Patents by Inventor Oichi Kubota
Oichi Kubota has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9316582Abstract: An information acquiring apparatus that acquires information of a sample includes an irradiation unit configured to irradiate an irradiation position of the sample with a terahertz wave through a transmission member being in contact with the sample; a detection unit configured to detect a terahertz wave reflected by the transmission member and a terahertz wave reflected by the sample; a waveform acquiring unit configured to acquire a time waveform of the terahertz wave reflected by the transmission member and a time waveform of the terahertz wave reflected by the sample, by using detection results of the detection unit; and an information acquiring unit configured to acquire the information of the sample by using the time waveform of the terahertz wave reflected by the transmission member, the time waveform of the terahertz wave reflected by the sample, and information relating to a thickness of the transmission member at the irradiation position.Type: GrantFiled: March 25, 2014Date of Patent: April 19, 2016Assignee: CANON KABUSHIKI KAISHAInventors: Oichi Kubota, Sayuri Yamaguchi
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Publication number: 20160061728Abstract: A plate-like member includes a sample contact portion that includes first and second surfaces opposite to each other, and a separation portion that includes the first surface and a third surface that is opposite to the first surface. The first surface may receive a terahertz wave, and the second surface may come into contact with a sample during a measurement. The separation portion is configured such that: (i) an acquired time waveform may include only a time waveform of a terahertz wave reflected by the first surface or (ii) a time difference between a first time at which a terahertz wave reflected by the first surface is detected and a second time at which a terahertz wave reflected by the third surface is detected is greater than a time difference between the first time and a time at which a terahertz wave reflected by the second surface is detected.Type: ApplicationFiled: August 14, 2015Publication date: March 3, 2016Inventors: Sayuri Yamaguchi, Oichi Kubota
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Publication number: 20150241340Abstract: A measurement apparatus configured to discriminate a substance constituting a specimen through use of a terahertz wave, which includes: a radiation unit configured to radiate a terahertz wave to the specimen; a detection unit configured to detect the terahertz wave transmitted through or reflected by the specimen; a spectrum acquisition unit configured to acquire a measurement spectrum through use of a detection result of the detection unit; a structure acquisition unit configured to acquire information relating to a size of a structure of the specimen; and a discrimination unit configured to discriminate a substance constituting the specimen through use of the measurement spectrum and a plurality of spectra, the discrimination unit being configured to set, based on the information, a frequency range of the measurement spectrum to be used for the discrimination of the substance of the specimen.Type: ApplicationFiled: February 12, 2015Publication date: August 27, 2015Inventors: Oichi Kubota, Sayuri Yamaguchi
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Patent number: 9068819Abstract: A measuring apparatus to identify a material and thickness of each of a plurality of layers included in a layered body, based on a measurement result obtained by measuring a time domain waveform of an electromagnetic wave pulse from the layered body, includes a database configured to store data of a plurality of material candidates and a plurality of thickness candidates, an input unit configured to input a search range of the data stored in the database, and a processing unit configured to reproduce a time domain waveform of an electromagnetic wave pulse from the layered body by employing data of a plurality of material candidates and a plurality of thickness candidates within the search range, and to compare this reproduced time domain waveform and the time domain waveform of the measurement result, thereby identifying the material and thickness of each of the plurality of layers.Type: GrantFiled: November 22, 2013Date of Patent: June 30, 2015Assignee: Canon Kabushiki KaishaInventor: Oichi Kubota
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Publication number: 20150129768Abstract: Provided is a measuring apparatus, including: an irradiation unit configured to irradiate an object to be examined with an electromagnetic wave, the object to be examined being brought into contact with a window member; a sensing unit configured to sense the electromagnetic wave from the object to be examined that is brought into contact with the window member; and a dielectric constant adjusting unit configured to change a dielectric constant of the window member.Type: ApplicationFiled: April 23, 2013Publication date: May 14, 2015Inventors: Takayuki Koizumi, Oichi Kubota
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Patent number: 8982342Abstract: A method of calculating, using a computer, a refractive index of at least a portion of a specimen by using electromagnetic wave measurement. The method includes measuring a first scattered waveform from a structure of the specimen, measuring a second scattered waveform from a structure, in which a material for calculating a refractive index is disposed on a surface of the specimen, and comparing intensities of peak positions at corresponding portions of the first scattered waveform and the second scattered waveform.Type: GrantFiled: March 1, 2013Date of Patent: March 17, 2015Assignee: Canon Kabushiki KaishaInventors: Ryota Sekiguchi, Oichi Kubota
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Patent number: 8981300Abstract: An electromagnetic wave pulse measuring device, includes an elastic vibration wave generating section which irradiates a predetermined area of a sample with an elastic vibration wave, an electromagnetic wave pulse generating section which irradiates the predetermined area, which is irradiated with the elastic vibration wave, with an electromagnetic wave pulse, and an electromagnetic wave pulse detecting section which measures a waveform of the electromagnetic wave pulse modulated in the predetermined area by the elastic vibration wave. The timing at which the electromagnetic wave pulse detecting section measures the waveform of the electromagnetic wave pulse is a timing at which a phase angle of the elastic vibration wave has a predetermined value when the elastic vibration wave generating section generates the elastic vibration wave.Type: GrantFiled: March 13, 2013Date of Patent: March 17, 2015Assignee: Canon Kabushiki KaishaInventor: Oichi Kubota
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Publication number: 20150008326Abstract: An electromagnetic wave pulse measuring device, includes an elastic vibration wave generating section which irradiates a predetermined area of a sample with an elastic vibration wave, an electromagnetic wave pulse generating section which irradiates the predetermined area, which is irradiated with the elastic vibration wave, with an electromagnetic wave pulse, and an electromagnetic wave pulse detecting section which measures a waveform of the electromagnetic wave pulse modulated in the predetermined area by the elastic vibration wave. The timing at which the electromagnetic wave pulse detecting section measures the waveform of the electromagnetic wave pulse is a timing at which a phase angle of the elastic vibration wave has a predetermined value when the elastic vibration wave generating section generates the elastic vibration wave.Type: ApplicationFiled: March 13, 2013Publication date: January 8, 2015Inventor: Oichi Kubota
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Publication number: 20140291524Abstract: An information acquiring apparatus that acquires information of a sample includes an irradiation unit configured to irradiate an irradiation position of the sample with a terahertz wave through a transmission member being in contact with the sample; a detection unit configured to detect a terahertz wave reflected by the transmission member and a terahertz wave reflected by the sample; a waveform acquiring unit configured to acquire a time waveform of the terahertz wave reflected by the transmission member and a time waveform of the terahertz wave reflected by the sample, by using detection results of the detection unit; and an information acquiring unit configured to acquire the information of the sample by using the time waveform of the terahertz wave reflected by the transmission member, the time waveform of the terahertz wave reflected by the sample, and information relating to a thickness of the transmission member at the irradiation position.Type: ApplicationFiled: March 25, 2014Publication date: October 2, 2014Applicant: CANON KABUSHIKI KAISHAInventors: Oichi Kubota, Sayuri Yamaguchi
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Publication number: 20140146306Abstract: A measuring apparatus to identify a material and thickness of each of a plurality of layers included in a layered body, based on a measurement result obtained by measuring a time domain waveform of an electromagnetic wave pulse from the layered body, includes a database configured to store data of a plurality of material candidates and a plurality of thickness candidates, an input unit configured to input a search range of the data stored in the database, and a processing unit configured to reproduce a time domain waveform of an electromagnetic wave pulse from the layered body by employing data of a plurality of material candidates and a plurality of thickness candidates within the search range, and to compare this reproduced time domain waveform and the time domain waveform of the measurement result, thereby identifying the material and thickness of each of the plurality of layers.Type: ApplicationFiled: November 22, 2013Publication date: May 29, 2014Applicant: CANON KABUSHIKI KAISHAInventor: Oichi Kubota
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Publication number: 20130235367Abstract: Provided is a method of calculating a refractive index of at least a part of a specimen by using electromagnetic wave measurement, the method including: measuring a first scattered wave from a structure of the specimen; measuring a second scattered wave from a structure in which a material for calculating refractive index is disposed on a surface of the specimen; and comparing intensities at corresponding portions of the first scattered wave and the second scattered wave.Type: ApplicationFiled: March 1, 2013Publication date: September 12, 2013Applicant: CANON KABUSHIKI KAISHAInventors: Ryota Sekiguchi, Oichi Kubota
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Patent number: 7683528Abstract: The present invention prevents the oxidization of a member of carbon fibers and improves the electric connection between the carbon fibers and the member of carbon fibers. In the present invention, a member 5 of carbon fibers 4 includes: a first element selected from the group consisting of IVa group elements and Va group elements; a second element selected from the group consisting of C, Al, Si, Cr, and Zr; and N. Preferably, the first element is Ti. More preferably, the member 5 includes Al or Si and the ratio of Al or Si to Ti is not less than 10 atm % and not more than 30 atm %.Type: GrantFiled: October 6, 2005Date of Patent: March 23, 2010Assignee: Canon Kabushiki KaishaInventors: Takeo Tsukamoto, Shin Kitamura, Oichi Kubota
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Publication number: 20070188067Abstract: The present invention prevents the oxidization of a member of carbon fibers and improves the electric connection between the carbon fibers and the member of carbon fibers. In the present invention, a member 5 of carbon fibers 4 includes: a first element selected from the group consisting of IVa group elements and Va group elements; a second element selected from the group consisting of C, Al, Si, Cr, and Zr; and N. Preferably, the first element is Ti. More preferably, the member 5 includes Al or Si and the ratio of Al or Si to Ti is not less than 10 atm % and not more than 30 atm %.Type: ApplicationFiled: October 6, 2005Publication date: August 16, 2007Applicant: CANON KABUSHIKI KAISHAInventors: Takeo Tsukamoto, Shin Kitamura, Oichi Kubota
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Patent number: 5949562Abstract: A wavelength control method controls a wavelength of output light from an optical transmitter used in an optical communication system for performing wavelength-multiplexing. The method includes steps of causing light-output means of the optical transmitter to output light and guiding the output light of the light-output means and light used in the optical communication system to a wavelength tunable filter. The method also includes sweeping a selective wavelength of the wavelength tunable filter, and detecting, based on the sweeping, if a wavelength spacing between a wavelength of the output light, which is output from the light-output means, and a wavelength of the light used in the optical communication system, which is adjacent to the wavelength of the output light on a wavelength axis on either a longer wavelength side or a shorter wavelength side, is wider or narrower than a predetermined wavelength spacing.Type: GrantFiled: May 14, 1997Date of Patent: September 7, 1999Assignee: Canon Kabushiki KaishaInventors: Oichi Kubota, Masao Majima