Patents by Inventor Nicholas Roman Pogranichniy

Nicholas Roman Pogranichniy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200174142
    Abstract: The present disclosure provides a system and method for efficiently mining multi-threshold measurements acquired using photon counting pixel-array detectors for spectral imaging and diffraction analyses. Images of X-ray intensity as a function of X-ray energy were recorded on a 6 megapixel X-ray photon counting array detector through linear fitting of the measured counts recorded as a function of counting threshold. An analytical model is disclosed for describing the probability density of detected voltage, utilizing fractional photon counting to account for edge/corner effects from voltage plumes that spread across multiple pixels. Three-parameter fits to the model were independently performed for each pixel in the array for X-ray scattering images acquired for 13.5 keV and 15.0 keV X-ray energies. From the established pixel responses, multi-threshold composite images produced from the sum of 13.5 keV and 15.
    Type: Application
    Filed: December 4, 2018
    Publication date: June 4, 2020
    Applicant: PURDUE RESEARCH FOUNDATION
    Inventors: Garth Jason Simpson, Ryan Douglas Muir, Nicholas Roman Pogranichniy
  • Patent number: 10145968
    Abstract: The present disclosure provides a system and method for efficiently mining multi-threshold measurements acquired using photon counting pixel-array detectors for spectral imaging and diffraction analyses. Images of X-ray intensity as a function of X-ray energy were recorded on a 6 megapixel X-ray photon counting array detector through linear fitting of the measured counts recorded as a function of counting threshold. An analytical model is disclosed for describing the probability density of detected voltage, utilizing fractional photon counting to account for edge/corner effects from voltage plumes that spread across multiple pixels. Three-parameter fits to the model were independently performed for each pixel in the array for X-ray scattering images acquired for 13.5 keV and 15.0 keV X-ray energies. From the established pixel responses, multi-threshold composite images produced from the sum of 13.5 keV and 15.
    Type: Grant
    Filed: May 11, 2015
    Date of Patent: December 4, 2018
    Assignee: PURDUE RESEARCH FOUNDATION
    Inventors: Garth Jason Simpson, Ryan Douglas Muir, Nicholas Roman Pogranichniy
  • Patent number: 10113965
    Abstract: Methods for determining the 3-D structures of proteins. Such a method includes incorporating a compound into a protein crystal such that the compound enhances the activity of the protein crystal to second harmonic generation, illuminating the protein crystal with a sufficiently intense light to cause second harmonic generation by the protein crystal, and detecting a second harmonic generation response produced by the protein crystal that is suitable for protein structure determination by diffraction analysis.
    Type: Grant
    Filed: March 4, 2016
    Date of Patent: October 30, 2018
    Assignee: Purdue Research Foundation
    Inventors: Garth Jason Simpson, Justin Allen Newman, Nicholas Roman Pogranichniy, Nicole Mulready Scarborough
  • Publication number: 20180052103
    Abstract: Methods for determining the 3-D structures of proteins. Such a method includes incorporating a compound into a protein crystal such that the compound enhances the activity of the protein crystal to second harmonic generation, illuminating the protein crystal with a sufficiently intense light to cause second harmonic generation by the protein crystal, and detecting a second harmonic generation response produced by the protein crystal that is suitable for protein structure determination by diffraction analysis.
    Type: Application
    Filed: March 4, 2016
    Publication date: February 22, 2018
    Inventors: Garth Jason Simpson, Justin Allen Newman, Nicholas Roman Pogranichniy, Nicole Mulready Scarborough
  • Publication number: 20150323687
    Abstract: The present disclosure provides a system and method for efficiently mining multi-threshold measurements acquired using photon counting pixel-array detectors for spectral imaging and diffraction analyses. Images of X-ray intensity as a function of X-ray energy were recorded on a 6 megapixel X-ray photon counting array detector through linear fitting of the measured counts recorded as a function of counting threshold. An analytical model is disclosed for describing the probability density of detected voltage, utilizing fractional photon counting to account for edge/corner effects from voltage plumes that spread across multiple pixels. Three-parameter fits to the model were independently performed for each pixel in the array for X-ray scattering images acquired for 13.5 keV and 15.0 keV X-ray energies. From the established pixel responses, multi-threshold composite images produced from the sum of 13.5 keV and 15.
    Type: Application
    Filed: May 11, 2015
    Publication date: November 12, 2015
    Applicant: PURDUE RESEARCH FOUNDATION
    Inventors: Garth Jason Simpson, Ryan Douglas Muir, Nicholas Roman Pogranichniy