhiro Koizumi, Bo Li
  • Patent number: 10283337
    Abstract: Despite the desire to measure the composition and concentration of the microparticles included in a gaseous body sample serving as the measurement target, there is a problem that measurement cannot be performed accurately due to the effect of substances other than the gaseous body sample adsorbing to a trapping body of the analyzing apparatus that traps the microparticles, for example. Therefore, provided is a microparticle composition analyzing apparatus that analyzes composition of microparticles contained in a gaseous body sample, comprising a gas analyzer and a control section that sequentially introduces into the gas analyzer a comparative gas and a sample gas caused by the microparticles generated by irradiating the gaseous body sample with a laser.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: May 7, 2019
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Kazuhiro Koizumi, Takamasa Asano, Yoshiki Hasegawa
  • Publication number: 20180292302
    Abstract: An analyzing device is provided, which can accurately analyze information related to generation sources. A generation source analyzing device is provided, which includes a measurement value acquiring unit to acquire time-series measurement values of a concentration of each of a plurality of measured object components at a measurement point, a correlation calculating unit to calculate a correlation value between the time-series measurement values of at least one set of the measured object components, and a generation source analyzing unit to analyze information related to generation sources of at least one measured object component based on the correlation value calculated by the correlation calculating unit.
    Type: Application
    Filed: February 22, 2018
    Publication date: October 11, 2018
    Inventors: Naoki TAKEDA, Bo LI, Yoshiki HASEGAWA, Kazuhiro KOIZUMI, Yu KAWAMURA
  • Patent number: 10012628
    Abstract: A multifunctional particle analysis device includes a particle measuring device and a particle composition analysis device. Calibration particles for which at least the number, size, and composition thereof are known are input to the particle measuring device and the particle composition analysis device and analyzed. The sensitivity of the particle measuring device is calibrated in accordance with the number and size of the calibration particles as measured by the particle measuring device, and the sensitivity of the particle composition analysis device is calibrated in accordance with the mass composition of the calibration particles as measured by the particle composition analysis device. Moreover, the irradiation axis of particles that enter the particle composition analysis device relative to a capturing unit is calibrated in accordance with a state in which the calibration particles are captured on the capturing unit of the particle composition analysis device.
    Type: Grant
    Filed: March 11, 2016
    Date of Patent: July 3, 2018
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yoshiki Hasegawa, Kazuhiro Koizumi, Takamasa Asano, Naoki Takeda
  • Patent number: 9857282
    Abstract: A particle analyzing apparatus including a particle measuring section that measures a number or concentration of particles in a sample gas; a component analyzing section that measures an amount of each component of the particles in the sample gas; a flow path that branches into a first flow path that introduces the sample gas to the particle measuring section and a second flow path that introduces the sample gas to the component analyzing section; a first adjusting section that is provided in the first flow path and dilutes the sample gas with a dilution gas and introduces the diluted sample gas to the particle measuring section to adjust a measurement range of the particle measuring section; and a second adjusting section that is provided in the second flow path and adjusts an introduction time during which the sample gas is introduced to the component analyzing section.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: January 2, 2018
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yoshiki Hasegawa, Naoki Takeda, Kazuhiro Koizumi, Takamasa Asano
  • Patent number: 9851292
    Abstract: A particle detection device includes a scattered light detector detecting an intensity of light scattered by a particle irradiated with a laser, an incandescent light detector detecting an intensity of incandescent light from the particle being irradiated with the laser, and a signal processor including: a first peak hold circuit holding a peak in the intensity of the light scattered by the particle; a second peak hold circuit holding a peak in the intensity of the incandescent light from the particle; and a threshold value comparison circuit comparing the peak in the first peak hold circuit to a threshold and, when the peak in the first peak hold circuit exceeds the threshold, outputs a reset signal to the second peak hold circuit immediately thereafter so the peak previously in the second peak hold circuit is reset immediately after the peak in the first peak hold circuit exceeds the threshold.
    Type: Grant
    Filed: June 9, 2016
    Date of Patent: December 26, 2017
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Masaya Tabaru, Naoki Takeda, Kazuhiro Koizumi, Noritomo Hirayama
  • Publication number: 20170315105
    Abstract: To analyze a generation source of a target component emitted in a form of a gas. To provide a generation source analyzing device comprising an acquiring section which acquires a concentration measurement value of a gas which includes a target component, and a concentration measurement value of a particle component which is generated in association with the gas, and an analyzing section which analyzes a distance from a measurement point to a generation source of the target component based on a concentration measurement value of the gas and a concentration measurement value of the particle component. The acquiring section may acquire a concentration measurement value of a precursor gas which becomes a raw material which generates the particle component, and a concentration measurement value of a secondary generated particle component which is generated from the precursor gas.
    Type: Application
    Filed: April 24, 2017
    Publication date: November 2, 2017
    Inventors: Naoki TAKEDA, Yoshiki HASEGAWA, Kazuhiro KOIZUMI, Bo LI