Patents by Inventor Nobuaki Sakai

Nobuaki Sakai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210323327
    Abstract: A recording device includes a first cover that is movable with respect to a recording unit that performs recording on a sheet, and that moves to a first open position for opening a space where the recording medium to be recorded by the recording unit is transported, and to a first closed position for closing the space, and a second cover movable with respect to the first cover. A movement direction of the first cover includes the same directional component as a movement direction of the second cover with respect to the recording unit, and a first coupling portion that couples the first cover and the second cover is provided in the recording device.
    Type: Application
    Filed: April 13, 2021
    Publication date: October 21, 2021
    Inventors: Nobuaki SAKAI, Yukiya BEPPU
  • Patent number: 10928417
    Abstract: An atomic force microscope includes a raster scan control mechanism configured to perform a raster scan between a cantilever having a probe at a free end and a sample relative to each other across an XY plane in a fluid, an interaction control mechanism configured to vibrate the cantilever and to control an interaction generated between the probe and the sample, and a sample information acquisition circuit configured to acquire sample information including inclination information of a sample surface with respect to the XY plane based on a control result of the interaction control mechanism. The interaction control mechanism is configured to control the interaction generated between the probe and the sample in accordance with inclination of the sample surface with respect to the XY plane.
    Type: Grant
    Filed: November 13, 2019
    Date of Patent: February 23, 2021
    Assignee: OLYMPUS CORPORATION
    Inventor: Nobuaki Sakai
  • Publication number: 20210039395
    Abstract: An ink storing device includes an ink tank having an injection port, a first cover including a cap configured to close the injection port, the first cover being movable between a closing position, and an opening position, a second cover including, at an inner face thereof, a display unit configured to display information relating to the ink, the second cover being movable between a covering position at which the inner face covers the first cover at the closing position, with the inner face being oriented downward, and a cover opening position at which the inner face does not cover the first cover at the closing position, wherein the cap, when viewed in a vertical direction, does not overlap the display unit included in the second cover at the cover opening position when the first cover moves between the closing position and the opening position.
    Type: Application
    Filed: August 6, 2020
    Publication date: February 11, 2021
    Inventors: Koki FUKASAWA, Nobuaki SAKAI
  • Patent number: 10639887
    Abstract: A printing apparatus includes a transport unit that transports a medium in a transport direction, a printing unit that prints on a printing surface of the medium, and a removal unit that is provided on an upstream side in the transport direction with respect to the transport unit and is provided so as to come into contact with the printing surface.
    Type: Grant
    Filed: January 31, 2017
    Date of Patent: May 5, 2020
    Assignee: Seiko Epson Corporation
    Inventors: Nobuaki Sakai, Takao Yamamoto, Akira Ishikawa, Yusuke Makishima, Daiki Ishikawa
  • Publication number: 20200081032
    Abstract: An atomic force microscope includes a raster scan control mechanism configured to perform a raster scan between a cantilever having a probe at a free end and a sample relative to each other across an XY plane in a fluid, an interaction control mechanism configured to vibrate the cantilever and to control an interaction generated between the probe and the sample, and a sample information acquisition circuit configured to acquire sample information including inclination information of a sample surface with respect to the XY plane based on a control result of the interaction control mechanism. The interaction control mechanism is configured to control the interaction generated between the probe and the sample in accordance with inclination of the sample surface with respect to the XY plane.
    Type: Application
    Filed: November 13, 2019
    Publication date: March 12, 2020
    Applicant: OLYMPUS CORPORATION
    Inventor: Nobuaki SAKAI
  • Publication number: 20190047285
    Abstract: A printing apparatus includes a transport unit 30 that transports a medium M in a transport direction F, a printing unit that prints on a printing surface M1 of the medium M, and a removal unit 60 that is provided on an upstream side in the transport direction F with respect to the transport unit 30 and is provided so as to come into contact with the printing surface M1.
    Type: Application
    Filed: January 31, 2017
    Publication date: February 14, 2019
    Inventors: Nobuaki SAKAI, Takao YAMAMOTO, Akira ISHIKAWA, Yusuke MAKISHIMA, Daiki ISHIKAWA
  • Publication number: 20190011478
    Abstract: An observation method using a compound microscope of an inverted optical microscope and an atomic force microscope includes scanning a cantilever so that a probe approaches a sample until surface layer information is acquired, observing the cantilever through the optical microscope to acquire shape information of the cantilever, moving an observation position of the optical microscope downward based on a length of the probe, performing fluorescence observation through the optical microscope, and scanning the cantilever to acquire the surface layer information. The probe approach, cantilever observation, and observation position movement are performed in order. The fluorescence observation is performed after the observation position movement. The surface layer information acquisition is performed after the probe approach.
    Type: Application
    Filed: August 24, 2018
    Publication date: January 10, 2019
    Applicant: OLYMPUS CORPORATION
    Inventors: Yoshitsugu UEKUSA, Nobuaki SAKAI
  • Patent number: 10161959
    Abstract: An atomic force microscope acquires sample information by performing relative raster scanning between a cantilever and a sample across an XY-plane, while causing an interaction to be generated between a probe provided at a free end of the cantilever and the sample. The atomic force microscope includes a raster-scanning-information generator to generate raster scanning information, a raster-scanning controller to control the raster scanning based on the raster scanning information, and an interaction controller to control strength of the interaction based on the raster scanning information. The interaction controller relatively reduces the strength of the interaction, when a relative speed between the cantilever and the sample across the XY-plane of the raster scanning relatively decreases.
    Type: Grant
    Filed: December 20, 2017
    Date of Patent: December 25, 2018
    Assignee: OLYMPUS CORPORATION
    Inventor: Nobuaki Sakai
  • Patent number: 10107833
    Abstract: An atomic force microscope is to acquire sample information by a raster scanning of a cantilever with respect to a sample. The atomic force microscope includes a raster-scanning-information generator to generate raster scanning information including timing information. The timing information includes a first timing at which a relative speed between the cantilever and sample decreases lower than a threshold, and a second timing at which the relative speed increases higher than the threshold after the first timing. The atomic force microscope also includes a raster-scanning controller to control the raster scanning, and an interaction controller to decrease the strength of an interaction between the cantilever and sample at the first timing, and increase the strength of the interaction at the second timing.
    Type: Grant
    Filed: January 5, 2018
    Date of Patent: October 23, 2018
    Assignee: OLYMPUS CORPORATION
    Inventor: Nobuaki Sakai
  • Publication number: 20180143220
    Abstract: An atomic force microscope is to acquire sample information by a raster scanning of a cantilever with respect to a sample. The atomic force microscope includes a raster-scanning-information generator to generate raster scanning information including timing information. The timing information includes a first timing at which a relative speed between the cantilever and sample decreases lower than a threshold, and a second timing at which the relative speed increases higher than the threshold after the first timing. The atomic force microscope also includes a raster-scanning controller to control the raster scanning, and an interaction controller to decrease the strength of an interaction between the cantilever and sample at the first timing, and increase the strength of the interaction at the second timing.
    Type: Application
    Filed: January 5, 2018
    Publication date: May 24, 2018
    Applicant: OLYMPUS CORPORATION
    Inventor: Nobuaki SAKAI
  • Patent number: 9977049
    Abstract: A scanning probe microscope includes a cantilever having a probe at a free end thereof; a scanner to three-dimensionally relatively move the probe and a sample; a vibrator to vibrate the cantilever based on a vibrating signal; a displacement detector to detect a displacement of the cantilever and to output a displacement signal indicating the displacement; and a phase difference information detecting section to generate a phase signal including information of a phase difference between the vibrating signal and the displacement signal. The phase difference information detecting section includes a phase regulating portion to provide, to the phase difference, a phase offset to cancel an initial phase difference present in a state in which the probe is not in contact with the sample.
    Type: Grant
    Filed: April 6, 2016
    Date of Patent: May 22, 2018
    Assignee: OLYMPUS CORPORATION
    Inventor: Nobuaki Sakai
  • Patent number: 9968017
    Abstract: An electromagnetic shielding tube has a resin inner layer as the innermost layer, a resin outer layer as the outermost layer, and a metal metal-layer between the inner layer and the outer layer. The bonding strength between the outer layer and the metal layer is made weaker with respect to the bonding strength between the inner layer and the metal layer. For example, while an adhesive layer is provided between the inner layer and the metal layer, the outer layer can be directly extrusion coated onto the metal layer without providing an adhesive layer or the like between the outer layer and the metal layer.
    Type: Grant
    Filed: February 26, 2015
    Date of Patent: May 8, 2018
    Assignees: FURUKAWA AUTOMOTIVE SYSTEMS INC., FURUKAWA ELECTRIC CO., LTD.
    Inventors: Masanori Yamasaki, Tatsuya Yuasa, Yoshiyuki Hirayama, Nobuaki Sakai, Naoko Omori, Masakazu Kozawa, Takuro Yamada, Manabu Kojima
  • Publication number: 20180120343
    Abstract: An atomic force microscope acquires sample information by performing relative raster scanning between a cantilever and a sample across an XY-plane, while causing an interaction to be generated between a probe provided at a free end of the cantilever and the sample. The atomic force microscope includes a raster-scanning-information generator to generate raster scanning information, a raster-scanning controller to control the raster scanning based on the raster scanning information, and an interaction controller to control strength of the interaction based on the raster scanning information. The interaction controller relatively reduces the strength of the interaction, when a relative speed between the cantilever and the sample across the XY-plane of the raster scanning relatively decreases.
    Type: Application
    Filed: December 20, 2017
    Publication date: May 3, 2018
    Applicant: OLYMPUS CORPORATION
    Inventor: Nobuaki SAKAI
  • Publication number: 20180074092
    Abstract: An information acquiring method in an atomic force microscope includes, during causing the microscope to raster scan a cantilever and a sample relatively while causing a mechanical interaction between the sample and a probe provided at a free end of the cantilever, causing a first interaction having first strength between the probe and sample, acquiring first information on the sample when the first interaction is generated, causing a second interaction having second strength between the probe and sample, and acquiring second information on the sample when the second interaction is generated. The first strength and second strength are different. The causing the first interaction, the acquiring the first information, the causing the second interaction, and the acquiring the second information are performed in a same scanning region.
    Type: Application
    Filed: November 15, 2017
    Publication date: March 15, 2018
    Applicant: OLYMPUS CORPORATION
    Inventor: Nobuaki SAKAI
  • Patent number: 9625491
    Abstract: A scanning mechanism includes a movable portion to which a scanning target object is attached, and an X-Y actuator to scan the movable portion in an X direction and a Y direction perpendicular to the X direction. The X-Y actuator is symmetrical with respect to a straight line parallel to the Y direction and asymmetrical with respect to a straight line parallel to the X direction.
    Type: Grant
    Filed: February 5, 2015
    Date of Patent: April 18, 2017
    Assignee: OLYMPUS CORPORATION
    Inventors: Nobuaki Sakai, Yoshitsugu Uekusa
  • Patent number: 9519005
    Abstract: A scanning mechanism includes a cantilever, an XY movable portion movable in X and Y directions parallel to an X-Y plane, an XY actuator to scan the XY movable portion in the X and Y directions, a Z actuator to scan the cantilever in a Z direction perpendicular to the X-Y plane, and a light condensing portion to cause light for detecting a displacement of the cantilever to enter the cantilever. The Z actuator and the light condensing portion are held by the XY movable portion and arranged side by side in projection to the X-Y plane.
    Type: Grant
    Filed: September 23, 2015
    Date of Patent: December 13, 2016
    Assignee: OLYMPUS CORPORATION
    Inventor: Nobuaki Sakai
  • Patent number: 9482690
    Abstract: A scanning probe microscope to measure a sample set on a sample mount in liquid includes a scanning mechanism to scan a cantilever provided with a probe at a free end along an X-axis, a Y-axis, and a Z-axis perpendicular to each other, and a liquid contact member including an optical transmission portion to transmit detection light for detecting a displacement of the cantilever, and arranged at least partially in contact with the liquid. The liquid contact member is not scanned by the scanning mechanism.
    Type: Grant
    Filed: January 22, 2015
    Date of Patent: November 1, 2016
    Assignee: OLYMPUS CORPORATION
    Inventors: Nobuaki Sakai, Yoshitsugu Uekusa
  • Patent number: 9453856
    Abstract: A scanning probe microscope includes a vibration unit to vibrate the cantilever on the basis of a vibration signal, a displacement detection unit to output a displacement signal indicating the displacement of the cantilever, a phase adjustment unit to provide a phase offset to a phase difference between the vibration signal and displacement signal, a phase signal generating unit to generate a phase signal including information regarding the phase difference and phase offset, and a control unit to control the distance between the probe and sample on the basis of the phase signal. The phase adjustment unit combines a first phase amount that cancels an initial phase difference exiting in a condition where the probe and sample are out of contact, with a second phase amount equal to or more than (0 [rad]) and less than or equal to (?/2 [rad]) and provides a combined amount to the phase difference.
    Type: Grant
    Filed: October 2, 2015
    Date of Patent: September 27, 2016
    Assignee: OLYMPUS CORPORATION
    Inventor: Nobuaki Sakai
  • Publication number: 20160216293
    Abstract: A scanning probe microscope includes a cantilever having a probe at a free end thereof; a scanner to three-dimensionally relatively move the probe and a sample; a vibrator to vibrate the cantilever based on a vibrating signal; a displacement detector to detect a displacement of the cantilever and to output a displacement signal indicating the displacement; and a phase difference information detecting section to generate a phase signal including information of a phase difference between the vibrating signal and the displacement signal. The phase difference information detecting section includes a phase regulating portion to provide, to the phase difference, a phase offset to cancel an initial phase difference present in a state in which the probe is not in contact with the sample.
    Type: Application
    Filed: April 6, 2016
    Publication date: July 28, 2016
    Applicant: OLYMPUS CORPORATION
    Inventor: Nobuaki SAKAI
  • Patent number: 9347969
    Abstract: A compound microscope of an optical microscope and a scanning probe microscope includes a stage to support a sample substrate holding a sample, and a cantilever chip having a substrate, a cantilever supported by the substrate, and a probe provided at the free end of the cantilever. The compound microscope further includes a scanner to hold the cantilever chip so that the probe faces the sample substrate and so that the substrate is inclined with respect to the sample substrate and to three-dimensionally scan the cantilever chip with respect to the sample substrate, a displacement sensor to optically detect the displacement of the cantilever, and an illumination light source to apply illumination light for observation by the optical microscope to the sample through the space between the substrate and the sample substrate.
    Type: Grant
    Filed: October 20, 2014
    Date of Patent: May 24, 2016
    Assignee: OLYMPUS CORPORATION
    Inventors: Nobuaki Sakai, Yoshitsugu Uekusa