Abstract: A system for performing an automated test is disclosed. The method comprises programming a application programming interface (API) to control a default production flow on a tester, wherein the production flow comprises a plurality of test sequences associated with executing tests on devices under test (DUTs) connected to the tester. The method further comprises configuring the API to modify the default production flow to customize the plurality of test sequences in accordance with a user-specific API, wherein the user-specific API comprises a modification to the production flow in accordance with testing requirements of a user. Finally, the method comprises integrating the user-specific API with the API to customize the API for the user.

Abstract: A system for performing an automated test is disclosed. The system comprises a first user computer operable to load a first test plan from a first user to a control server and a second user computer operable to load a second test plan from a second user to the control server. The system further comprises a tester comprising at least one rack for deploying a plurality of primitives. The control server is communicatively coupled to the first user computer, the second user computer and to the tester, wherein the control server is operable to allocate a first subset of primitives to the first test plan and manage execution of the first test plan on the first subset of primitives, and also operable to concurrently allocate a second subset of primitives to the second test plan and manage execution of the second test plan on the second subset of primitives.

Abstract: A system for performing an automated test is disclosed. The system comprises a first user computer operable to load a first test plan from a first user to a control server and a second user computer operable to load a second test plan from a second user to the control server. The system further comprises a tester comprising at least one rack for deploying a plurality of primitives. The control server is communicatively coupled to the first user computer, the second user computer and to the tester, wherein the control server is operable to allocate a first subset of primitives to the first test plan and manage execution of the first test plan on the first subset of primitives, and also operable to concurrently allocate a second subset of primitives to the second test plan and manage execution of the second test plan on the second subset of primitives.

Abstract: A system for performing an automated test is disclosed. The method comprises programming a application programming interface (API) to control a default production flow on a tester, wherein the production flow comprises a plurality of test sequences associated with executing tests on devices under test (DUTs) connected to the tester. The method further comprises configuring the API to modify the default production flow to customize the plurality of test sequences in accordance with a user-specific API, wherein the user-specific API comprises a modification to the production flow in accordance with testing requirements of a user. Finally, the method comprises integrating the user-specific API with the API to customize the API for the user.

Abstract: In an embodiment, a method includes causing a test floor system to insert a DUT (device under test) into a DUT receptacle. This is performed in a manner that couples the DUT to an electrical interface of the DUT receptacle and that encloses the DUT inside the DUT receptacle to facilitate testing of the DUT. Also, the method includes causing the test floor system to transport the DUT receptacle that encloses the DUT to a tester of the test floor system and to insert the DUT receptacle into a DUT testing module of the tester. Further, the method includes causing the test floor system to determine identification information of the DUT. Furthermore, the method includes, based on the identification information, sending a test routine to the DUT testing module to perform on the DUT.

Abstract: In an embodiment, a method includes causing a test floor system to insert a DUT (device under test) into a DUT receptacle. This is performed in a manner that couples the DUT to an electrical interface of the DUT receptacle and that encloses the DUT inside the DUT receptacle to facilitate testing of the DUT. Also, the method includes causing the test floor system to transport the DUT receptacle that encloses the DUT to a tester of the test floor system and to insert the DUT receptacle into a DUT testing module of the tester. Further, the method includes causing the test floor system to determine identification information of the DUT. Furthermore, the method includes, based on the identification information, sending a test routine to the DUT testing module to perform on the DUT.