Patents by Inventor Nozomi Hasegawa

Nozomi Hasegawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sample test automation system
    Patent number: 10816564
    Abstract: A sample test automation system which is capable of reducing the workload of an operator and precisely carrying out necessary processes of each of samples without stagnation. In the sample test automation system, a sample tray 120 on which a plurality of samples 150 can be installed is prepared, an identifier for distinguishing the sample tray 120 is attached to the sample tray 120, a sample introducing unit 10 is provided with an identifier reading apparatus 111 which reads the identifier of the sample tray 120, and information about the samples 150 is switched based on the read identifier of the sample tray 120.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: October 27, 2020
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Takahiro Sasaki, Kenichi Takahashi, Hiroshi Ohga, Tatsuya Fukugaki, Shigeru Yano, Kenichi Yasuzawa, Nozomi Hasegawa, Masaaki Hanawa
  • SAMPLE TEST AUTOMATION SYSTEM
    Publication number: 20170328926
    Abstract: A sample test automation system which is capable of reducing the workload of an operator and precisely carrying out necessary processes of each of samples without stagnation. In the sample test automation system, a sample tray 120 on which a plurality of samples 150 can be installed is prepared, an identifier for distinguishing the sample tray 120 is attached to the sample tray 120, a sample introducing unit 10 is provided with an identifier reading apparatus 111 which reads the identifier of the sample tray 120, and information about the samples 150 is switched based on the read identifier of the sample tray 120.
    Type: Application
    Filed: July 31, 2017
    Publication date: November 16, 2017
    Inventors: Takahiro SASAKI, Kenichi TAKAHASHI, Hiroshi OHGA, Tatsuya FUKUGAKI, Shigeru YANO, Kenichi YASUZAWA, Nozomi HASEGAWA, Masaaki HANAWA
  • Sample test automation system
    Patent number: 9753048
    Abstract: A sample test automation system which is capable of reducing the workload of an operator and precisely carrying out necessary processes of each of samples without stagnation. In the sample test automation system, a sample tray 120 on which a plurality of samples 150 can be installed is prepared, an identifier for distinguishing the sample tray 120 is attached to the sample tray 120, a sample introducing unit 10 is provided with an identifier reading apparatus 111 which reads the identifier of the sample tray 120, and information about the samples 150 is switched based on the read identifier of the sample tray 120.
    Type: Grant
    Filed: May 23, 2011
    Date of Patent: September 5, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Takahiro Sasaki, Kenichi Takahashi, Hiroshi Ohga, Tatsuya Fukugaki, Shigeru Yano, Kenichi Yasuzawa, Nozomi Hasegawa, Masaaki Hanawa
  • Specimen processing system
    Patent number: 9722431
    Abstract: In the specimen processing system in which each of a specimen input portion which inputs a specimen, a specimen processing portion which processes the specimen, a specimen recovery portion which recovers the processed specimen, and a specimen transporting line which transports the specimen between the specimen input portion, the specimen processing portion, and the specimen recovery portion, are connected to each other by a plurality of processing (analysis) units, the processing (analysis) unit is provided with a CPU that controls the operation, and provided with a mechanism control portion which receives an electric signal from the CPU and operates the mechanism parts in the processing unit, and the mechanism part control portion includes means which can supply and stop the power of one or more arbitrarily specified mechanism parts by the electric signal from the CPU.
    Type: Grant
    Filed: December 13, 2013
    Date of Patent: August 1, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Nozomi Hasegawa, Kuniaki Onizawa
  • SPECIMEN PROCESSING SYSTEM
    Publication number: 20150357824
    Abstract: In the specimen processing system in which each of a specimen input portion which inputs a specimen, a specimen processing portion which processes the specimen, a specimen recovery portion which recovers the processed specimen, and a specimen transporting line which transports the specimen between the specimen input portion, the specimen processing portion, and the specimen recovery portion, are connected to each other by a plurality of processing (analysis) units, the processing (analysis) unit is provided with a CPU that controls the operation, and provided with a mechanism control portion which receives an electric signal from the CPU and operates the mechanism parts in the processing unit, and the mechanism part control portion includes means which can supply and stop the power of one or more arbitrarily specified mechanism parts by the electric signal from the CPU.
    Type: Application
    Filed: December 13, 2013
    Publication date: December 10, 2015
    Inventors: Nozomi HASEGAWA, Kuniaki ONIZAWA
  • SAMPLE TEST AUTOMATION SYSTEM
    Publication number: 20130061693
    Abstract: A sample test automation system which is capable of reducing the workload of an operator and precisely carrying out necessary processes of each of samples without stagnation. In the sample test automation system, a sample tray 120 on which a plurality of samples 150 can be installed is prepared, an identifier for distinguishing the sample tray 120 is attached to the sample tray 120, a sample introducing unit 10 is provided with an identifier reading apparatus 111 which reads the identifier of the sample tray 120, and information about the samples 150 is switched based on the read identifier of the sample tray 120.
    Type: Application
    Filed: May 23, 2011
    Publication date: March 14, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Takahiro Sasaki, Kenichi Takahashi, Hiroshi Ohga, Tatsuya Fukugaki, Shigeru Yano, Kenichi Yasuzawa, Nozomi Hasegawa, Masaaki Hanawa