Patents by Inventor Oliver Hamann

Oliver Hamann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8468642
    Abstract: A scraper for an optical surface of a device is disclosed. The scraper includes a blade having an edge that is rigid and non-deforming to withstand high shear stresses. The blade is configured to rotate about a first axis parallel to the optical surface and also configured to move in a line with respect to a second axis perpendicular to the optical surface. This allows the rigid, non-deforming blade to maintain contact with the optical surface. Furthermore, the edge is configured to move across the optical surface to remove any materials adhered to the surface. The scraper can be used to clean the optical surface of an instrument, for example.
    Type: Grant
    Filed: March 13, 2009
    Date of Patent: June 25, 2013
    Assignee: Mettler-Toledo Autochem, Inc.
    Inventors: Richard Becker, Craig J. Cornelius, Oliver Hamann, Evandro Mendonca, Robert E. LaVigueur
  • Publication number: 20090229067
    Abstract: A scraper for an optical surface of a device is disclosed. The scraper includes a blade having an edge that is rigid and non-deforming to withstand high shear stresses. The blade is configured to rotate about a first axis parallel to the optical surface and also configured to move in a line with respect to a second axis perpendicular to the optical surface. This allows the rigid, non-deforming blade to maintain contact with the optical surface. Furthermore, the edge is configured to move across the optical surface to remove any materials adhered to the surface. The scraper can be used to clean the optical surface of an instrument, for example.
    Type: Application
    Filed: March 13, 2009
    Publication date: September 17, 2009
    Applicant: METTLER-TOLEDO AUTOCHEM, INC.
    Inventors: Richard Becker, Craig J. Cornelius, Oliver Hamann, Evandro Mendonca, Robert E. LaVigueur
  • Patent number: 6940064
    Abstract: An apparatus for validating the operation of an optical scanning system is provided. The apparatus includes one or more scanning illumination beams (6) for scanning an object, and one or more observing beams that comprise light scattered by the object being scanned, which inversely follow the path of the illumination beams. The apparatus further includes a reflector structure (9) arranged to reflect both the illuminating beams and observing beams scattered by a reference target (10) for a portion of each scan (e.g., a scan may be a 360-degree scan in the case of a circular scanning system). The apparatus still further includes the reference target (10) arranged to be scanned by the illumination beams reflected by the reflector structure during said portion of each scan. Light scattered by the reference target is received as the observing beams, and their optical properties are continuously monitored to validate the proper operation of the optical scanning system.
    Type: Grant
    Filed: February 24, 2003
    Date of Patent: September 6, 2005
    Assignee: Laser Sensor Technology, Inc.
    Inventor: Oliver Hamann
  • Publication number: 20030160162
    Abstract: An apparatus for validating the operation of an optical scanning system is provided. The apparatus includes one or more scanning illumination beams (6) for scanning an object, and one or more observing beams that comprise light scattered by the object being scanned, which inversely follow the path of the illumination beams. The apparatus further includes a reflector structure (9) arranged to reflect both the illuminating beams and the observing beams for a portion of each scan (e.g., a scan may be a 360-degree scan in the case of a circular scanning system). The apparatus still further includes a reference target (10) arranged to be scanned by the illumination beams reflected by the reflector structure during said portion of each scan. Light scattered by the reference target is received as the observing beams, and their optical properties are continuously monitored to validate the proper operation of the optical scanning system.
    Type: Application
    Filed: February 24, 2003
    Publication date: August 28, 2003
    Applicant: LASER SENSOR TECHNOLOGY, INC.
    Inventor: Oliver Hamann
  • Patent number: 6449042
    Abstract: The present invention relates to a backscattering apparatus and method for optical scanning along a circular path using one or more optical illuminators and receivers. More particularly, it relates to an apparatus and method of focusing one or more beams of light into one or more beam spots, scanning the common beam spot(s) across a circular path and receiving light backscattered from the beam spot(s) with one or more detectors. A rotationally mounted scanning optics having an optical axis parallel to but not coaxial with the axis of rotation is used to accomplish these functions. A motor may be operatively linked to the scanning optics to cause the same to rotate at a constant angular velocity whereby, with appropriate signal generating detector and signal processing electronics, the number and size of particles suspended in a fluid medium exposed to the beam spot(s) can be determined.
    Type: Grant
    Filed: May 4, 2000
    Date of Patent: September 10, 2002
    Assignee: Laser Sensor Technology, Inc.
    Inventor: Oliver Hamann
  • Patent number: 5748311
    Abstract: The invention provides a method and a system for measuring geometric properties, such as diameter, shape and surface roughness of single rough particles by an optical method. The particle may be immersed in a gaseous or liquid fluid. A volume of the fluid, containing the particles to be measured, is illuminated by a beam of coherent electromagnetic radiation, resulting in a distribution of scattered radiation with a speckle structure. This distribution is detected with a one-dimensional or two-dimensional image detector. An autocorrelation function RI(r) of the detected intensity distribution is calculated, and from the position .delta.r of its first zero the diameter d.sub.P of the scattering particle is evaluated based on I, the wavelength of the electromagnetic radiation, and Z.sub.0, the distance from the particle to the detector.
    Type: Grant
    Filed: March 11, 1996
    Date of Patent: May 5, 1998
    Inventors: Oliver Hamann, Reinhard Ulrich
  • Patent number: 5732166
    Abstract: The invention provides an apparatus, and method of making the apparatus, for optical sensing of parameters in high temperature environments, such as chemical reaction zones, combustion zones, high temperature drying processes, and the like. Moreover, the optical apparatus of the invention are able to operate in high temperature environments without need for associated cooling equipment. The optical elements of the sensors are fabricated from a material that is refractory, is transparent to electromagnetic radiation, has low thermal conductivity, and that reduces in viscosity when heated to a temperature well above the operating temperature to which it will be subjected in the monitoring environment. Preferably, the optical elements, and even mechanical elements, are made of a vitreous silica material.
    Type: Grant
    Filed: March 11, 1996
    Date of Patent: March 24, 1998
    Inventors: Oliver Hamann, Reinhard Ulrich