Abstract: A vehicle control system includes: a vehicle including an operation device; a first communication device; and a second communication device. In a case in which the first communication device is positioned in a first area containing a position of the vehicle, the vehicle operates in an operation waiting state in which the operation device is allowed to receive an operation. In a case in which the second communication device is positioned in a second area contained in the first area and smaller than the first area, the vehicle operates in the operation waiting state. In a case in which the first communication device is positioned in the first area and the second communication device is positioned in the second area, the second communication device generates a notification indicating that the vehicle is in the operation waiting state.

Abstract: A semiconductor device according to an embodiment includes a holding circuit including a buffer configured to obtain a heat stress information having a temperature dependency every predetermined period and a stress counter configured to accumulate the heat stress information and hold the accumulated value as a cumulative stress count value, a control circuit including an operation determination threshold value, and a wireless communication circuit. According to the semiconductor device according to the embodiment, while reducing the power consumption, it is possible to wirelessly transmit the cumulative heat stress information.

Abstract: The semiconductor device has a module having a predetermined function, an error information acquisition circuit for acquiring error information about an error occurring in the module, a stress acquisition circuit for acquiring a stress accumulated value as an accumulated value of stress applied to the semiconductor device, and an analysis data storage for storing analysis data as data for analyzing the state of the semiconductor device, the error information and the stress accumulated value at the time of occurrence of the error being associated with each other.

Abstract: A semiconductor device according to an embodiment includes a holding circuit including a buffer configured to obtain a heat stress information having a temperature dependency every predetermined period and a stress counter configured to accumulate the heat stress information and hold the accumulated value as a cumulative stress count value, a control circuit including an operation determination threshold value, and a wireless communication circuit. According to the semiconductor device according to the embodiment, while reducing the power consumption, it is possible to wirelessly transmit the cumulative heat stress information.

Abstract: The semiconductor device has a module having a predetermined function, an error information acquisition circuit for acquiring error information about an error occurring in the module, a stress acquisition circuit for acquiring a stress accumulated value as an accumulated value of stress applied to the semiconductor device, and an analysis data storage for storing analysis data as data for analyzing the state of the semiconductor device, the error information and the stress accumulated value at the time of occurrence of the error being associated with each other.

Abstract: The present invention provides a method in which a counting source is provided in data after analog/digital conversion to lessen a load placed when new and old data after the conversion are compared to each other. A log function is prepared in an A/D conversion controlling circuit. The log function latches the output of a counter in a 12-bit digital/analog converter at the timing of outputting a pulse from a comparator to determine data written into a data register group. In the case where a setting item related to log output in an ADCR is set at 1, not only the output of the 12-bit digital/analog converter, but also the output of a timer counter of an MTU is latched as a log.

Abstract: The present invention provides a method in which a counting source is provided in data after analog/digital conversion to lessen a load placed when new and old data after the conversion are compared to each other. A log function is prepared in an A/D conversion controlling circuit. The log function latches the output of a counter in a 12-bit digital/analog converter at the timing of outputting a pulse from a comparator to determine data written into a data register group. In the case where a setting item related to log output in an ADCR is set at 1, not only the output of the 12-bit digital/analog converter, but also the output of a timer counter of an MTU is latched as a log.

Abstract: The present invention provides a method in which a counting source is provided in data after analog/digital conversion to lessen a load placed when new and old data after the conversion are compared to each other. A log function is prepared in an A/D conversion controlling circuit. The log function latches the output of a counter in a 12-bit digital/analog converter at the timing of outputting a pulse from a comparator to determine data written into a data register group. In the case where a setting item related to log output in an ADCR is set at 1, not only the output of the 12-bit digital/analog converter, but also the output of a timer counter of an MTU is latched as a log.

Abstract: The present invention provides a method in which a counting source is provided in data after analog/digital conversion to lessen a load placed when new and old data after the conversion are compared to each other. A log function is prepared in an A/D conversion controlling circuit. The log function latches the output of a counter in a 12-bit digital/analog converter at the timing of outputting a pulse from a comparator to determine data written into a data register group. In the case where a setting item related to log output in an ADCR is set at 1, not only the output of the 12-bit digital/analog converter, but also the output of a timer counter of an MTU is latched as a log.